SFFS434A december 2022 – july 2023 TMP1826
4.1 VSSOP-8 Package
Figure 4-1 shows the TMP1826 pin diagram for the VSSOP-8 package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TMP1826 data sheet.
Figure 4-1 Pin Diagram (VSSOP-8) Package| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
ADDR | 3 | Limited address selection. Application has to revert to 64 bit addressing mode. | C |
| If ADDR selection is not being used then no effect. | D | ||
GND | 4 | No effect. Normal operation. | D |
IO0 | 6 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO1 | 7 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. If I/O is not being used then no effect. | D | ||
IO2 | 8 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO3 | 5 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
SDQ | 2 | No communication | B |
VDD | 1 | Device is in bus powered mode | C |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
ADDR | 3 | Limited address selection. Application has to revert to 64 bit addressing mode. | C |
GND | 4 | When floating, possible latch-up | B |
IO0 | 6 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO1 | 7 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO2 | 8 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO3 | 5 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
SDQ | 2 | No communication | B |
VDD | 1 | Device is in bus powered mode | C |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
ADDR | 3 | SDQ | The Abs. Max for ADDR pin is 1.65 V and if shorted to SDQ and SDQ being pulled to 5.5V could cause leakage currents to increase and damage the device during ADDR detection. | A |
| If ADDR is shorted to GND then limited address selection. Application has to revert to 64 bit addressing mode. | C | |||
GND | 4 | ADDR | GND is shorted to ADDR will have no affect during normal operation. | D |
IO0 | 6 | IO1 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | |||
IO0 | 6 | IO3 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | |||
IO1 | 7 | IO2 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | |||
IO1 | 7 | IO0 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | |||
IO2 | 8 | IO1 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | |||
IO3 | 5 | IO0 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | |||
SDQ | 2 | VDD | Loss of functionality. Communication will be lost. | B |
VDD | 1 | SDQ | Loss of functionality. Communication will be lost. | B |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
ADDR | 3 | Abs max could be exceeded if ADDR pin is being used for address decoding. | A |
| Other cases no device damage. | D | ||
GND | 4 | Device unpowered. Device not functional. Make sure that the absolute maximum ratings for all device pins are met, otherwise device damage may be plausible. | B |
IO0 | 6 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO1 | 7 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO2 | 8 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
IO3 | 5 | If I/O is used for controlling external component, functionality is lost. | B |
| If I/O is not being used then no effect. | D | ||
SDQ | 3 | Loss of functionality. Communication will be lost. | B |
VDD | 1 | No effect. Normal operation. | D |