SGLS148E December   2002  – December 2015 ULQ2003A-Q1 , ULQ2004A-Q1

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics, ULQ2003AT and ULQ2003AQ
    6. 6.6 Electrical Characteristics, ULQ2004AT
    7. 6.7 Switching Characteristics, ULQ2003A and ULQ2004A
    8. 6.8 Dissipation Ratings
    9. 6.9 Typical Characteristics
  7. 7 Parameter Measurement Information
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
    4. 8.4 Device Functional Modes
      1. 8.4.1 Inductive Load Drive
      2. 8.4.2 Resistive Load Drive
  9. 9 Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Drive Current
        2. 9.2.2.2 Low-Level Output Voltage
        3. 9.2.2.3 Power Dissipation and Temperature
      3. 9.2.3 Application Curve
    3. 9.3 System Examples
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Related Links
    2. 12.2 Community Resources
    3. 12.3 Trademarks
    4. 12.4 Electrostatic Discharge Caution
    5. 12.5 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • PW|16
  • D|16
散热焊盘机械数据 (封装 | 引脚)
订购信息

7 Parameter Measurement Information

ULQ2003A-Q1 ULQ2004A-Q1 pmi1_gls148.gif Figure 3. ICEX Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi2_gls148.gif Figure 4. ICEX Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi3_gls148.gif Figure 5. II(off) Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi4_gls148.gif Figure 6. II Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi7_gls148.gif Figure 7. IR Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi8_gls148.gif Figure 8. VF Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi5_gls148.gif
A. II is fixed for measuring VCE(sat), variable for measuring hFE.
Figure 9. hFE, VCE(sat) Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi6_gls148.gif Figure 10. VI(on) Test Circuit
ULQ2003A-Q1 ULQ2004A-Q1 pmi9_gls148.gif Figure 11. Propagation Delay-Time Waveforms
ULQ2003A-Q1 ULQ2004A-Q1 pmi10_gls148.gif
A. The pulse generator has the following characteristics: PRR = 12.5 kHz, ZO = 50 Ω.
B. CL includes probe and jig capacitance.
C. For testing the ULQ2003A, VIH = 3 V; for the ULQ2004A, VIH = 8 V.
Figure 12. Latch-Up Test Circuit and Voltage Waveforms