2 修订历史记录
Changes from February 12, 2009 to May 23, 2018
- 通篇更改了文档的格式和组织结构Go
- 添加了Section 1.2应用Go
- Added Section 3, Device ComparisonGo
- Added Section 5.2, ESD RatingsGo
- Removed note (2) with duplicate information from the fLFXT1 parameter in Section 5.3, Recommended Operating ConditionsGo
- Removed duplicate conditions "XTS = 0, SELM = 0 or 1" from the second row of Test Conditions on the I(AM) parameter in Section 5.4, Supply Current Into AVCC and DVCC Excluding External CurrentGo
- Added Section 5.5, Thermal Resistance CharacteristicsGo
- Removed ADC12DIV from the equation in the TYP value of the tCONVERT parameter (because ADC12CLK is after division) in Section 5.26, 12-Bit ADC, Timing ParametersGo
- Changed all instances of bootstrap loader to bootloader throughout documentGo
- 添加了Section 7器件和文档支持Go