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LM2901AV-Q1

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車用精密四差動比較器

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產品規格表

LM2901AV-Q1

現行
立即訂購

產品詳細資料

Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 32 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 250 VICR (max) (V) 30.5 VICR (min) (V) 0
Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 32 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 250 VICR (max) (V) 30.5 VICR (min) (V) 0
SOIC (D) 14 51.9 mm² (8.65 mm × 6 mm) TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm)
  • Qualified for automotive applications
  • AEC-Q100 Qualified with the following results:
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification levels:
      • Class 1C for "AV" version
      • Class 2 for all other versions
    • Device CDM ESD classification level C3
  • Improved 2kV HBM ESD for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200uA typical per comparator ("B" Versions)
  • Low input bias current 3.5nA typical ("B" device)
  • Low input offset current 0.5nA typical ("B" device)
  • Low input offset voltage ±0.37mV typical ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36V
  • Output compatible with TTL, MOS, and CMOS
  • For single version in SOT, see the TL331-Q1 (SLVS969)
  • For dual version in multiple packages, see the LM2903x-Q1 (SLCS141)
  • Functional Safety-Capable
  • Qualified for automotive applications
  • AEC-Q100 Qualified with the following results:
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification levels:
      • Class 1C for "AV" version
      • Class 2 for all other versions
    • Device CDM ESD classification level C3
  • Improved 2kV HBM ESD for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200uA typical per comparator ("B" Versions)
  • Low input bias current 3.5nA typical ("B" device)
  • Low input offset current 0.5nA typical ("B" device)
  • Low input offset voltage ±0.37mV typical ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36V
  • Output compatible with TTL, MOS, and CMOS
  • For single version in SOT, see the TL331-Q1 (SLVS969)
  • For dual version in multiple packages, see the LM2903x-Q1 (SLCS141)
  • Functional Safety-Capable

The LM2901B-Q1 device is the next generation version of the industry-standard LM2901x-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage and higher supply voltage capability. Additionally, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of four independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2V to 36V, and VCC is at least 1.5V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The "V" versions operate up to 32V, and the "B" version operates up to 36V. All are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C.

The LM2901B-Q1 device is the next generation version of the industry-standard LM2901x-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage and higher supply voltage capability. Additionally, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of four independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2V to 36V, and VCC is at least 1.5V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The "V" versions operate up to 32V, and the "B" version operates up to 36V. All are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C.
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重要文件 類型 標題 格式選項 下載最新的英文版本 日期
* 資料表 LM2901B-Q1, LM2901x-Q1 Quadruple Automotive Comparator datasheet (Rev. H) PDF | HTML 2025/5/14
功能安全資訊 LM2901-Q1, LM2901B-Q1, LM2901V-Q1, FS, FIT Rate, Failure Mode Dist and Pin FMA PDF | HTML 2020/4/7
電子書 The Signal e-book: A compendium of blog posts on op amp design topics PDF | HTML 2017/3/28

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AMP-PDK-EVM — 放大器性能開發套件評估模組

放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件，可測試通用運算放大器 (op amp) 參數，並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項，可滿足封裝需求，使工程師能夠快速評估和驗證裝置性能。

AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝，包括：

  • D (SOIC-8 和 SOIC-14)
  • PW (TSSOP-14)
  • DGK (VSSOP-8)
  • DBV (SOT23-5 和 SOT23-6)
  • DCK (SC70-5 和 SC70-6)
使用指南: PDF | HTML
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參考設計

TIDA-010044 — 具有故障保護和診斷的 NAMUR PLC 數位輸入參考設計

NAMUR 近距感測器廣泛用於工業控制，以滿足感測器對最大能量的特殊要求。這又要求 PLC 數位輸入在準確度和可靠性方面有特殊要求，設計用於介接此類感測器。此參考設計為相容於 NAMUR 感測器的數位輸入完整前端。此設計展示了經由緊湊的空間內冗餘、故障保護及廣泛的診斷功能所實現的可靠性。
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封裝 針腳 CAD 符號、佔位空間與 3D 模型
SOIC (D) 14 Ultra Librarian
TSSOP (PW) 14 Ultra Librarian
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