ZHCSDV6E May 2009 – July 2015 LM57
PRODUCTION DATA.
NOTE
Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality.
The LM57 has several outputs allowing for varying system implementations.
The LM57 has an analog temperature sensor output (VTEMP) that can be directly connected to an ADC (Analog to Digital Converter) input. Most CMOS ADCs found in microcontrollers and ASICs have a sampled data comparator input structure. When the ADC charges the sampling cap, it requires instantaneous charge from the output of the analog source such as the LM57 temperature sensor and many op amps. This requirement is easily accommodated by the addition of a capacitor (CFILTER). The size of CFILTER depends on the size of the sampling capacitor and the sampling frequency. Because not all ADCs have identical input stages, the charge requirements will vary. The general ADC application shown in Figure 20 is an example only.
Figure 20. Suggested Connection to a Sampling Analog-to-Digital Converter Input Stage
Figure 21. Typical Application Schematic with Microcontroller TRIP TEST Control
By simply selecting the value of two resistors the trip point of the LM57 can easily be programmed as described in the following section. If standard 1% values are used the actual trip point threshold is not degraded and stands as described in the Electrical Characteristics section ().
To set the trip point:
The typical performance of the LM57 temperature sensor output can be seen in Figure 22. Figure 23 shows the output behavior of the LM57 TOVER output.
Figure 22. J2 VTEMP Accuracy Characteristics

The circuit in Figure 24 shows the TRIP TEST pin grounded. This allows the LM57 to function autonomously without microcontroller intervention. In all other respects this circuit functions similarly to the circuit shown in Figure 21.
Figure 24. Typical Application Schematic without Microcontroller TRIP TEST Control