SBOA446 March   2021 TLV9002-Q1 , TLV9004-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOIC (8) Package
    2. 2.2 VSSOP (8) Package
    3. 2.3 SOIC (14) Package
    4. 2.4 SOT-23 (14) Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 SOIC (8) and VSSOP (8) Packages
    2. 4.2 SOT-23 (14) and SOIC (14) Packages

4.2 SOT-23 (14) and SOIC (14) Packages

Figure 4-2 shows the TLV9004-Q1 pin diagram for the SOT-23 (14) and SOIC (14) packages. For a detailed description of the device pins please refer to the 'Pin Configuration and Functions' section in the TLV9004-Q1 data sheet.

GUID-05171073-B721-4B2C-A3C1-EC15AC088071-low.svgFigure 4-2 Pin Diagram (SOT-23 (14) and SOIC (14) Packages)
Table 4-6 Pin FMA for Device Pins Short-Circuited to (V-)
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
OUT11May cause overheating.B
IN1-2Input at V- is valid input, however, desired application result is unlikely.C
IN1+3Input at V- is valid input, however, desired application result is unlikely.C
(V+)4Diodes from input to V+ may turn due to input signal and cause EOS.B
IN2+5Input at V- is valid input, however, desired application result is unlikely.C
IN2-6Input at V- is valid input, however, desired application result is unlikely.C
OUT27May cause overheating.B
OUT38May cause overheating.B
IN3-9Input at V- is valid input, however, desired application result is unlikely.C
IN3+10Input at V- is valid input, however, desired application result is unlikely.C
(V-)11Normal operation.D
IN4+12Input at V- is valid input, however, desired application result is unlikely.C
IN4-13Input at V- is valid input, however, desired application result is unlikely.C
OUT414May cause overheating.B
Table 4-7 Pin FMA for Device Pins Open-Circuited
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
OUT11Output can't be used by application.C
IN1-2Floating input, circuit will likely not function as expected.C
IN1+3Floating input, circuit will likely not function as expected.C
(V+)4Highest voltage pin will try to power internal ground via ESD diode to VCC.B
IN2+5Floating input, circuit will likely not function as expected.C
IN2-6Floating input, circuit will likely not function as expected.C
OUT27Output can't be used by application.C
OUT38Output can't be used by application.C
IN3-9Floating input, circuit will likely not function as expected.C
IN3+10Floating input, circuit will likely not function as expected.C
(V-)11Lowest voltage pin will try to power internal ground via ESD diode to ground.B
IN4+12Floating input, circuit will likely not function as expected.C
IN4-13Floating input, circuit will likely not function as expected.C
OUT414Output can't be used by application.C
Table 4-8 Pin FMA for Device Pins Short-Circuited to (V+)
Pin NamePin No.Description of Potential Failure Effect(s)Failure Effect Class
OUT11May cause overheating.B
IN1-2Input at V+ is valid input, however, desired application result is unlikely.C
IN1+3Input at V+ is valid input, however, desired application result is unlikely.C
(V+)4Normal operation.D
IN2+5Input at V+ is valid input, however, desired application result is unlikely.C
IN2-6Input at V+ is valid input, however, desired application result is unlikely.C
OUT27May cause overheating.B
OUT38May cause overheating.B
IN3-9Input at V+ is valid input, however, desired application result is unlikely.C
IN3+10Input at V+ is valid input, however, desired application result is unlikely.C
(V-)11Diodes from input to V- may turn due to input signal and cause EOS.B
IN4+12Input at V+ is valid input, however, desired application result is unlikely.C
IN4-13Input at V+ is valid input, however, desired application result is unlikely.C
OUT414May cause overheating.B
Table 4-9 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin NamePin No.Shorted toDescription of Potential Failure Effect(s)Failure Effect Class
OUT11IN1-Negative feedback, creates unity gain buffer.C
IN1-2IN1+No damage to device, application circuit won't work.C
IN1+3(V+)Input at V+ is valid input, however, desired application result is unlikely.C
(V+)4IN2+Input at V+ is valid input, however, desired application result is unlikely.C
IN2+5IN2-No damage to device, application circuit won't work.C
IN2-6OUT2Negative feedback, creates unity gain buffer.C
OUT27OUT3May cause overheating (pins on opposite sides, not adjacent).B
OUT38IN3-Negative feedback, creates unity gain buffer.C
IN3-9IN3+No damage to device, application circuit won't work.C
IN3+10(V-)Input at ground is valid input, however, desired application result is unlikely.C
(V-)11IN4+CH 4 output high, if other input is valid common mode range.C
IN4+12IN4-No damage to device, application circuit won't work.C
IN4-13OUT4Negative feedback, creates unity gain buffer.C
OUT414OUT1May cause overheating (pins on opposite sides, not adjacent).B