產品詳細資料

Technology family ABT Number of channels 4 IOL (max) (mA) 64 Supply current (max) (µA) 30000 IOH (max) (mA) -32 Input type TTL-Compatible CMOS Output type 3-State Features Over-voltage tolerant inputs, Partial power down (Ioff), Power up 3-state, Ultra high speed (tpd <5ns) Rating Catalog Operating temperature range (°C) -40 to 85
Technology family ABT Number of channels 4 IOL (max) (mA) 64 Supply current (max) (µA) 30000 IOH (max) (mA) -32 Input type TTL-Compatible CMOS Output type 3-State Features Over-voltage tolerant inputs, Partial power down (Ioff), Power up 3-state, Ultra high speed (tpd <5ns) Rating Catalog Operating temperature range (°C) -40 to 85
VQFN (RGY) 14 12.25 mm² (3.5 mm × 3.5 mm) TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm) SOP (NS) 14 79.56 mm² (10.2 mm × 7.8 mm) SSOP (DB) 14 48.36 mm² (6.2 mm × 7.8 mm) SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm) PDIP (N) 14 181.42 mm² (19.3 mm × 9.4 mm)
  • Typical VOLP (Output Ground Bounce)
       <1 V at VCC = 5 V, TA = 25°C
  • High-Drive Outputs (–32-mA IOH, 64-mA IOL)
  • Ioff and Power-Up 3-State Support Hot Insertion
  • Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD-17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)

  • Typical VOLP (Output Ground Bounce)
       <1 V at VCC = 5 V, TA = 25°C
  • High-Drive Outputs (–32-mA IOH, 64-mA IOL)
  • Ioff and Power-Up 3-State Support Hot Insertion
  • Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD-17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)

The ’ABT125 quadruple bus buffer gates feature independent line drivers with 3-state outputs. Each output is disabled when the associated output-enable (OE)\ input is high.

These devices are fully specified for hot-insertion applications using Ioff and power-up 3-state. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down, which prevents driver conflict.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The ’ABT125 quadruple bus buffer gates feature independent line drivers with 3-state outputs. Each output is disabled when the associated output-enable (OE)\ input is high.

These devices are fully specified for hot-insertion applications using Ioff and power-up 3-state. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down, which prevents driver conflict.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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* 資料表 SN54ABT125, SN74ABT125 datasheet (Rev. I) 2002/10/30

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HSPICE Model of SN74ABT125

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SN74ABT125 Behavioral SPICE Model

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SN74ABT125 IBIS Model (Rev. C)

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VQFN (RGY) 14 Ultra Librarian
TSSOP (PW) 14 Ultra Librarian
SOP (NS) 14 Ultra Librarian
SSOP (DB) 14 Ultra Librarian
SOIC (D) 14 Ultra Librarian
PDIP (N) 14 Ultra Librarian

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