ZHCSGZ0B October 2017 – November 2017 TPS23525
PRODUCTION DATA.
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| VCC – Clamped Supply | ||||||
| tID | Insertion Delay | VVCC: 0 V → 10 V, measure delay before VGATE ↑ | 32 | ms | ||
| UVEN | ||||||
| TUV,degl | Deglitch on UVEN | 4 | µs | |||
| OV | ||||||
| TOV,degl | Deglitch on OV | 4 | µs | |||
| SNS | ||||||
| TSNS,FST,RESP | Response time to large over current | VSNS steps from 0 mV to 60 mV. Measure time for GATE to come down. | 300 | ns | ||
| Neg48VA, NEG48VB | ||||||
| TNeg48Vx,FST,RESP | Response time to large reverse current | VNEG48Vx steps from -40 mV to 15 mV. Measure time for GATEx to come down. | 300 | ns | ||
| PGb | ||||||
| tPGb,DEGL | Deglitch of PGb. (raise GATE, measure delay between GATE and PGb) | Power Good ↑ (V(GATE) 0 V → 10 V) Look for PGb ↓ | 1 | ms | ||
| Power Good ↓ (V(GATE) 10 V → 0 V) Look for PGb ↑ | 32 | ms | ||||