SBVK009A August   2022  – November 2022 LP5912-EP

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Qualification by Similarity (Qualification Family)
  5. 3Technology Family FIT and MTBF Data
  6. 4Device Family Qualification Data
  7. 5Ongoing Reliability Monitoring
  8. 6Summary
  9. 7Revision History

3 Technology Family FIT and MTBF Data

Mean time between fails (MTBF) and failures in time (FIT) rates are device reliability statistics calculated based on data collected from TI’s internal reliability testing (life test).

TI’s DPPM/FIT/MTBF estimator search tool reports the generic data based on technology groupings and shows conditions under which the rates were derived. All terms used in the tool and definitions can be found on the TI reliability terminology page. Failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested, therefore, failure rates are not comparable.

TI DPPM/FIT/MTBF estimator search tool web page link:

www.ti.com/quality/docs/estimator.tsp