ZHCSIY9 October   2018 TS3A5017-Q1

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     Device Images
      1.      方框图
  4. 4 修订历史记录
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics for 3.3-VSupply
    6. 6.6 Electrical Characteristics for 2.5-VSupply
    7. 6.7 Switching Characteristics for 3.3-VSupply
    8. 6.8 Switching Characteristics for 2.5-VSupply
    9. 6.9 Typical Characteristics
  7. 7 Parameter Measurement Information
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 器件支持
      1. 12.1.1 器件命名规则
    2. 12.2 文档支持
      1. 12.2.1 相关文档
    3. 12.3 接收文档更新通知
    4. 12.4 社区资源
    5. 12.5 商标
    6. 12.6 静电放电警告
    7. 12.7 术语表
  13. 13机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN MAX UNIT
V+ Supply voltage(3) –0.5 4.6 V
VS, VD Analog voltage(3)(4) –0.5 4.6 V
ISK, IDK Analog port clamp current VS, VD < 0 –50 mA
IS, ID ON-state switch current VS, VD = 0 to 7 V –128 128 mA
VI Digital input voltage –0.5 4.6 V
IIK Digital input clamp current(3)(4) VI < 0 –50 mA
I+ Continuous current through V+ 100 mA
IGND Continuous current through GND –100 mA
Tstg Storage temperature –65 150 °C
(1) Stresses beyond those listed underAbsolute Maximum Ratings may cause permanent damage to thedevice. These are stress ratings only, and functional operation of the device at these or any otherconditions beyond those indicated under Recommended OperatingConditions is not implied. Exposure to absolute-maximum-rated conditions for extendedperiods may affect device reliability.
(2) The algebraic convention, whereby the most negative value is aminimum and the most positive value is a maximum.
(3) All voltages are with respect to ground, unless otherwisespecified.
(4) The input and output voltage ratings may be exceeded if theinput and output clamp-current ratings are observed.