SBOK089 February   2025 SN54SC8T373-SEP , SN54SC8T573-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Single-Event Transients (SET)
    3. 5.3 Event Rate Calculations
  9. 6Summary
  10. 7References

1 Overview

The SN54SC8T573-SEP devices are octal transparent D-type latches that feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

While the latch-enable (LE) input is high, the Q outputs respond to the data (D) inputs. When LE is low, the outputs are latched to retain the data that was set up.

For more information, see the SN54SC8T573-SEP product page.

Table 1-1 Overview Information
DescriptionDevice Information
TI Part NumberSN54SC8T573-SEP
Orderable Part NumberSN54SC8T573MPWTSEP

VID Number

V62/25628

Device FunctionRadiation-tolerant, 1.2V to 5.5V, Octal Transparent D-Type Latches with 3-State Outputs
TechnologyLBC9
Exposure FacilityFacility for Rare Isotope Beams (FRIB) at Michigan State University – FRIB Single Event Effects (FSEE) Facility
Heavy Ion Fluence per Run1 × 107 ions / cm2
Irradiation Temperature25°C (for SET testing) and 125°C (for SEL testing)