SN65LVDS33-EP

활성

EP(Enhanced Product) 고속 차동 리시버

제품 상세 정보

Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Function Receiver Protocols LVDS Number of transmitters 0 Number of receivers 4 Signaling rate (Mbps) 400 Input signal CMOS, ECL, LVCMOS, LVDS, LVECL, LVPECL, PECL Output signal LVTTL Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (D) 16 59.4 mm² (9.9 mm × 6 mm)
  • Controlled Baseline — One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up to -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 400-Mbps Signaling Rate(2) and 200-Mxfr/s Data Transfer Rate
  • Operates With a Single 3.3-V Supply
  • -4-V to 5-V Common-Mode Input Voltage Range
  • Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire Common-Mode Input Voltage Range
  • Integrated 110- Line Termination Resistors On LVDT Products
  • Complies With TIA/EIA-644 (LVDS)
  • Active Failsafe Assures a High-Level Output With No Input
  • Bus-Pin ESD Protection Exceeds 15-kV HBM
  • Input Remains High-Impedance On Power Down
  • TTL Inputs Are 5-V Tolerant
  • Pin-Compatible With the AM26LS32, SN65LVDS32B, µA9637, SN65LVDS9637B

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
(2) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).

  • Controlled Baseline — One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up to -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • 400-Mbps Signaling Rate(2) and 200-Mxfr/s Data Transfer Rate
  • Operates With a Single 3.3-V Supply
  • -4-V to 5-V Common-Mode Input Voltage Range
  • Differential Input Thresholds < ±50 mV With 50 mV of Hysteresis Over Entire Common-Mode Input Voltage Range
  • Integrated 110- Line Termination Resistors On LVDT Products
  • Complies With TIA/EIA-644 (LVDS)
  • Active Failsafe Assures a High-Level Output With No Input
  • Bus-Pin ESD Protection Exceeds 15-kV HBM
  • Input Remains High-Impedance On Power Down
  • TTL Inputs Are 5-V Tolerant
  • Pin-Compatible With the AM26LS32, SN65LVDS32B, µA9637, SN65LVDS9637B

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
(2) The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second).

This family of four LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.

Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.

The high-speed switching of LVDS signals usually necessitates the use of a line impedance matching resistor at the receiving-end of the cable or transmission media. The SN65LVDT series of receivers eliminates this external resistor by integrating it with the receiver. The nonterminated SN65LVDS series is also available for multidrop or other termination circuits.

The receivers can withstand ±15-kV human-body model (HBM) and ±600-V machine model (MM) electrostatic discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled and other connections where potentially damaging noise is always a threat.

The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions. This feature may also be used for Wired-Or bus signaling. See The Active Failsafe Feature of the SN65LVDS32B application note.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100 . The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN65LVDS33-EP is characterized for operation from -55°C to 125°C.

This family of four LVDS data line receivers offers the widest common-mode input voltage range in the industry. These receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an option.

Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV over the full input common-mode voltage range.

The high-speed switching of LVDS signals usually necessitates the use of a line impedance matching resistor at the receiving-end of the cable or transmission media. The SN65LVDT series of receivers eliminates this external resistor by integrating it with the receiver. The nonterminated SN65LVDS series is also available for multidrop or other termination circuits.

The receivers can withstand ±15-kV human-body model (HBM) and ±600-V machine model (MM) electrostatic discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled and other connections where potentially damaging noise is always a threat.

The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these fault conditions. This feature may also be used for Wired-Or bus signaling. See The Active Failsafe Feature of the SN65LVDS32B application note.

The intended application and signaling technique of these devices is point-to-point baseband data transmission over controlled impedance media of approximately 100 . The transmission media may be printed-circuit board traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation characteristics of the media and the noise coupling to the environment.

The SN65LVDS33-EP is characterized for operation from -55°C to 125°C.

다운로드 스크립트와 함께 비디오 보기 비디오

관심 가지실만한 유사 제품

open-in-new 대안 비교
비교 대상 장치와 유사한 기능.
SN65LVDS31-EP 활성 EP(Enhanced Product) 쿼드 LVDS 트랜스미터 Line Driver variant

기술 자료

검색된 결과가 없습니다. 검색어를 지우고 다시 시도하세요.
6개 모두 보기
상위 문서 유형 직함 형식 옵션 최신 영어 버전 다운로드 날짜
* 데이터 시트 SN65LVDS33-EP High-Speed Differential Receivers datasheet (Rev. B) 2007. 4. 19
* 방사능 및 안정성 보고서 SN65LVDS33MDREP Reliability Report 2013. 9. 6
* VID SN65LVDS33-EP VID V6205614 2016. 6. 21
Application brief LVDS to Improve EMC in Motor Drives 2018. 9. 27
Application brief How Far, How Fast Can You Operate LVDS Drivers and Receivers? 2018. 8. 3
Application brief How to Terminate LVDS Connections with DC and AC Coupling 2018. 5. 16

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

평가 보드

SN65LVDS31-33EVM — SN65LVDS31 및 SN65LVDS33용 평가 모듈

TI offers a series of low-voltage differential signaling (LVDS) evaluation modules (EVMs) designed for analysis of the electrical characteristics of LVDS drivers and receivers. Four unique EVMs are available to evaluate the different classes of LVDS devices offered by TI.

As seen in the Combination (...)

지원되는 제품 및 하드웨어
재고 있음
제한:
??asset.out-of-stock-ti_ko_KR??
이용할 수 없음
시뮬레이션 모델

SN65LVDS33 IBIS Model (Rev. A)

SLLC069A.ZIP (6 KB) - IBIS 모델
지원되는 제품 및 하드웨어
패키지 CAD 기호, 풋프린트 및 3D 모델
SOIC (D) 16 Ultra Librarian

주문 및 품질

권장 제품에는 본 TI 제품과 관련된 매개 변수, 평가 모듈 또는 레퍼런스 디자인이 있을 수 있습니다.

지원 및 교육

TI 엔지니어의 기술 지원을 받을 수 있는 TI E2E™ 포럼

콘텐츠는 TI 및 커뮤니티 기고자에 의해 "있는 그대로" 제공되며 TI의 사양으로 간주되지 않습니다. 사용 약관을 참조하십시오.

품질, 패키징, TI에서 주문하는 데 대한 질문이 있다면 TI 지원을 방문하세요. ​​​​​​​​​​​​​​

동영상