TLC372-EP
- Controlled baseline
- One assembly/test site, one fabrication site
- Extended temperature performance of –55°C to 125°C
- ESD protection exceeds 2000V per MIL-STD-883, method 3015; exceeds 100V using machine model (C = 200pF, R = 0)
- Single or dual-supply operation
- Wide range of supply voltages . . .4V to 16V
- Very low supply current drain . . .10µA typical
- Fast response time . . . 420ns typical for TTL-level input step
- Built-in ESD protection
- High input impedance . . . 1012Ω typical
- Extremely low input bias current. . .5pA typical
- Ultra-stable low input offset voltage
- Common-mode input voltage range includes ground
- Output compatible with TTL, MOS, and CMOS
- Pin-compatible with LM393
This device is fabricated using CMOS technology and consists of two independent voltage comparators, each designed to operate from a single power supply. Operation from dual supplies is also possible if the difference between the two supplies is 4V to 16V. Each device features extremely high input impedance (typically greater than 1012Ω), allowing direct interfacing with high-impedance sources. The outputs are n-channel open-drain configurations and can be connected to achieve positive-logic wired-AND relationships.
The TLC372 has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000V ESD rating using human-body-model (HBM) testing. However, care must be exercised in handling this device as exposure to ESD can result in a degradation of the device parametric performance.
The TLC372 is characterized for operation from –55°C to 125°C.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | TLC372-EP Dual Differential Comparator datasheet (Rev. A) | PDF | HTML | 2025/6/27 | ||
| * | 輻射及可靠性報告 | TLC372MDREP Reliability Report | 2016/2/2 | |||
| * | VID | TLC372-EP VID V6206675 | 2016/6/21 | |||
| 電子書 | The Signal e-book: A compendium of blog posts on op amp design topics | PDF | HTML | 2017/3/28 |
設計與開發
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AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件，可測試通用運算放大器 (op amp) 參數，並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項，可滿足封裝需求，使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝，包括：
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOIC (D) | 8 | Ultra Librarian |