SBOK096A February   2025  – March 2025 SN54SC8T164-SEP , SN54SC8T374-SEP , SN54SC8T574-SEP , SN54SC8T595-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Single-Event Transients (SET)
    3. 5.3 Event Rate Calculations
  9. 6Summary
  10. 7References
  11. 8Revision History

Abstract

The purpose of this study is to characterize the single-event-effects (SEE) performance due to heavy-ion irradiation of the SN54SC8T595-SEP. SEE performance was verified at minimum (1.2V) and maximum (5.5V) operating conditions. Heavy-ions with an LETEFF of 50MeV-cm2/ mg were used to irradiate three production devices with a fluence of 1 × 107 ions / cm2. The results demonstrate that the SN54SC8T595-SEP is SEL-free up to LETEFF = 50MeV-cm2 / mg as 125°C. SET performance at maximum operating voltage saw no excursions ≥ |1%| , as shown and discussed in this report. SET performance at minimum operating voltage saw one excursion ≥ |1%|, as shown and discussed in this report.

The SN54SC8T595-SEP Single-Event Effects (SEE) radiation report covers the SEE performance of all four devices listed below. The SN54SC8T595-SEP device covers all functional blocks and active die area of the other three devices, which is why the device was selected for single-event effect testing for this group of devices.

  • SN54SC8T595-SEP
  • SN54SC8T164-SEP
  • SN54SC8T374-SEP
  • SN54SC8T574-SEP