SN54AC00-SP

現行

Radiation-hardened, QML-V, 4-channel 2-input, 2V to 6V NAND gates

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產品規格表

document-pdfAcrobat SN54AC00-SP Radiation Hardened Quad 2 Input NAND Gate datasheet (Rev. C) (英文) PDF | HTML

SN54AC00-SP

現行

產品規格表

立即訂購

產品詳細資料

Technology family

Number of channels

Inputs per channel

IOL (max) (mA)

IOH (max) (mA)

-24

Input type

Standard CMOS

Output type

Push-Pull

Features

Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

100

Rating

Space

Operating temperature range (°C)

-55 to 125

Technology family

Number of channels

Inputs per channel

IOL (max) (mA)

IOH (max) (mA)

-24

Input type

Standard CMOS

Output type

Push-Pull

Features

Very high speed (tpd 5-10ns)

Data rate (max) (Mbps)

100

Rating

Space

Operating temperature range (°C)

-55 to 125

CFP (W)

58.023 mm² (— mm × — mm)

CDIP (J)

130.4652 mm² (— mm × — mm)

DIESALE (KGD)

—

See data sheet

5962R87549:
- Radiation hardness assurance (RHA) up to TID 100 krad (Si)
- SEL immune to 86 MeV×cm²/mg
5962-87549:
- Total ionizing dose 50 krad (Si)
2 V to 6 V V_CC operation
Inputs accept voltages to 6 V
Maximum t_pd of 7 ns at 5 V

5962R87549:
- Radiation hardness assurance (RHA) up to TID 100 krad (Si)
- SEL immune to 86 MeV×cm²/mg
5962-87549:
- Total ionizing dose 50 krad (Si)
2 V to 6 V V_CC operation
Inputs accept voltages to 6 V
Maximum t_pd of 7 ns at 5 V

The SN54AC00 device contains four independent 2-input NAND gates. Each gate performs the Boolean function of Y = A • B or Y = A + B in positive logic.

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重要文件	類型	標題	格式選項	日期
*	資料表	SN54AC00-SP Radiation Hardened Quad 2 Input NAND Gate datasheet (Rev. C)	PDF \| HTML	2022/4/4
*	輻射及可靠性報告	54AC00-SP Radiation Assured Devices		2016/4/21
*	SMD	SN54AC00-SP SMD 5962-87549		2016/7/8

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