ZHCSHV1A March 2018 – May 2018 SN65LVDS93B-Q1
PRODUCTION DATA.
7 Parameter Measurement Information
All input timing is defined at IOVDD / 2 on an input signal with a 10% to 90% rise or fall time of less than 3 ns. CLKSEL = 0 V.
Figure 4. Set Up and Hold Time Definition 
Figure 5. Test Load and Voltage Definitions for LVDS Outputs 
The 16 grayscale test pattern test device power consumption for a typical display pattern.
Figure 6. 16 Grayscale Test Pattern 
The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs.
Figure 7. Worst-Case Power Test Pattern 
CLKOUT is shown with CLKSEL at high-level.
CLKIN polarity depends on CLKSEL input level.
Figure 8. SN65LVDS93B-Q1 Timing Definitions CLKIN polarity depends on CLKSEL input level.
Figure 9. Output Clock Jitter Test Set Up 
Figure 10. Enable Time Waveforms 
Figure 11. Disable Time Waveforms