SBVK009A August   2022  – November 2022 LP5912-EP

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Qualification by Similarity (Qualification Family)
  5. 3Technology Family FIT and MTBF Data
  6. 4Device Family Qualification Data
  7. 5Ongoing Reliability Monitoring
  8. 6Summary
  9. 7Revision History

1 Introduction

TI qualification testing is a risk mitigation process that is engineered to provide device longevity in customer applications. Wafer fabrication processes and package level reliability are evaluated in a variety of ways that can include accelerated environmental test conditions with subsequent derating to actual use conditions. Manufacturability of the device is evaluated to verify a robust assembly flow and maintain continuity of supply to customers. TI Enhanced Products are qualified with industry standard test methodologies performed to the intent of the Joint Electron Devices Engineering Council (JEDEC) standards and procedures. Texas Instruments Enhanced Products are certified to meet GEIA-STD-0002-1 Aerospace Qualified Electronic Components.