SETs are defined as heavy-ion-induced transient upsets on output pin Q _Hof the SN54SC8T165-SEP. SET testing was performed at room temperature (no external temperature control applied). The species used for the SET testing was ¹²⁹Xe for a LET_EFF = 50MeV × cm² / mg. Flux of approximately 10⁵ ions / cm² × s and a fluence of approximately 10⁷ ions / cm² were used for the SET runs.

Three units were tested across multiple input conditions to determine the worst-case setup for SETs. The unit was tested with V_CC of 1.2V and 5.5V and a rising edge window trigger of ±1%, ±2%, ±3% and ±5%. All combinations of VCC and window triggers showed no transient upsets, as listed in Table 5-2

To capture SETs, one NI PXI-5110 scope card was used to continuously monitor the output voltage on pin Q_H. The NI scope was programmed to a sample rate of 100M samples per second (S/s) and recorded 2k samples, with a 20% pretrigger reference, in case of an event (trigger). Under heavy-ions, the SN54SC8T165-SEP did not exhibit any transient upsets.