ZHCSHC4H August   1999  – December 2017 LM35

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     Device Images
      1.      基本摄氏温度传感器 （2°C 至 150°C）
      2.      全范围摄氏温度传感器
  4. 4 修订历史记录
  5. 5 Pin Configuration and Functions
    1.     Pin Functions
  6. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics: LM35A, LM35CA Limits
    6. 6.6 Electrical Characteristics: LM35A, LM35CA
    7. 6.7 Electrical Characteristics: LM35, LM35C, LM35D Limits
    8. 6.8 Electrical Characteristics: LM35, LM35C, LM35D
    9. 6.9 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 LM35 Transfer Function
    4. 7.4 Device Functional Modes
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Capacitive Drive Capability
    2. 8.2 Typical Application
      1. 8.2.1 Basic Centigrade Temperature Sensor
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
    3. 8.3 System Examples
  9. 9 Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11器件和文档支持
    1. 11.1 接收文档更新通知
    2. 11.2 社区资源
    3. 11.3 商标
    4. 11.4 静电放电警告
    5. 11.5 Glossary
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

6.6 Electrical Characteristics: LM35A, LM35CA

Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14.
PARAMETER TEST CONDITIONS LM35A LM35CA UNIT
MIN TYP MAX TYP TYP MAX
Accuracy(4) TA = 25°C ±0.2 ±0.2 °C
Tested Limit(2) ±0.5 ±0.5
Design Limit(3)
TA = –10°C ±0.3 ±0.3
Tested Limit(2)
Design Limit(3) ±1
TA = TMAX ±0.4 ±0.4
Tested Limit(2) ±1 ±1
Design Limit(3)
TA = TMIN ±0.4 ±0.4
Tested Limit(2) ±1
Design Limit(3) ±1.5
Nonlinearity(5) TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.18 ±0.15 °C
Tested Limit(2)
Design Limit(3) ±0.35 ±0.3
Sensor gain
(average slope)		 TMIN ≤ TA ≤ TMAX 10 10 mV/°C
Tested Limit(2) 9.9
Design Limit(3) 9.9
–40°C ≤ TJ ≤ 125°C 10 10
Tested Limit(2) 10.1
Design Limit(3) 10.1
Load regulation(1)
0 ≤ IL ≤ 1 mA		 TA = 25°C ±0.4 ±0.4 mV/mA
Tested Limit(2) ±1 ±1
Design Limit(3)
TMIN ≤ TA ≤ TMAX,
–40°C ≤ TJ ≤ 125°C		 ±0.5 ±0.5
Tested Limit(2)
Design Limit(3) ±3 ±3
Line regulation(1) TA = 25°C ±0.01 ±0.01 mV/V
Tested Limit(2) ±0.05 ±0.05
Design Limit(3)
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 ±0.02 ±0.02
Tested Limit(2)
Design Limit(3) ±0.1 ±0.1
Quiescent current(6) VS = 5 V, 25°C 56 56 µA
Tested Limit(2) 67 67
Design Limit(3)
VS = 5 V,
–40°C ≤ TJ ≤ 125°C		 105 91
Tested Limit(2)
Design Limit(3) 131 114
VS = 30 V, 25°C 56.2 56.2
Tested Limit(2) 68 68
Design Limit(3)
VS = 30 V,
–40°C ≤ TJ ≤ 125°C		 105.5 91.5
Tested Limit(2)
Design Limit(3) 133 116
Change of quiescent current(1) 4 V ≤ VS ≤ 30 V, 25°C 0.2 0.2 µA
Tested Limit(2) 1 1
Design Limit(3)
4 V ≤ VS ≤ 30 V,
–40°C ≤ TJ ≤ 125°C		 0.5 0.5
Tested Limit(2)
Design Limit(3) 2 2
Temperature coefficient of quiescent current –40°C ≤ TJ ≤ 125°C 0.39 0.39 µA/°C
Tested Limit(2)
Design Limit(3) 0.5 0.5
Minimum temperature for rate accuracy In circuit of Figure 14, IL = 0 1.5 1.5 °C
Tested Limit(2)
Design Limit(3) 2 2
Long term stability TJ = TMAX, for 1000 hours ±0.08 ±0.08 °C
(1) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance.
(2) Tested Limits are ensured and 100% tested in production.
(3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels.
(4) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C).
(5) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device.
(6) Quiescent current is defined in the circuit of Figure 14.