SLOS180D February   1997  – April 2026 TL031 , TL032 , TL032A , TL034 , TL034A

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Thermal Information
    3. 5.3  Recommended Operating Conditions
    4. 5.4  TL031C and TL031AC Electrical Characteristics
    5. 5.5  TL031C and TL031AC Operating Characteristics
    6. 5.6  TL031I and TL031AI Electrical Characteristics
    7. 5.7  TL031I and TL031AI Operating Characteristics
    8. 5.8  TL032C and TL032AC Electrical Characteristics
    9. 5.9  TL032C and TL032AC Operating Characteristics
    10. 5.10 TL032I and TL032AI Electrical Characteristics
    11. 5.11 TL032I and TL032AI Operating Characteristics
    12. 5.12 TL034C and TL034AC Electrical Characteristics
    13. 5.13 TL034C and TL034AC Operating Characteristics
    14. 5.14 TL034I and TL034AI Electrical Characteristics
    15. 5.15 TL034I and TL034AI Operating Characteristics
    16. 5.16 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Typical Values
    2. 6.2 Input Bias and Offset Current
    3. 6.3 Noise
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Input Characteristics
      2. 7.1.2 Output Characteristics
      3. 7.1.3 Transimpedance Amplifier
      4. 7.1.4 4mA to 20mA Current Loops
      5. 7.1.5 Instrumentation Amplifier with Linear Gain Adjust
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • D|8
  • P|8
  • PS|8
散热焊盘机械数据 (封装 | 引脚)
订购信息

6.2 Input Bias and Offset Current

At the picoampere bias current level typical of the TL03x and TL03xA, accurate measurement of the bias current becomes difficult. Not only does this measurement require a picoammeter, but test-socket leakages easily can exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments uses a two-step process. The socket leakage is measured using picoammeters with bias voltages applied but with no device in the socket. The device is then inserted into the socket and a second test that measures both the socket leakage and the device input bias current is performed. The two measurements are then subtracted algebraically to determine the bias current of the device.