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電壓轉換器及電平移位器
電壓轉換器

SN54SC6T07-SEP

現行

Radiation-tolerant, 6 bit, open-drain fixed-direction level translator

立即訂購
產品規格表

SN54SC6T07-SEP

現行
產品規格表 立即訂購

產品詳細資料

Bits (#) 6 Topology Open drain Vin (min) (V) 1.2 Vin (max) (V) 5.5 Applications GPIO Features Balanced outputs, Over-voltage tolerant inputs, Single supply Prop delay (ns) 12.5 Technology family SCxT Supply current (max) (mA) 0.093 Rating Space Operating temperature range (°C) -55 to 125
Bits (#) 6 Topology Open drain Vin (min) (V) 1.2 Vin (max) (V) 5.5 Applications GPIO Features Balanced outputs, Over-voltage tolerant inputs, Single supply Prop delay (ns) 12.5 Technology family SCxT Supply current (max) (mA) 0.093 Rating Space Operating temperature range (°C) -55 to 125
TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm)
  • Vendor item drawing available, VID V62/24617
  • Total ionizing dose characterized at 30 krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Wide operating range of 1.2V to 5.5V
  • Single-supply translating gates at 5/3.3/2.5/1.8/1.2V VCC
    • TTL compatible inputs:
      • Up translation:
        • 1.8-V – Inputs from 1.2V
        • 2.5V – Inputs from 1.8V
        • 3.3V – Inputs from 1.8V, 2.5V
        • 5.0V – Inputs from 2.5V, 3.3V
      • Down translation:

        • 1.2V – Inputs from 1.8V, 2.5V, 3.3V, 5.0V

        • 1.8-V – Inputs from 2.5V, 3.3V, 5.0V
        • 2.5V – Inputs from 3.3V, 5.0V
        • 3.3V – Inputs from 5.0V
  • 5.5V tolerant input pins
  • Output drive up to 25mA AT 5V
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Product traceability
    • Meets NASAs ASTM E595 outgassing specification
  • Vendor item drawing available, VID V62/24617
  • Total ionizing dose characterized at 30 krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Wide operating range of 1.2V to 5.5V
  • Single-supply translating gates at 5/3.3/2.5/1.8/1.2V VCC
    • TTL compatible inputs:
      • Up translation:
        • 1.8-V – Inputs from 1.2V
        • 2.5V – Inputs from 1.8V
        • 3.3V – Inputs from 1.8V, 2.5V
        • 5.0V – Inputs from 2.5V, 3.3V
      • Down translation:

        • 1.2V – Inputs from 1.8V, 2.5V, 3.3V, 5.0V

        • 1.8-V – Inputs from 2.5V, 3.3V, 5.0V
        • 2.5V – Inputs from 3.3V, 5.0V
        • 3.3V – Inputs from 5.0V
  • 5.5V tolerant input pins
  • Output drive up to 25mA AT 5V
  • Latch-up performance exceeds 250mA per JESD 17
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Product traceability
    • Meets NASAs ASTM E595 outgassing specification

The SN54SC6T07-SEP device contains six independent buffers with open-drain outputs and extended voltage operation to allow for level translation. Each buffer performs the Boolean function Y = A in positive logic. The output level is referenced to the supply voltage (VCC) and supports 1.2V, 1.8-V, 2.5V, 3.3V, and 5V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2V input to 1.8V output or 1.8V input to 3.3V output). Additionally, the 5V tolerant input pins enable down translation (for example 3.3V to 2.5V output).

The SN54SC6T07-SEP device contains six independent buffers with open-drain outputs and extended voltage operation to allow for level translation. Each buffer performs the Boolean function Y = A in positive logic. The output level is referenced to the supply voltage (VCC) and supports 1.2V, 1.8-V, 2.5V, 3.3V, and 5V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example 1.2V input to 1.8V output or 1.8V input to 3.3V output). Additionally, the 5V tolerant input pins enable down translation (for example 3.3V to 2.5V output).
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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 SN54SC6T07-SEP Radiation Tolerant, Hex Open-Drain Buffers with Integrated Translation datasheet PDF | HTML 2024/1/19
* 輻射及可靠性報告 SN54SC6T07-SEP Production Flow and Reliability Report PDF | HTML 2024/4/10
* 輻射及可靠性報告 SN54SC6T07-SEP Single Event Effects Radiation Report PDF | HTML 2024/2/21
* 輻射及可靠性報告 SN54SC6T07-SEP Total Ionizing Dose (TID) Report PDF | HTML 2024/2/8
應用說明 Schematic Checklist - A Guide to Designing With Fixed or Direction Control Translators PDF | HTML 2024/10/2
Application brief TI Space Enhanced Plastic Logic Overview and Applications in Low-Earth Orbit Satellite Platforms PDF | HTML 2024/9/10
應用說明 Schematic Checklist - A Guide to Designing with Auto-Bidirectional Translators PDF | HTML 2024/7/12
應用說明 Understanding Transient Drive Strength vs. DC Drive Strength in Level-Shifters (Rev. A) PDF | HTML 2024/7/3

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