SFFS578A February   2023  – January 2024 INA241A-Q1 , INA241B-Q1 , INA296A-Q1 , INA296B-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 DDF-8, DGK-8, DGS-10 and D-8 Packages
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 DDF-8, DGK-8 and D-8 Packages
    2. 4.2 DGS-10 Package
  7. 5Revision History

1 Overview

This document contains information for the INA241x-Q1 and INA296x-Q1 (DDF-8, DGK-8, DGS-10 and D-8 packages) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for reference.

GUID-20230117-SS0I-MPVM-NMTW-J198TKDPLBTJ-low.svg Figure 1-1 Functional Block Diagram

The INA241x-Q1 and INA296x-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.