ZHCSTF0B
February 2019 – October 2023
TUSB2E22
PRODUCTION DATA
1
1
特性
2
应用
3
说明
4
Revision History
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Electrical Characteristics
6.6
Switching Characteristics
6.7
Timing Requirements
7
Parametric Measurement Information
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
USB 2.0
8.3.2
eUSB2
8.3.3
Cross MUX
8.4
Device Functional Modes
8.4.1
Repeater Mode
8.4.2
Power Down Mode
8.4.3
CROSS
9
Applications and Implementation
9.1
Application Information
9.2
Typical Dual Port System Implementation
9.2.1
Design Requirements
9.2.2
Detailed Design Procedure
9.2.3
Application Curve
9.3
Power Supply Recommendations
9.3.1
Power Up Reset
9.4
Layout
9.4.1
Layout Guidelines
9.4.2
Example YCG Layout For Application With No Cross MUX Function.
9.4.3
Example RZA Layout For Application With No Cross MUX Function
10
Device and Documentation Support
10.1
Documentation Support
10.1.1
Related Documentation
10.2
接收文档更新通知
10.3
支持资源
10.4
Trademarks
10.5
静电放电警告
10.6
术语表
11
Mechanical, Packaging, and Orderable Information
封装选项
机械数据 (封装 | 引脚)
RZA|20
MPQF656
YCG|25
MXBG410
散热焊盘机械数据 (封装 | 引脚)
订购信息
zhcstf0b_oa
10.5
静电放电警告
静电放电 (ESD) 会损坏这个集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理和安装程序,可能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级,大至整个器件故障。精密的集成电路可能更容易受到损坏,这是因为非常细微的参数更改都可能会导致器件与其发布的规格不相符。