SBOK103B February   2025  – March 2025 INA950-SEP

 

  1.   1
  2.   Abstract
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Single-Event Latch-Up Results
  8. 6Single Event Transient Results
  9. 7Summary
  10. 8Confidence Interval Calculations
  11. 9References

3 Test Device and Test Board Information

The INA950-SEP is packaged in a 8-pin PW (TSSOP) shown with the bias board in Figure 3-1 . Figure 3-4 shows the biasing configuration used for both the SEL and SET tests.

INA950-SEP Evaluation Board at MSU Facility for Rare Isotope Beams Figure 3-1 INA950-SEP Evaluation Board at MSU Facility for Rare Isotope Beams
INA950-SEP Temperature Reading during SEL Testing Figure 3-2 INA950-SEP Temperature Reading during SEL Testing
INA950-SEP Under Beam at TAMU Cyclotron Radiation Effects Facility Figure 3-3 INA950-SEP Under Beam at TAMU Cyclotron Radiation Effects Facility
INA950-SEP Bias Configuration Figure 3-4 INA950-SEP Bias Configuration