SFFS522 February 2026 LMP8601-Q1
The failure mode distribution estimation for LMP860x-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| OUT open (Hi-Z) | 5 |
| OUT stuck (High or Low) | 5 |
| OUT functional, not in specification | 30 |
| Preamplifier output A1 open (Hi-Z) | 5 |
| Preamplifier output A1 stuck (High or Low) | 15 |
| Preamplifier output A1 functional, not in specification | 40 |