SBOK061 October   2022 SN54SLC8T245-SEP

 

  1.   SN54SLC8T245-SEP Single-Event Effects (SEE)
  2.   Trademarks
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Results
    1. 5.1 Single Event Latchup (SEL) Results
    2. 5.2 Single Event Transient (SET) Results
    3. 5.3 Event Rate Calculations
  8. 6Summary
  9.   A References

6 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the SN54SLC8T245-SEP 8-bit dual-supply bus transceiver. Heavy-ions with LETEFF = 43 MeV·cm2 /mg were were used for the SEE characterization campaign. The SEE results demonstrated that the SN54SLC8T245-SEP is free of destructive SET events and SEL-free up to LETEFF = 43 MeV·cm2 /mg and across the full electrical specifications. Transients at LETEFF = 43 MeV·cm2 /mg are presented and discussed. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE are presented for reference.