During SEL qualification, the device was heated using forced hot air, maintaining an IC temperature at 125°C. The temperature was monitored using a thermal camera. The species used for the SEL testing was a thulium (¹⁶⁹Tm) ion with an angle-of-incidence of 0° and an air gap of 70mm, for an LET_EFF = 75MeV-cm²/mg. A nominal flux of 10⁵ ions / s-cm² and fluence of 10⁷ ions / cm² were targeted for each run. A total of five different DUTs were used for this testing, together experiencing a cumulative total fluence of approximately 30 × 10⁷ ions / cm² with no failures observed.

An exhaustive summary of the conditions for the 3 SEL test runs performed is provided in Table 5-1. The run numbers listed are the actual run numbers from the testing session, and the flux, fluence, and dose in silicon for each run are pulled from the test session log provided by the MSU FRIB. Note that some runs, such as 13-15, from the session are excluded from the table because these runs were used to test other non-INA1H94-SP devices. Figure 5-2 and related figures show example plots of the supply currents versus time.

Figure 5-1 Thermal Image During Set Up

No SEL events were observed, which indicates that the INA1H94-SP is SEL-immune at LET_EFF = 75MeV-cm²/ mg and T = 125°C.

σSEL ≤ 1.84 × 10^–7 cm² for LET_EFF = 75MeV-cm²/ mg and T = 125°C.

Figure 5-2 Current Versus Time (I Versus t) Data for V+ Current During SEL Run 4

Figure 5-4 Current Versus Time (I Versus t) Data for I_IN Current During SEL Run 4

Figure 5-6 Current Versus Time (I Versus t) Data for V+ Current During SEL Run 2 (Zoom In)

Figure 5-8 Current Versus Time (I Versus t) Data for V- Current During SEL Run 2 (Zoom In)

Figure 5-10 Current Versus Time (I Versus t) Data for I_IN Current During SEL Run 2 (Zoom In)

Figure 5-3 Current Versus Time (I Versus t) Data for V- Current During SEL Run 4

Figure 5-5 Current Versus Time (I Versus t) Data for V+ Current During SEL Run 2

Figure 5-7 Current Versus Time (I Versus t) Data for V- Current During SEL Run 2

Figure 5-9 Current Versus Time (I Versus t) Data for I_IN Current During SEL Run 2

An additional SMU SEL session was performed with 3 fresh devices. A summary of the conditions in test runs performed is provided in Table 5-2. On this session, devices were tested up to the absolute maximum supply of 24V without any failures observed.