ZHCSL40M 数据表 | 德州仪器 TI.com.cn

ZHCSL40M November 2004 – January 2023 TLVH431 , TLVH431A , TLVH431B , TLVH432 , TLVH432A , TLVH432B

PRODUCTION DATA

6.8 Typical Characteristics

Operation of the device at these or any other conditions beyond those indicated in the GUID-04CA6D15-7338-4464-8D24-EDF285F2DACF.html#GUID-04CA6D15-7338-4464-8D24-EDF285F2DACF table are not implied.

Figure 6-1 Reference Voltage vs Junction Temperature

Figure 6-3 Cathode Current vs Cathode Voltage

Figure 6-5 Minimum Cathode Current vs. Temperature

Figure 6-7 Ratio of Delta Reference Voltage to Delta Cathode Voltage vs Junction Temperature

Figure 6-2 Reference Input Current vs Junction Temperature

Figure 6-4 Cathode Current vs Cathode Voltage

Figure 6-6 Off-State Cathode Current vs Junction Temperature

Figure 6-8 Percentage Change in V_REF vs Operating Life at 55°C

Figure 6-9 Equivalent Input Noise Voltage

Figure 6-11 Voltage Gain and Phase Margin

Figure 6-13 Pulse Response 2

Figure 6-15 Phase Margin vs Capacitive Load V_KA = V_REF (1.25 V), T_A= 25°C

Figure 6-17 Phase Margin vs Capacitive Load V_KA = 5.00 V, T_A= 25°C

Figure 6-10 Equivalent Input Noise Voltage

Figure 6-12 Pulse Response 1

Figure 6-14 Phase Margin Test Circuit

Figure 6-16 Phase Margin vs Capacitive Load V_KA = 2.50 V, T_A= 25°C