SLAS429E April   2005  – June 2017 DAC8551

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Characteristics
    7. 6.7 Typical Characteristics
      1. 6.7.1 VDD = 5 V
      2. 6.7.2 VDD = 2.7 V
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 DAC Section
        1. 7.3.1.1 Resistor String
        2. 7.3.1.2 Output Amplifier
      2. 7.3.2 Power-On Reset
    4. 7.4 Device Functional Modes
      1. 7.4.1 Power-Down Modes
    5. 7.5 Programming
      1. 7.5.1 Serial Interface
      2. 7.5.2 Input Shift Register
      3. 7.5.3 SYNC Interrupt
  8. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Bipolar Operation Using the DAC8551
    2. 8.2 Typical Application
      1. 8.2.1 Loop-Powered, 2-Wire, 4-mA to 20-mA Transmitter With XTR116
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Using the REF02 as a Power Supply for the DAC8551
        1. 8.2.2.1 Design Requirements
        2. 8.2.2.2 Detailed Design Procedure
    3. 8.3 System Examples
      1. 8.3.1 Microprocessor Interfacing
        1. 8.3.1.1 DAC8551 to 8051 Interface
        2. 8.3.1.2 DAC8551 to Microwire Interface
        3. 8.3.1.3 DAC8551 to 68HC11 Interface
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Receiving Notification of Documentation Updates
    3. 11.3 Community Resources
    4. 11.4 Trademarks
    5. 11.5 Electrostatic Discharge Caution
    6. 11.6 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Revision History

Changes from D Revision (February 2017) to E Revision

  • Changed the VIL Test Conditions From: VDD = 5 V To: 3 V ≤ VDD ≤ 5.5 V and From: VDD = 3 V To: 2.7 V ≤ VDD < 3 V in the Electrical CharacteristicsGo
  • Changed the VIH Test Conditions From: VDD = 5 V To: 3 V ≤ VDD ≤ 5.5 V and From: VDD = 3 V To: 2.7 V ≤ VDD < 3 V in the Electrical CharacteristicsGo

Changes from C Revision (March 2016) to D Revision

  • Relative accuracy DAC8551, Deleted the TYP value of ± 3, Changed the MAX value From: ±8 To: ±12 in the Electrical Characteristics Go
  • Relative accuracy DAC8551A, Deleted the TYP value of ± 3, Changed the MAX value From: ±8 To: ±16 in the Electrical Characteristics Go
  • Changed Differential nonlinearity Test Conditions From: 16-bit monotonic To: three separate entries in the Electrical Characteristics Go
  • Changed Input LOW voltage 5 V MAX value From: 0.8 To: 0.3 X VDD in the Electrical Characteristics Go
  • Changed Input LOW voltage 3 V MAX value From: 0.6 To: 0.1 X VDD in the Electrical Characteristics Go
  • Changed Input HIGH voltage 5 V MIN value From: 2.4 To:0.7 X VDD in the Electrical Characteristics Go
  • Changed Input HIGH voltage 3 V MIN value From: 2.1 To:0.9 X VDD in the Electrical Characteristics Go

Changes from B Revision (October 2006) to C Revision

  • Removed Packaging/Ordering Information tableGo
  • Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section.Go