SFFS112 April   2021 TPS25850-Q1 , TPS25858-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)

1 Overview

This document contains information for TPS25850-Q1 and TPS25858-Q1 (VQFN-HR package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device

Figure 1-1 shows the device functional block diagram for reference.

GUID-20210413-CA0I-KPKC-CG30-CZ4Z6QXMQGM9-low.gif Figure 1-1 Functional Block Diagram

TPS25850-Q1 and TPS25858-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.