SNIS146B March   2007  – October 2017 LM95214

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: Temperature-to-Digital Converter
    6. 6.6 Logic Electrical Characteristics: Digital DC Characteristics
    7. 6.7 Switching Characteristics: SMBus Digital
    8. 6.8 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Conversion Sequence
      2. 7.3.2 Power-On-Default States
      3. 7.3.3 SMBus Interface
      4. 7.3.4 Temperature Conversion Sequence
        1. 7.3.4.1 Digital Filter
      5. 7.3.5 Fault Queue
      6. 7.3.6 Temperature Data Format
      7. 7.3.7 SMBDAT Open-Drain Output
      8. 7.3.8 TCRIT1, TCRIT2, and TCRIT3 Outputs
      9. 7.3.9 TCRIT Limits and TCRIT Outputs
    4. 7.4 Device Functional Modes
      1. 7.4.1 Diode Fault Detection
      2. 7.4.2 Communicating With the LM95214
      3. 7.4.3 Serial Interface Reset
      4. 7.4.4 One-Shot Conversion
    5. 7.5 Register Maps
      1. 7.5.1 LM95214 Registers
        1. 7.5.1.1 Value Registers
          1. 7.5.1.1.1 Local Value Registers
          2. 7.5.1.1.2 Remote Temperature Value Registers With Signed Format
          3. 7.5.1.1.3 Remote Temperature Value Registers With Unsigned Format
        2. 7.5.1.2 Diode Configuration Register
          1. 7.5.1.2.1 Remote 1-4 Offset
        3. 7.5.1.3 Configuration Registers
          1. 7.5.1.3.1 Main Configuration Register
          2. 7.5.1.3.2 Conversion Rate Register
          3. 7.5.1.3.3 Channel Conversion Enable
          4. 7.5.1.3.4 Filter Setting
          5. 7.5.1.3.5 1-Shot
        4. 7.5.1.4 Status Registers
          1. 7.5.1.4.1 Common Status Register
          2. 7.5.1.4.2 Status 1 Register (Diode Fault)
          3. 7.5.1.4.3 Status 2 (TCRIT1)
          4. 7.5.1.4.4 Status 3 (TCRIT2)
          5. 7.5.1.4.5 Status 4 (TCRIT3)
        5. 7.5.1.5 Mask Registers
          1. 7.5.1.5.1 TCRIT1 Mask Register
          2. 7.5.1.5.2 TCRIT2 Mask Registers
          3. 7.5.1.5.3 TCRIT3 Mask Register
        6. 7.5.1.6 Limit Registers
          1. 7.5.1.6.1 Local Limit Register
          2. 7.5.1.6.2 Remote Limit Registers
          3. 7.5.1.6.3 Common Tcrit Hysteresis Register
        7. 7.5.1.7 Identification Registers
  8. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
    3. 8.3 Diode Non-Ideality
      1. 8.3.1 Diode Non-Ideality Factor Effect on Accuracy
      2. 8.3.2 Calculating Total System Accuracy
      3. 8.3.3 Compensating for Different Non-Ideality
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Community Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

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11 Device and Documentation Support

11.1 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

11.2 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

11.3 Trademarks

E2E is a trademark of Texas Instruments.

All other trademarks are the property of their respective owners.

11.4 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

11.5 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.