TLC27L4B
- Input offset voltage drift: typically 0.1µV/month, including the first 30 days
- Wide range of supply voltages over specified
temperature range:
- 0°C to 70°C: 3V to 16V
- –40°C to +85°C: 4V to 16V
- Single-supply operation
- Common-mode input voltage range extends below the negative rail (C-suffix, I-suffix types)
- Ultra-low power: 195µW at 25°C (typica), VDD = 5V
- Output voltage range includes negative rail
- High input impedance: 1012Ω (typical)
- ESD-protection circuitry
- Small-outline package option also available in tape and reel
- Designed-in latch-up immunity
The TLC27L4x and TLC27L9 quad op amps combine a wide range of input offset-voltage grades with low offset-voltage drift, high input impedance, extremely low power, and high gain. The TLC27Lx use TIs silicon-gate LinCMOS™ technology, providing offset-voltage stability far exceeding the stability with conventional metal-gate processes.
Four offset voltage grades are available (C-suffix and I-suffix), ranging from the low-cost TLC27L4 (10mV) to the high-precision TLC27L9 (1000µV). The extremely high input impedance and low bias currents, along with good common-mode rejection and supply-voltage rejection, and low power consumption, make the TLC27Lx a good choice for new state-of-the-art designs and upgrading existing designs.
In general, many features associated with bipolar technology are available in LinCMOS op amps, without the power penalties of bipolar technology. General applications, such as transducer interfacing, analog calculations, amplifier blocks, active filters, and signal buffering, are all easily designed with the TLC27Lx. The devices also exhibit low-voltage, single-supply operation, making the TLC27Lx an excellent choice for remote and inaccessible battery-powered applications. The common-mode input-voltage range includes the negative rail.
The TLC27Lx incorporate internal ESD-protection circuits that prevent functional failures at voltages up to 2000V as tested under MIL-STD-883C, Method 3015.2. Exercise care when handling these devices because exposure to ESD potentially degrades device parametric performance.
C-suffix devices are characterized for operation from 0°C to 70°C. I-suffix devices are characterized for operation from –40°C to +85°C.
技術文件
| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | TLC27Lx Precision, Quad Operational Amplifiers datasheet (Rev. E) | PDF | HTML | 2025/7/31 | ||
| 電子書 | The Signal e-book: A compendium of blog posts on op amp design topics | PDF | HTML | 2017/3/28 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8 和 SOIC-14)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV (SOT23-5 和 SOT23-6)
- DCK (SC70-5 和 SC70-6)
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOIC (D) | 14 | Ultra Librarian |
| PDIP (N) | 14 | Ultra Librarian |