SNVS161E October   2001  – October 2015 LP3988

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Enable (EN)
      2. 8.3.2 Regulated Output (OUT)
      3. 8.3.3 Power Good (PG) Output
      4. 8.3.4 PG Delay Time
      5. 8.3.5 Current Limit
      6. 8.3.6 Thermal Shutdown (TSD)
      7. 8.3.7 Fast Turnon Time
    4. 8.4 Device Functional Modes
      1. 8.4.1 Normal Operation
      2. 8.4.2 Dropout Operation
      3. 8.4.3 Disabled
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 External Capacitors
        2. 9.2.2.2 Input Capacitor
        3. 9.2.2.3 Output Capacitors
        4. 9.2.2.4 No-Load Stability
        5. 9.2.2.5 Capacitor Characteristics
        6. 9.2.2.6 Power Dissipation
        7. 9.2.2.7 Estimating Junction Temperature
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Examples
    3. 11.3 DSBGA Mounting
  12. 12Device and Documentation Support
    1. 12.1 Related Documentation
    2. 12.2 Community Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)(2)(3)
MIN MAX UNIT
IN pin −0.3 6.5 V
OUT, EN, PG pins −0.3 See(4) V
Junction temperature, TJ 150 °C
Power dissipation(5) SOT-23-5 469 mW
DSBGA 441
Storage temperature, Tstg −65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to the potential at the GND pin.
(3) If Military/Aerospace specified devices are required, contact the Texas Instruments Sales Office/ Distributors for availability and specifications.
(4) The lesser of VIN + 0.3 V or 6 V.
(5) The absolute maximum power dissipation depends on the ambient temperature and the RθJA value; it can be calculated using the formula: PD = (TJ – TA)/RθJA where TJ(MAX) is the maximum junction temperature, TA(MAX) is the maximum expected ambient temperature, and RθJA is the junction-to-ambient thermal resistance.The 469-mW rating for the SOT-23-5 package results from substituting the junction temperature, 150°C, for TJ(MAX), 70°C for TA, and 181.2°C/W for RθJA. More power can be dissipated safely at ambient temperatures below 70°C . Less power can be dissipated safely at ambient temperatures above 70°C. The absolute maximum power dissipation can be increased by 5.86 mW for each degree below 70°C, and it must be derated by 5.86 mW for each degree above 70°C. Same principle applies to the DSBGA package.

6.2 ESD Ratings

VALUE UNIT
LP3988 IN SOT-23 PACKAGE
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±150
LP3988 IN DSBGA PACKAGE
V(ESD) Electrostatic discharge Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±2000 V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±200
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)(1)(2)
MIN NOM MAX UNIT
VIN 2.5(3) 6 V
VOUT, VEN 0 VIN V
VPG 0 6 V
IPG 0 500 µA
Junction temperature, TJ –40 125 °C
Maximum power dissipation(4) SOT-23 322 mW
DSBGA 303
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to the potential at the GND pin.
(3) The minimum VIN is dependant on the device output option. For VOUT(NOM) < 2.5 V, VIN(MIN) equals 2.5 V. For VOUT(NOM) ≥ 2.5 V, VIN(MIN) equals VOUT(NOM) + 200 mV.
(4) Like the Absolute Maximum power dissipation, the maximum power dissipation for operation depends on the ambient temperature. The 322-mW rating appearing under Recommended Operating Conditions for the SOT-23-5 package results from substituting the maximum junction temperature for operation, 125°C, for TJ(MAX), 70°C for TA(MAX), and 181.2°C/W for RθJA. More power can be dissipated at ambient temperatures below 70°C . Less power can be dissipated at ambient temperatures above 70°C. The maximum power dissipation for operation can be increased by 4.5 mW for each degree below 70°C, and it must be derated by 5.86 mW for each degree above 70°C. The same principle applies to the DSBGA package.

6.4 Thermal Information

THERMAL METRIC(1) LP3988 UNIT
DBV (SOT-23) YZR (DSBGA)
5 PINS 5 PINS
RθJA Junction-to-ambient thermal resistance 170.5 181.2 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 124.4 0.8 °C/W
RθJB Junction-to-board thermal resistance 30.9 107.9 °C/W
ψJT Junction-to-top characterization parameter 17.6 0.5 °C/W
ψJB Junction-to-board characterization parameter 30.4 107.9 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance n/a n/a °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953.

6.5 Electrical Characteristics

Unless otherwise specified: VEN = 1.8 V, VIN = VOUT + 0.5 V, CIN = 1 µF, IOUT = 1 mA, COUT = 1 µF; typical values and limits are for TJ = 25°C, and minimum and maximum values and limits apply over the entire junction temperature range for operation, −40°C to +125°C.(1)(2)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ΔVOUT Output voltage volerance −2 2 % of VOUT(NOM)
−20°C ≤ TJ ≤ 125°C, SOT-23-5 –3 3
SOT-23-5 –3.5 3.5
DSBGA –3 3
Line regulation error VIN = VOUT(NOM) + 0.5 V to 6 V
TJ = 25°C
−0.15 0.15 %/V
VIN = VOUT(NOM) + 0.5 V to 6 V –0.2 0.2
Load regulation error(3) IOUT = 1 mA to 150 mA, TJ = 25°C 0.005 %/mA
IOUT = 1 mA to 150 mA 0.007
PSRR Power Supply Rejection Ratio VIN = VOUT(NOM) + 1 V,
ƒ = 1 kHz,
IOUT = 50 mA (See Figure 11)
65 dB
VIN = VOUT(nom) + 1 V,
ƒ = 10 kHz, IOUT = 50 mA
(See Figure 11)
45
IQ Quiescent current VEN = 1.4 V, IOUT = 0 mA, TJ = 25°C 85 120 µA
VEN = 1.4 V, IOUT = 0 to 150 mA 140 200
VEN = 0.4 V 0.003 1
Dropout voltage(4) IOUT = 1 mA 1 5 mV
IOUT = 150 mA, TJ = 25°C 80 115
IOUT = 150 mA 150
ISC Short circuit current limit See(5) 600 mA
en Output noise voltage BW = 10 Hz to 100 kHz,
COUT = 1 µF
220 µVRMS
COUT Output capacitor Capacitance(6) 1 20 µF
ESR(6) 5 500
TSD Thermal shutdown temperature 160 °C
Thermal shutdown hysteresis 20
ENABLE CONTROL CHARACTERISTICS
IEN Maximum input current at EN VEN = 0 V and VIN = 6 V 0.1 µA
VIL Logic low input threshold VIN = 2.5 V to 6 V 0.5 V
VIH Logic high input threshold VIN = 2.5 V to 6 V 1.2 V
POWER GOOD
VTHL PG low threshold
(See Figure 10)
% of VOUT (PG ON), TJ = 25°C 90% 93% 95%
VTHH PG high threshold
(See Figure 10)
% of VOUT (PG OFF), TJ = 25°C(7) 92% 95% 98%
VOL PG output logic low voltage IPULLUP = 100 µA, fault condition 0.02 0.1 V
IPGL PG output leakage current PG off, VPG = 6 V 0.02 µA
(1) All electrical characteristics having room-temperature limits are tested during production with TJ = 25°C or correlated using Statistical Quality Control (SQC) methods. All hot and cold limits are specified by correlating the electrical characteristics to process and temperature variations and applying statistical process control.
(2) The target output voltage, which is labeled VOUT(NOM), is the desired voltage option.
(3) An increase in the load current results in a slight decrease in the output voltage and vice versa.
(4) Dropout voltage is the input-to-output voltage difference at which the output voltage is 100 mV below its nominal value.
(5) Short-circuit current is measured on input supply line after pulling down VOUT to 95% VOUT(NOM).
(6) Specified by design. Not production tested. The capacitor tolerance should be ±30% or better over the full temperature range. The full range of operating conditions such as temperature, DC bias and even capacitor case size for the capacitor in the application should be considered during device selection to ensure this minimum capacitance specification is met. X7R capacitor types are recommended to meet the full device temperature range.
(7) The low and high thresholds are generated together. Typically a 2.6% difference is seen between these thresholds.

6.6 Timing Requirements

MIN NOM MAX UNIT
TON PG turnon time(1), VIN = 4.2 V 10 µs
TOFF PG turnoff time(1), VIN = 4.2 V 10 µs
(1) Turnon time is time measured between the enable input just exceeding VIH and the output voltage just reaching 95% of its nominal value.

6.7 Typical Characteristics

Unless otherwise specified, CIN = COUT = 1 µF ceramic, VIN = VOUT + 0.2 V, TA = 25°C, EN pin is tied to VIN.
LP3988 20020510.png
Figure 1. Ripple Rejection Ratio (LP3988-2.6 V)
LP3988 20020511.png
Figure 2. Ripple Rejection Ratio (LP3988-2.6 V)
LP3988 20020512.png
Figure 3. Power-Good Response Time (LP3988-2.85 V)
(Flag Pin Pulled To VOUT Through a 100-kΩ Resistor)
LP3988 20020514.png
Figure 5. Power-Good Response Time (LP3988-2.85 )
(Flag Pin Pulled To VOUT Through a 100-kΩ Resistor)
LP3988 20020518.png
Figure 7. Enable Response
LP3988 20020513.png
Figure 4. Power-Good Response Time (LP3988-2.85 V)
(Flag Pin Pulled To VIN Through a 100-kΩ Resistor)
LP3988 20020517.png
Figure 6. Power-Up Response
LP3988 20020519.png
Figure 8. Enable Response