SNOSBI1C November   2009  – June 2015

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Operating Ratings
    6. 6.6 Electrical Characteristics
    7. 6.7 AC Electrical Characteristics
    8. 6.8 Typical Characteristics
  7. 7 Parameter Measurement Information
    1. 7.1 Tri-State Test Circuits and Waveforms
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Understanding ADC Error Specs
      2. 8.3.2 Digital Control Inputs
    4. 8.4 Device Functional Modes
      1. 8.4.1 Analog Input Modes
        1. 8.4.1.1 Normal Mode
        2. 8.4.1.2 Fault Mode
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Testing the ADC Converter
      2. 9.1.2 Microprocessor Interfacing
        1. 9.1.2.1 Interfacing 8080 Microprocessor Derivatives (8048, 8085)
        2. 9.1.2.2 Sample 8080A CPU Interfacing Circuitry and Program
        3. 9.1.2.3 INS8048 Interface
        4. 9.1.2.4 Interfacing the Z-80
        5. 9.1.2.5 Interfacing 6800 Microprocessor Derivatives (6502, etc.)
    2. 9.2 Typical Applications
      1. 9.2.1 8080 Interface
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Analog Differential Voltage Inputs and Common-Mode Rejection
          2. 9.2.1.2.2 Analog Inputs — Input Current
            1. 9.2.1.2.2.1 Input Bypass Capacitors
            2. 9.2.1.2.2.2 Input Source Resistance
            3. 9.2.1.2.2.3 Noise
          3. 9.2.1.2.3 Reference Voltage
            1. 9.2.1.2.3.1 Span Adjust
            2. 9.2.1.2.3.2 Reference Accuracy Requirements
          4. 9.2.1.2.4 Errors and Reference Voltage Adjustments
            1. 9.2.1.2.4.1 Zero Error
            2. 9.2.1.2.4.2 Full-Scale
            3. 9.2.1.2.4.3 Adjusting for an Arbitrary Analog Input Voltage Range
          5. 9.2.1.2.5 Clocking Option
          6. 9.2.1.2.6 Restart During a Conversion
          7. 9.2.1.2.7 Continuous Conversions
          8. 9.2.1.2.8 Driving the Data Bus
          9. 9.2.1.2.9 Wiring and Hook-Up Precautions
      2. 9.2.2 Multiple ADC0801 Series to MC6800 CPU Interface
      3. 9.2.3 Auto-Zeroed Differential Transducer Amplifier and ADC Converter
      4. 9.2.4 Multiple ADC Converters in a Z-80 Interrupt Driven Mode
    3. 9.3 System Examples
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
  12. 12Device and Documentation Support
    1. 12.1 Related Links
    2. 12.2 Community Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

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7 Parameter Measurement Information

7.1 Tri-State Test Circuits and Waveforms

ADC0801 ADC0802 ADC0803 ADC0804 ADC0805 00567147.gif
CL = 10 pF
Figure 12. RD to Data Output Falling Edge Test Load Condition
ADC0801 ADC0802 ADC0803 ADC0804 ADC0805 00567149.gif
CL = 10 pF
Figure 14. RD to Data Output Rising Edge Test Load Condition
ADC0801 ADC0802 ADC0803 ADC0804 ADC0805 00567148.gif
Figure 13. RD to Data Output Falling Edge Test Timing
ADC0801 ADC0802 ADC0803 ADC0804 ADC0805 00567150.gif
Figure 15. RD to Data Output Rising Edge Test Timing