SFFS177 October   2021 TCAN1046A-Q1 , TCAN1046AV-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
  6. 5Revision History

1 Overview

This document contains information for TCAN1046A-Q1 and TCAN1046AV-Q1 (VSON, SOIC, and SOT packages) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the TCAN1046A-Q1 functional block diagram for reference. Figure 1-2 shows the TCAN1046AV-Q1 functional block diagram for reference.

GUID-08A42F0F-695D-4DC4-AC4E-A9F83000CA99-low.gif Figure 1-1 TCAN1046A-Q1 Functional Block Diagram
GUID-20210624-CA0I-H72J-CWJW-RCKRZBN8SWFG-low.jpg Figure 1-2 TCAN1046AV-Q1 Functional Block Diagram

TCAN1046A-Q1 and TCAN1046AV-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.