ZHCSPQ4E January   1998  – October 2022 CD54HC540 , CD54HC541 , CD54HCT541 , CD74HC540 , CD74HC541 , CD74HCT540 , CD74HCT541

PRODUCTION DATA  

  1. 1 特性
  2. 2 说明
  3. 3 Revision History
  4. 4 Pin Configuration and Functions
  5. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Recommended Operating Conditions
    3. 5.3 Thermal Information
    4. 5.4 Electrical Characteristics
    5. 5.5 Switching Characteristics
  6. 6 Parameter Measurement Information
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Functional Modes
  8. 8 Power Supply Recommendations
  9. 9 Layout
    1. 9.1 Layout Guidelines
  10. 10Device and Documentation Support
    1. 10.1 接收文档更新通知
    2. 10.2 支持资源
    3. 10.3 Trademarks
    4. 10.4 Electrostatic Discharge Caution
    5. 10.5 术语表
  11. 11Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • N|20
  • DW|20
散热焊盘机械数据 (封装 | 引脚)
订购信息

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VCC Supply voltage –0.5 7 V
IIK Input diode current For VI < –0.5 V or VI > VCC + 0.5 V ±20 mA
IOK Output diode current For VO < –0.5 V or VO > VCC + 0.5 V ±20 mA
IO Drain current, per output For –0.5 V < VO < VCC + 0.5 V ±35 mA
IO Output source or sink current per output pin For VO > –0.5 V or VO < VCC + 0.5 V ±25 mA
Continuous current through VCC or ground current ±50 mA
TJ Junction temperature 150 °C
Tstg Storage temperature range – 65 150 °C
Lead temperature (Soldering 10s) (SOIC - Lead Tips Only) 300 °C
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute maximum ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If briefly operating outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not sustain damage, but it may not be fully functional. Operating the device in this manner may affect device reliability, functionality, performance, and shorten the device lifetime.