ZHCSOL7A March   2022  – August 2022 ADS131M04-Q1

PRODUCTION DATA  

  1. 1 特性
  2. 2 应用
  3. 3 说明
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Switching Characteristics
    8. 6.8 Timing Diagrams
    9. 6.9 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 Noise Measurements
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Input ESD Protection Circuitry
      2. 8.3.2  Input Multiplexer
      3. 8.3.3  Programmable Gain Amplifier (PGA)
      4. 8.3.4  Voltage Reference
      5. 8.3.5  Clocking and Power Modes
      6. 8.3.6  ΔΣ Modulator
      7. 8.3.7  Digital Filter
        1. 8.3.7.1 Digital Filter Implementation
          1. 8.3.7.1.1 Fast-Settling Filter
          2. 8.3.7.1.2 SINC3 and SINC3 + SINC1 Filter
        2. 8.3.7.2 Digital Filter Characteristic
      8. 8.3.8  DC Block Filter
      9. 8.3.9  Internal Test Signals
      10. 8.3.10 Channel Phase Calibration
      11. 8.3.11 Calibration Registers
      12. 8.3.12 Communication Cyclic Redundancy Check (CRC)
      13. 8.3.13 Register Map CRC
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power-Up and Reset
        1. 8.4.1.1 Power-On Reset
        2. 8.4.1.2 SYNC/RESET Pin
        3. 8.4.1.3 RESET Command
      2. 8.4.2 Fast Start-Up Behavior
      3. 8.4.3 Conversion Modes
        1. 8.4.3.1 Continuous-Conversion Mode
        2. 8.4.3.2 Global-Chop Mode
      4. 8.4.4 Power Modes
      5. 8.4.5 Standby Mode
      6. 8.4.6 Current-Detect Mode
    5. 8.5 Programming
      1. 8.5.1 Interface
        1. 8.5.1.1  Chip Select (CS)
        2. 8.5.1.2  Serial Data Clock (SCLK)
        3. 8.5.1.3  Serial Data Input (DIN)
        4. 8.5.1.4  Serial Data Output (DOUT)
        5. 8.5.1.5  Data Ready (DRDY)
        6. 8.5.1.6  Conversion Synchronization or System Reset (SYNC/RESET)
        7. 8.5.1.7  SPI Communication Frames
        8. 8.5.1.8  SPI Communication Words
        9. 8.5.1.9  ADC Conversion Data
          1. 8.5.1.9.1 Collecting Data for the First Time or After a Pause in Data Collection
        10. 8.5.1.10 Commands
          1. 8.5.1.10.1 NULL (0000 0000 0000 0000)
          2. 8.5.1.10.2 RESET (0000 0000 0001 0001)
          3. 8.5.1.10.3 STANDBY (0000 0000 0010 0010)
          4. 8.5.1.10.4 WAKEUP (0000 0000 0011 0011)
          5. 8.5.1.10.5 LOCK (0000 0101 0101 0101)
          6. 8.5.1.10.6 UNLOCK (0000 0110 0101 0101)
          7. 8.5.1.10.7 RREG (101a aaaa annn nnnn)
            1. 8.5.1.10.7.1 Reading a Single Register
            2. 8.5.1.10.7.2 Reading Multiple Registers
          8. 8.5.1.10.8 WREG (011a aaaa annn nnnn)
        11. 8.5.1.11 Short SPI Frames
      2. 8.5.2 Synchronization
    6. 8.6 ADS131M04-Q1 Registers
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Unused Inputs and Outputs
      2. 9.1.2 Antialiasing
      3. 9.1.3 Minimum Interface Connections
      4. 9.1.4 Multiple Device Configuration
      5. 9.1.5 Troubleshooting
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Current Shunt Measurement
        2. 9.2.2.2 Battery Pack Voltage Measurement
      3. 9.2.3 Application Curve
    3. 9.3 Power Supply Recommendations
      1. 9.3.1 CAP Pin Behavior
      2. 9.3.2 Power-Supply Sequencing
      3. 9.3.3 Power-Supply Decoupling
    4. 9.4 Layout
      1. 9.4.1 Layout Guidelines
      2. 9.4.2 Layout Example
  10. 10Device and Documentation Support
    1. 10.1 Documentation Support
      1. 10.1.1 Related Documentation
    2. 10.2 接收文档更新通知
    3. 10.3 支持资源
    4. 10.4 Trademarks
    5. 10.5 Electrostatic Discharge Caution
    6. 10.6 术语表
  11. 11Mechanical, Packaging, and Orderable Information

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8.3.9 Internal Test Signals

The ADS131M04-Q1 features an internal analog test signal that is useful for troubleshooting and diagnosis. A positive or negative DC test signal can be applied to the channel inputs through the input multiplexer. The multiplexer is controlled through the MUXn[1:0] bits in the CHn_CFG register. The test signals are created by internally dividing the internal reference voltage. The same signal is shared by all channels.

The test signal is nominally 2 / 15 × VREF. The test signal automatically adjusts the voltage level with the gain setting such that the ADC always measures a signal that is 2 / 15 × VDiff Max. For example, at a gain of 1, this voltage equates to 160 mV. At a gain of 2, this voltage is 80 mV.