SLVK158 November   2023 TPS7H6003-SP

PRODUCTION DATA  

  1.   1
  2.   TPS7H6003-SP Single-Event Effects (SEE)
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

7.1 Single-Event Latch-up (SEL) Results

During the SEL testing the device was heated to 125°C by using a Closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W)). The temperature of the die was verified using thermal camera prior to exposure to heavy ions.

The species used for the SEL testing was Homium (165Ho at 15 MeV / nucleon). For the 165Ho ion an angle of incedence of 0° was used to achieve an LETEFF = 75 MeV × cm2 / mg (for more details, see Ion LETEFF, Depth, and Range in SiliconIon LETEFF, Depth, and Range in SiliconIon LETEFF, Depth, and Range in Silicon). The kinetic energy in the vacuum for this ions is 2.474 GeV. Flux of approximately 105 ions / cm2× s and a fluence of approximately 107 ions / cm2 per run was used. Run duration to achieve this fluence was approximately two minutes. The four devices were powered up and exposed to the heavy-ions using the maximum recommended input voltage and boot voltage of 14 V. The ASW (High-Side Driver Signal Return) was set to 150-V with respect to AGND (low-side driver signal return). The device was set in both PWM and IIM modes during testing, for more information please refer back to the Single-Event Effects section. No SEL events were observed during all nine runs, indicating that the TPS7H6003-SP is SEL-free up to 75 MeV·cm2 / mg. Table 8-4 shows the SEL test conditions and results. Figure 8-14 shows a plot of the current versus time for run # 1.

Table 7-1 Summary of TPS7H6003-SP SEL Test Condition and Results
Run Number Unit Number Ion LETEFF (MeV × cm2 / mg) Flux (ions × cm2 / mg) Fluence (Number of ions) VIN VBOOT Mode EN/HI PWM/LI SEL (# Events)
1 1 165Ho 75 6.22 × 104 1.00 × 107 14 14 PWM 14 VDC 14 Vpk-pk 500 kHz 0
2 1 165Ho 75 6.26 × 105 9.99 × 106 14 14 PWM 14 VDC 14 Vpk-pk 1 MHz 0
3 1 165Ho 75 6.19 × 104 9.99 × 106 14 14 PWM 14 VDC 14 Vpk-pk 2 MHz 0
4 2 165Ho 75 6.23 × 104 1.00 x 107 14 14 IIMENST 14 VDC 0 V 0
5 2 165Ho 75 5.79 × 104 1.00 × 107 14 14 IIMENST 0 V 14 VDC 0
6 3 165Ho 75 7.46 × 104 1.00 × 107 14 14 IIMENSW 14 Vpk-pk 500 kHz 14 Vpk-pk 500 kHz 0
7 3 165Ho 75 6.88 × 104 1.00 × 107 14 14 IIMDISSW 14 Vpk-pk 500 kHz 14 Vpk-pk 500 kHz 0
8 4 165Ho 75 5.64 × 104 1.00 × 107 14 14 IIMDISST 14 VDC 0 V 0
9 4 165Ho 75 5.78 × 104 1.00 × 107 14 14 IIMDISST 0 V 14 VDC 0
Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations and combining (or summing) the fluences of the four runs at 125°C (4 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σ S E L ≤   4.11   x   10 - 8   c m 2 / d e v i c e   f o r   L E T E F F   =   75   M e V · c m 2 / m g   a n d   T   =   125 ° C

GUID-20230922-SS0I-KLRZ-FM8C-S6HZ5SDHR74G-low.svg Figure 7-1 SEL Run #1 (PWM Mode, fsw = 500 kHz)
GUID-20230922-SS0I-CVSH-XGNR-CZH0PWXR5SGH-low.svg Figure 7-2 SEL Run #2 (PWM Mode, fsw = 1 MHz)
GUID-20230922-SS0I-J5QW-NDFD-GN6NCPFN2L9L-low.svg Figure 7-3 SEL Run #3 (PWM Mode, fsw = 2 MHz)
GUID-20230922-SS0I-H71S-7LLS-PJZ6T86MG8ZF-low.svg Figure 7-4 SEL Run #4 (IIM Enabled Mode, PWM/LI = 14 V)
GUID-20230922-SS0I-SL67-5RLX-MBK3R4K0SBFH-low.svg Figure 7-5 SEL Run #9 (IIM Disabled Mode, EN/HI = 14 V)