SN54SC1G08-SEP
- VID V62/26601
- Radiation - total ionizing dose
(TID):
- TID characterized up to 50krad(Si)
- TID performance assurance up to 30krad(Si)
- Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30krad(Si)
- Radiation - single-event effects
(SEE):
- Single event latch-up (SEL) immune up to 50MeV-cm2/mg at 125°C
- Single event transient (SET) characterized up to LET = 50MeV-cm2/mg
-
Wide operating range from 1.2V to 5.5V
- 5.5V tolerant input pins
- Supports standard pinouts
- Up to 150Mbps with 5V or 3.3V VCC
- Latch-up performance exceeds 100mA per JESD 78
- Space enhanced plastic:
- Supports Defense and Aerospace Applications
- Controlled baseline
- Au bond-wire and NiPdAu lead finish
- Meets NASA ASTM E595 out gassing specification
- One fabrication, assembly, and test site
- Extended product life cycle
- Product traceability
The SN54SC1G08-SEP device is a single 2-input positive-AND gate. This device performs the Boolean function Y = A • B or Y = Ā + B̅ in positive logic.
技術文件
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| 重要文件 | 類型 | 標題 | 格式選項 | 下載最新的英文版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 資料表 | SN54SC1G08-SEP Radiation Tolerant Single 2-Input Positive-AND Gate datasheet | PDF | HTML | 2026/5/4 | ||
| * | 輻射及可靠性報告 | SN54SC1G08-SEP Total Ionizing Dose (TID) Report | 2026/4/30 | |||
| * | 輻射及可靠性報告 | SN54SC1G08-SEP Production Flow and Reliability Report | PDF | HTML | 2026/4/1 | ||
| * | 輻射及可靠性報告 | SN54SC1G08-SEP Single-Event Effects (SEE) Radiation Report | PDF | HTML | 2025/4/30 |
設計與開發
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開發板
5-8-LOGIC-EVM — 適用於 5 針腳至 8 針腳 DCK、DCT、DCU、DRL 和 DBV 封裝的通用邏輯評估模組
靈活的 EVM 旨在支援任何針腳數為 5 至 8 支且採用 DCK、DCT、DCU、DRL 或 DBV 封裝的裝置。
使用指南:
PDF
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| SOT-23 (DBV) | 5 | Ultra Librarian |