SFFS432 August 2022 ISO6760L
Figure 4-1 shows the ISO6760L and ISO6760LN pin diagram for the 16-DW package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the ISO6760L and ISO6760LN data sheet.
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible. | A |
| INA_H | 2 | Input signal shorted to ground, so output (OUTA_H) stuck to low. Communication from INA_H to OUTA_H corrupted. | B |
| INA_L | 3 | Input signal shorted to ground, so output (OUTA_L) stuck to low. Communication from INA_L to OUTA_L corrupted. | B |
| INB_H | 4 | Input signal shorted to ground, so output (OUTB_H) stuck to low. Communication from INB_H to OUTB_H corrupted. | B |
| INB_L | 5 | Input signal shorted to ground, so output (OUTB_L) stuck to low. Communication from INB_L to OUTB_L corrupted. | B |
| INC_H | 6 | Input signal shorted to ground, so output (OUTC_H) stuck to low. Communication from INC_H to OUTC_H corrupted. | B |
| INC_L | 7 | Input signal shorted to ground, so output (OUTC_L) stuck to low. Communication from INC_L to OUTC_L corrupted. | B |
| GND1 | 8 | Device continues to function as expected. Normal operation. | D |
| GND2 | 9 | Device continues to function as expected. Normal operation. | D |
| OUTC_L | 10 | OUTC_L stuck low. Data communication from INC_L to OUTC_L lost. Device damage possible if INC_L is driven high for extended period of time. | A |
| OUTC_H | 11 | OUTC_H stuck low. Data communication from INC_H to OUTC_H lost. Device damage possible if INC_H is driven high for extended period of time. | A |
| OUTB_L | 12 | OUTB_L stuck low. Data communication from INB_L to OUTB_L lost. Device damage possible if INB_L is driven high for extended period of time. | A |
| OUTB_H | 13 | OUTB_H stuck low. Data communication from INB_H to OUTB_H lost. Device damage possible if INB_H is driven high for extended period of time. | A |
| OUTA_L | 14 | OUTA_L stuck low. Data communication from INA_L to OUTA_L lost. Device damage possible if INA_L is driven high for extended period of time. | A |
| OUTA_H | 15 | OUTA_H stuck low. Data communication from INA_H to OUTA_H lost. Device damage possible if INA_H is driven high for extended period of time. | A |
| VCC2 | 16 | No power to the device on side-2. OUTA/OUTB/OUTC pins state undetermined. | B |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | Operation undetermined. Either device is unpowered and OUTA/OUTB/OUTC=default logic state. Device can power up if any IN is driven to logic high. If IN has current sourcing capability to provide regular operating current of device, ESD diode conducts that current and device damage plausible. | A |
| INA_H | 2 | No communication to INA channel possible. OUTA stuck to default state (Low) | B |
| INA_L | 3 | No communication to INA channel possible. OUTA stuck to default state (Low) | B |
| INB_H | 4 | No communication to INB channel possible. OUTB stuck to default state (Low). | B |
| INB_L | 5 | No communication to INB channel possible. OUTC stuck to default state (Low). | B |
| INC_H | 6 | No communication to INC channel possible. OUTC stuck to default state (Low). | B |
| INC_L | 7 | No communication to INC channel possible. OUTC stuck to default state (Low). | B |
| GND1 | 8 | No current return ground path on side1. Device unpowered on side1. | B |
| GND2 | 9 | No current return ground path on side2. Device unpowered on side2. | B |
| OUTC_L | 10 | State of OUTC_L undetermined. Data communication from INC_L to OUTC_L lost. | B |
| OUTC_H | 11 | State of OUTC_H undetermined. Data communication from INC_H to OUTC_H lost. | B |
| OUTB_L | 12 | State of OUTB_L undetermined. Data communication from INB_L to OUTB_L lost. | B |
| OUTB_H | 13 | State of OUTB_H undetermined. Data communication from INB_H to OUTB_H lost. | B |
| OUTA_L | 14 | State of OUTA_L undetermined. Data communication from INA_L to OUTA_L lost. | B |
| OUTA_H | 15 | State of OUTA_H undetermined. Data communication from INA_H to OUTA_H lost. | B |
| VCC2 | 16 | Device unpowered on side-2 and state of OUTA/OUTB/OUTC undetermined. | B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| VCC1 | 1 | INA_H | No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible. | A |
| INA_H | 2 | INA_L | Channel Pairing INA inputs shorted together, so outputs (OUTA) stay to low. Communication from INA to OUTA corrupted. | B |
| INA_L | 3 | INB_H | Communication corrupted for either INA_L or INB_H channel. | B |
| INB_H | 4 | INB_L | Channel Pairing INB inputs shorted together, so outputs (OUTB) stay low. Communication from INB to OUTB corrupted. | B |
| INB_L | 5 | INC_H | Communication corrupted for either INB_L or INC_H channel. | B |
| INC_H | 6 | INC_L | Channel Pairing INC inputs shorted together, so outputs (OUTC) stay low. Communication from INC to OUTC corrupted. | A |
| INC_L | 7 | GND1 | INC_L shorted to ground, so OUTC_L stuck to low. | B |
| GND1 | 8 | INC_L | Already considered in above row. | B |
| GND2 | 9 | OUTC_L | OUTC_L stuck low. Data communication from INC_L to OUTC_L lost. Device damage possible if INC_L is set to cause OUTC_L to high for extended period of time. | A |
| OUTC_L | 10 | OUTC_H | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTC_H | 11 | OUTB_L | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTB_L | 12 | OUTB_H | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTB_H | 13 | OUTA_L | CCommunication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTA_L | 14 | OUTA_H | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTA_H | 15 | VCC2 | OUTA_H stuck to high. Device damage possible if INA_H is set to cause OUTA_H to low for extended period of time. | A |
| VCC2 | 16 | OUTA_H | Already considered in above row. | A |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | No effect. Normal operation. | D |
| INA_H | 2 | INA_H pin stuck high. Communication corrupted. OUTA_H state high and OUTA_L state low. | B |
| INA_L | 3 | INA_L pin stuck high. Communication corrupted. OUTA_L state high and OUTA_H state low. | B |
| INB_H | 4 | INB_H pin stuck high. Communication corrupted. OUTB_H state high and OUTB_L state low. | B |
| INB_L | 5 | INB_L pin stuck high. Communication corrupted. OUTB_L state high and OUTB_H state low. | B |
| INC_H | 6 | INC_H pin stuck high. Communication corrupted. OUTC_H state high and OUTC_L state low. | B |
| INC_L | 7 | INB_L pin stuck high. Communication corrupted. OUTB_L state high and OUTB_H state low. | B |
| GND1 | 8 | VCC1 shorted to GND1. Potential device damage. | A |
| GND2 | 9 | VCC2 shorted to GND2. Potential device damage. | A |
| OUTC_L | 10 | OUTC_L stuck high. Communication disrupted. If INC_L is set to cause OUTC_L to low, OUTC_L being stuck high creates a short and can damage the device. | A |
| OUTC_H | 11 | OUTC_H stuck high. Communication disrupted. If INC_H is set to cause OUTC_H to low, OUTC_H being stuck high creates a short and can damage the device. | A |
| OUTB_L | 12 | OUTB_L stuck high. Communication disrupted. If INB_L is set to cause OUTB_L to low, OUTB_L being stuck high creates a short and can damage the device. | A |
| OUTB_H | 13 | OUTB_H stuck high. Communication disrupted. If INB_H is set to cause OUTB_H to low, OUTB_H being stuck high creates a short and can damage the device. | A |
| OUTA_L | 14 | OUTA_L stuck high. Communication disrupted. If INA_L is set to cause OUTA_L to low, OUTA_L being stuck high creates a short and can damage the device. | A |
| OUTA_H | 15 | OUTA_H stuck high. Communication disrupted. If INA_H is set to cause OUTA_H to low, OUTA_H being stuck high creates a short and can damage the device. | A |
| VCC2 | 16 | Device continues to function as expected. Normal operation. | D |