SFFS146 November   2021 TCAN11623-Q1 , TCAN11625-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 TCAN11623-Q1 DMT Package
    2. 2.2 TCAN11625-Q1 DMT Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 TCAN11623-Q1 DMT Package
    2. 4.2 TCAN11625-Q1 DMT Package

4.2 TCAN11625-Q1 DMT Package

Figure 4-2 shows the TCAN11625-Q1 pin diagram for the DMT package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TCAN11625-Q1 data sheet.

GUID-0A447BD0-72BC-49F8-B0B4-CD440C211CCA-low.gif Figure 4-2 Pin Diagram (TCAN11625-Q1 DMT Package)
Table 4-8 Pin FMA for Device Pins Short-Circuited to Ground
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
TXD 1 Device will enter dominant timeout mode. Unable to transmit data from processor to CAN bus B
GND 2 None D
VCCOUT 3 Internal power rail held to ground, which results in unpowered device and high ISUP current. No communication with device or CAN bus possible B
RXD 4 Transceiver output biased dominant. Unable to send data from CAN bus to processor B
VIO 5 Digital pins unpowered, high IIO current. No communication between device and processor possible B
TS 6 Transceiver status output held at ground. Unable to signal ready transceiver to processor B
INH 7 INH will not function, excessive VSUP current and not able to perform power enable function B
NC 8 This pin should be left floating or pulled to ground D
WAKE 9 Will not be able to transition to high, which will not allow device to recognize a local wake up function B
VSUP 10 Device unpowered, high ISUP current B
nRST 11 Device held in reset. No communication with device or CAN bus possible B
CANL 12 VO(REC) spec violated. Degraded EMC performance C
CANH 13 Device cannot drive dominant to the bus, no communication possible B
nSLP 14 Part held in sleep mode. Part will not wake up, resulting in CAN bus communication failure B
Table 4-9 Pin FMA for Device Pins Open-Circuited
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
TXD 1 Unable to trtansmit data from processor to CAN bus B
GND 2 Device is unpowered B
VCCOUT 3 Degraded EMC performance due to no capacitance C
RXD 4 Unable to send data from CAN bus to processor B
VIO 5 Digital pins unpowered. No communication between device and processor possible B
TS 6 Transceiver status output held at ground. Unable to signal ready transceiver to processor B
INH 7 INH will not be able to perform system power enable functrion B
NC 8 This pin should be left floating or connected to ground D
WAKE 9 Will not be able to transition, which will not allow device to recognize a local wake up function B
VSUP 10 Device is unpowered B
nRST 11 Processor will be unable to reset the device. B
CANL 12 Device cannot drive dominant to the bus, unable to communicate B
CANH 13 Device cannot drive dominant to the bus, unable to communicate B
nSLP 14 Processor will be unable to put the device into low-power sleep mode B
Table 4-10 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure Effect(s)Failure Effect Class
TXD 1 GND Device will enter dominant time out mode. Unable to transmit data from processor to CAN bus B
GND 2 VCCOUT Internal power rail held to ground, which results in unpowered device and high ISUP current. No communication with device or CAN bus possible. B
VCCOUT 3 RXD RXD output biased recessive, unable to communication bus data to processor B
RXD 4 VIO RXD output biased recessive, unable to communication bus data to processor B
VIO 5 TS Transceiver status output held at VIO. Unable to signal ready transceiver to processor B
TS 6 INH Absolute maximum violation, pin may be damaged. Unable to communicate from transceiver status to processor A
NC 8 WAKE Absolute maximum violation on the NC pin, possible damage or unexpected behavior of device A
WAKE 9 VSUP Absolute maximum violation, WAKE pin may be damaged A
VSUP 10 nRST Absolute maximum violation, nRST pin may be damaged A
nRST 11 CANL Device would be reset every time bus is dominant. No communication possible B
CANL 12 CANH Bus biased recessive, no communication possible. IOS current may be reached on CANH/CANL B
CANH 13 nSLP Device could be put to sleep when bus is recessive. No communication possible B
Table 4-11 Pin FMA for Device Pins Short-Circuited to VSUP supply
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
TXD 1 Absolute maximum violation, pin may be damaged. Unable to communicate from processor to CAN bus A
GND 2 Device unpowered, high ISUP current, may damage device A
VCCOUT 3 Absolute maximum violation, device may be damaged A
RXD 4 Absolute maximum violation, pin may be damaged. Unable to communicate from CAN bus to processor A
VIO 5 Absolute maximum violation, pin may be damaged A
TS 6 Absolute maximum violation, pin may be damaged A
INH 7 INH will be biased on and will not be able to turn off B
NC 8 Absolute maximum violation on the NC pin, possible damage or unexpected behavior of device A
WAKE 9 Processor will be unable to toggle wake pin. No local wake possible B
VSUP 10 None D
nRST 11 Absolute maximum violation, pin may be damaged A
CANL 12 RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached B
CANH 13 VO(REC) spec violated. May degrade EMC performance C
nSLP 14 Absolute maximum violation, pin may be damaged A
Table 4-12 Pin FMA for Device Pins Short-Circuited to VCCOUT supply
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
TXD 1 TXD will be held high, no communication from processor to CAN bus possible B
GND 2 Device unpowered, high VCCOUT current, may enter thermal shutdown B
VCCOUT 3 None D
RXD 4 RXD will be held high, no communication from CAN bus to processor possible B
VIO 5 Potential for high VCCOUT current, may enter thermal shutdown B
TS 6 Held high, unable to signal transceiver state to processor B
INH 7 Absolute maximum violation, device may be damaged A
NC 8 Pin not held at ground or floating, possible unexpected behavior of device B
WAKE 9 Processor will be unable to toggle wake pin. No local wake possible B
VSUP 10 Absolute maximum violation, device may be damaged A
nRST 11 Held high, unable to reset processor B
CANL 12 RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached B
CANH 13 VO(REC) spec violated. May degrade EMC performance C
nSLP 14 Held high, unable to put device to sleep B
Table 4-13 Pin FMA for Device Pins Short-Circuited to VIO supply
Pin Name Pin No. Description of Potential Failure Effect(s) Failure Effect Class
TXD 1 TXD will be held high, no communication from processor to CAN bus possible B
GND 2 Device unpowered, communication not possible B
VCCOUT 3 Potential for high VCCOUT current, may enter thermal shutdown B
RXD 4 RXD will be held high, no communication from CAN bus to processor possible B
VIO 5 None D
TS 6 Held high, unable to signal transceiver state to processor B
INH 7 Absolute maximum violation, device may be damaged A
NC 8 Pin not held at ground or floating, possible unexpected behavior of device B
WAKE 9 Processor will be unable to toggle wake pin. No local wake possible B
VSUP 10 Absolute maximum violation, device may be damaged A
nRST 11 Held high, unable to reset processor B
CANL 12 RXD biased recessive, no communication from CAN bus to processor possible. IOS current may be reached B
CANH 13 VO(REC) spec violated. May degrade EMC performance C
nSLP 14 Held high, unable to put device to sleep B