ZHCSSU3G October   1995  – February 2024 SN54AC374 , SN74AC374

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 说明
  4. 3 Pin Configuration and Functions
  5. 4 Specifications
    1. 4.1 Absolute Maximum Ratings
    2. 4.2 Recommended Operating Conditions
    3. 4.3 Thermal Information
    4. 4.4 Electrical Characteristics
    5. 4.5 Timing Requirements, VCC = 3.3 V ± 0.3 V
    6. 4.6 Timing Requirements, VCC = 5 V ± 0.5 V
    7. 4.7 Switching Characteristics, VCC = 3.3 V ± 0.3 V
    8. 4.8 Switching Characteristics, VCC = 5 V ± 0.5 V
    9. 4.9 Operating Characteristics
  6. 5 Parameter Measurement Information
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Power Supply Recommendations
    2. 7.2 Layout
      1. 7.2.1 Layout Guidelines
        1. 7.2.1.1 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Documentation Support (Analog)
      1. 8.1.1 Related Documentation
    2. 8.2 接收文档更新通知
    3. 8.3 支持资源
    4. 8.4 Trademarks
    5. 8.5 术语表
    6. 8.6 静电放电警告
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • DB|20
  • NS|20
  • N|20
  • DW|20
  • PW|20
散热焊盘机械数据 (封装 | 引脚)
订购信息

4.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)1
MIN MAX UNIT
VCC Supply voltage range −0.5 7 V
VI2 Input voltage range −0.5 VCC + 0.5 V
VO2 Output voltage range −0.5 VCC + 0.5 V
IIK Input clamp current (VI < 0 or VI > VCC) ±20 mA
IOK Output clamp current (VO < 0 or VO > VCC) ±20 mA
IO Continuous output current (VO = 0 to VCC) ±50 mA
Continuous current through VCC or GND ±200 mA
Tstg Storage temperature range −65 150 °C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The input and output voltage ratings may be exceeded if the input and output current ratings are observed.