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SN54SC4T125-SEP

활성

Radiation-tolerant, 4 bit, fixed-direction level translator

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데이터 시트

SN54SC4T125-SEP

활성
지금 주문하기

제품 상세 정보

Bits (#) 4 Data rate (max) (Mbps) 150 Topology Push-Pull Vin (min) (V) 1.2 Vin (max) (V) 5.5 Applications GPIO Features Balanced outputs, Over-voltage tolerant inputs, Single supply Prop delay (ns) 12.5 Technology family SCxT Supply current (max) (mA) 0.093 Rating Space Operating temperature range (°C) -55 to 125
Bits (#) 4 Data rate (max) (Mbps) 150 Topology Push-Pull Vin (min) (V) 1.2 Vin (max) (V) 5.5 Applications GPIO Features Balanced outputs, Over-voltage tolerant inputs, Single supply Prop delay (ns) 12.5 Technology family SCxT Supply current (max) (mA) 0.093 Rating Space Operating temperature range (°C) -55 to 125
TSSOP (PW) 14 32 mm² (5 mm × 6.4 mm)

  • VID V62/23631-01XE

  • Radiation Tolerant

    • Single Event Latch-Up (SEL) immune up to 43 MeV-cm 2/mg at 125°C

    • Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si)

    • Single Event Transient (SET) characterized up to LET = 43 MeV-cm 2/mg

  • Wide operating range of 1.2 V to 5.5 V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2 V to 1.8 V

      • 1.5 V to 2.5 V

      • 1.8 V to 3.3 V

      • 3.3 V to 5.0 V

    • Down translation:

      • 5.0 V, 3.3 V, 2.5 V to 1.8 V
      • 5.0 V, 3.3 V to 2.5 V
      • 5.0 V to 3.3 V
  • 5.5-V tolerant input pins
  • Supports standard pinouts
  • Up to 150 Mbps with 5-V or 3.3-V V CC
  • Latch-up performance exceeds 250 mA per JESD 17

  • Space Enhanced Plastic

    • Controlled baseline

    • Au bondwire and NiPdAu lead finish

    • Meets NASA ASTM E595 outgassing specification

    • One fabrication, assembly, and test site

    • Extended product life cycle

    • Product traceability

  • VID V62/23631-01XE

  • Radiation Tolerant

    • Single Event Latch-Up (SEL) immune up to 43 MeV-cm 2/mg at 125°C

    • Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si)

    • Single Event Transient (SET) characterized up to LET = 43 MeV-cm 2/mg

  • Wide operating range of 1.2 V to 5.5 V

  • Single-supply voltage translator:

    • Up translation:

      • 1.2 V to 1.8 V

      • 1.5 V to 2.5 V

      • 1.8 V to 3.3 V

      • 3.3 V to 5.0 V

    • Down translation:

      • 5.0 V, 3.3 V, 2.5 V to 1.8 V
      • 5.0 V, 3.3 V to 2.5 V
      • 5.0 V to 3.3 V
  • 5.5-V tolerant input pins
  • Supports standard pinouts
  • Up to 150 Mbps with 5-V or 3.3-V V CC
  • Latch-up performance exceeds 250 mA per JESD 17

  • Space Enhanced Plastic

    • Controlled baseline

    • Au bondwire and NiPdAu lead finish

    • Meets NASA ASTM E595 outgassing specification

    • One fabrication, assembly, and test site

    • Extended product life cycle

    • Product traceability

The SN54SC4T125-SEP contains four independent buffers with 3-state outputs and extended voltage operation to allow for level translation. Each buffer performs the Boolean function Y = A in positive logic. The outputs can be put into a high impedance (Hi-Z) state by applying a HIGH on the OE pin. The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).

The SN54SC4T125-SEP contains four independent buffers with 3-state outputs and extended voltage operation to allow for level translation. Each buffer performs the Boolean function Y = A in positive logic. The outputs can be put into a high impedance (Hi-Z) state by applying a HIGH on the OE pin. The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).
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기술 자료

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8개 모두 보기
상위 문서 유형 직함 형식 옵션 최신 영어 버전 다운로드 날짜
* 데이터 시트 SN54SC4T125-SEP Radiation Tolerant, Single Power Supply Quadruple Buffer Translator GATE With 3-State Output CMOS Logic Level Shifter datasheet PDF | HTML 2023. 11. 15
* 방사능 및 안정성 보고서 SN54SC4T125-SEP Single Event Effects Report PDF | HTML 2023. 12. 5
* 방사능 및 안정성 보고서 SN54SC4T125-SEP Total Ionizing Dose (TID) Report PDF | HTML 2023. 12. 1
* 방사능 및 안정성 보고서 SN54SC4T125-SEP Production Flow and Reliability Report PDF | HTML 2023. 11. 9
애플리케이션 노트 Schematic Checklist - A Guide to Designing With Fixed or Direction Control Translators PDF | HTML 2024. 10. 2
Application brief TI Space Enhanced Plastic Logic Overview and Applications in Low-Earth Orbit Satellite Platforms PDF | HTML 2024. 9. 10
애플리케이션 노트 Schematic Checklist - A Guide to Designing with Auto-Bidirectional Translators PDF | HTML 2024. 7. 12
애플리케이션 노트 Understanding Transient Drive Strength vs. DC Drive Strength in Level-Shifters (Rev. A) PDF | HTML 2024. 7. 3

설계 및 개발

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평가 보드

14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈

14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.

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