ZHCSIT3C February   2012  – September 2018 DS90C187

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     Device Images
      1.      典型应用
      2.      典型应用
  4. 4 修订历史记录
  5. 5 （说明 （续））
  6. 6 Pin Configuration and Functions
    1.     DS90C187 Pin Descriptions — Serializer
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Recommended Input Characteristics
    7. 7.7 Switching Characteristics
    8. 7.8 AC Timing Diagrams
    9. 7.9 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagrams
    3. 8.3 Device Functional Modes
      1. 8.3.1  Device Configuration
      2. 8.3.2  Single Pixel Input / Single Pixel Output
      3. 8.3.3  Single Pixel Input / Dual Pixel Output
      4. 8.3.4  Dual Pixel Input / Dual Pixel Output
      5. 8.3.5  Pixel Clock Edge Select (RFB)
      6. 8.3.6  Power Management
      7. 8.3.7  Sleep Mode (PDB)
      8. 8.3.8  LVDS Outputs
      9. 8.3.9  18 bit / 24 bit Color Mode (18B)
      10. 8.3.10 LVCMOS Inputs
    4. 8.4 Programming
      1. 8.4.1 LVDS Interface / TFT Color Data Recommended Mapping
        1. 8.4.1.1 Color Mapping Information
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 LVDS Interconnect Guidelines
      3. 9.2.3 Application Curves
  10. 10Power Supply Recommendations
    1. 10.1 Power Up Sequence
    2. 10.2 Power Supply Filtering
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 文档支持
      1. 12.1.1 相关文档
    2. 12.2 接收文档更新通知
    3. 12.3 社区资源
    4. 12.4 商标
    5. 12.5 静电放电警告
    6. 12.6 术语表
  13. 13机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

7.8 AC Timing Diagrams

DS90C187 30151675.gif
A. The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and LVCMOS/ I/O.
B. Figure 1 and Figure 2 show a falling edge data strobe (IN_CLK).
Figure 1. Checker Board Test Pattern
DS90C187 30151674.gif
A. The worst case test pattern produces a maximum toggling of digital circuits, LVDS I/O and LVCMOS/ I/O.
B. Recommended pin to signal mapping for 18 bits per pixel, customer may choose to define differently. The 16 grayscale test pattern tests device power consumption for a “typical” LCD display pattern. The test pattern approximates signal switching needed to produce groups of 16 vertical stripes across the display.
C. Figure 2 shows a falling edge data strobe (IN_CLK).
Figure 2. “16 Gray Scale” Test Pattern (Falling Edge Clock shown)
DS90C187 30151697.gifFigure 3. DS90C187 (Transmitter) LVDS Output Load
DS90C187 30151671.gifFigure 4. LVDS Output Transition Times
DS90C187 30151672.gifFigure 5. LVCMOS Input Transition Times
DS90C187 30151670.gifFigure 6. LVCMOS Input Setup/Hold and Clock High/Low Times (Falling Edge Strobe)
DS90C187 Start_Up.gifFigure 7. Start Up / Phase Lock Loop Set Time
DS90C187 30151682.gifFigure 8. Sleep Mode / Power Down Delay
DS90C187 30151673.gifFigure 9. LVDS Serial Bit Positions
DS90C187 30151680.gifFigure 10. Single In Dual Out Mode Timing and Latency
DS90C187 30151698.gifFigure 11. Single In Single Out / Dual In Dual Out Latency