SNLS309I April   2010  – December 2014 LMH1983

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Description (continued)
  6. Pin Configurations and Functions
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Frame Timing Outputs Timing Requirements
    7. 7.7 Frame Timing Outputs Switching Characteristics
    8. 7.8 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Control of PLL1
      2. 8.3.2  PLL1 Loop Response Design Equations
      3. 8.3.3  Control of PLL2 and PLL3
      4. 8.3.4  Control of PLL4
      5. 8.3.5  Clock Output Jitter
      6. 8.3.6  Lock Determination
      7. 8.3.7  Lock Time Considerations
      8. 8.3.8  LOR Determination
      9. 8.3.9  Output Driver Adjustments
      10. 8.3.10 TOF1 Alignment
      11. 8.3.11 TOF2 and TOF3 Alignment
        1. 8.3.11.1 TOF3 Initialization Set Up
      12. 8.3.12 TOF4 Alignment
    4. 8.4 Device Functional Modes
      1. 8.4.1 Reference Detection
      2. 8.4.2 User Defined Formats
      3. 8.4.3 Auto Format Detection Codes
      4. 8.4.4 Free-Run, Genlock, and Holdover Modes
    5. 8.5 Programming
      1. 8.5.1 I2C Interface Protocol
      2. 8.5.2 Write Sequence
      3. 8.5.3 Read Sequence
    6. 8.6 Register Map
  9. Applications and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Typical Genlock Timing Generation with NTSC 525i/29.97 High Speed Reference
        1. 9.2.1.1 Design Requirements
          1. 9.2.1.1.1 VCXO Selection Criteria
          2. 9.2.1.1.2 Loop Filter Capacitors
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curves
      2. 9.2.2 A/V Clock Generation with Recognized Clock-based Input Reference
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
        3. 9.2.2.3 Application Curve
      3. 9.2.3 A/V Clock Generation Using Free-Run Mode
        1. 9.2.3.1 Design Requirements
        2. 9.2.3.2 Detailed Design Procedure
        3. 9.2.3.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Trademarks
    3. 12.3 Electrostatic Discharge Caution
    4. 12.4 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

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机械数据 (封装 | 引脚)
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订购信息

12 Device and Documentation Support

12.1 Documentation Support

12.1.1 Related Documentation

For related documentation, see the following:

  • Absolute Maximum Ratings for Soldering (SNOA549).
  • Generating 44.1 kHz Based Clocks with the LMH1983, Application Note AN–2108 (SNLA129).
  • Leadless Leadframe Package (LLP), Application Note AN-1187 (SNOA401).
  • SD1983EVK/LMH1983 Evaluation Kit User Guide (SNLU001).
  • Semiconductor and IC Package Thermal Metrics (SPRA953).

12.2 Trademarks

All other trademarks are the property of their respective owners.

12.3 Electrostatic Discharge Caution

esds-image

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.

12.4 Glossary

SLYZ022TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.