TMS570LC4357-SEP

AKTIV

Radiation-tolerant, Hercules™ microcontroller based on Arm® Cortex®-R core

TMS570LC4357-SEP

AKTIV

Produktdetails

CPU Arm Cortex-R5F Frequency (MHz) 300 Flash memory (kByte) 4096 RAM (kByte) 512 ADC type 2 12-bit SAR Total processing (MIPS) 0.0003 Features CAN, Ethernet, FlexRay, Hercules high-performance microcontroller, SPI, UART UART 4 CAN (#) 4 PWM (Ch) 78 Number of ADC channels 16 Operating temperature range (°C) -55 to 125 Rating Space Communication interface CAN, Ethernet, FlexRay, SPI, UART Operating system AutoSAR, FreeRTOS, SafeRTOS Hardware accelerators Floating point unit Edge AI enabled Yes Nonvolatile memory (kByte) 4096 Number of GPIOs 168
CPU Arm Cortex-R5F Frequency (MHz) 300 Flash memory (kByte) 4096 RAM (kByte) 512 ADC type 2 12-bit SAR Total processing (MIPS) 0.0003 Features CAN, Ethernet, FlexRay, Hercules high-performance microcontroller, SPI, UART UART 4 CAN (#) 4 PWM (Ch) 78 Number of ADC channels 16 Operating temperature range (°C) -55 to 125 Rating Space Communication interface CAN, Ethernet, FlexRay, SPI, UART Operating system AutoSAR, FreeRTOS, SafeRTOS Hardware accelerators Floating point unit Edge AI enabled Yes Nonvolatile memory (kByte) 4096 Number of GPIOs 168
NFBGA (GWT) 337 256 mm² (16 mm × 16 mm)
  • VID - V62/18621
  • Radiation Hardened
    • Single Event Latch-up (SEL) Immune to 43MeV-cm2/mg at 125°C
    • Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 30krad (Si)
  • Space Enhanced Plastic
    • Controlled Baseline
    • Gold Au wire
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Extended (–55°C to 125°C) Temperature Range
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability
    • Enhanced Mold Compound for Low Outgassing
  • High-Performance Automotive-Grade Microcontroller for Safety-Critical Applications
    • Dual-Core Lockstep CPUs With ECC-Protected Caches
    • ECC on Flash and RAM Interfaces
    • Built-In Self-Test (BIST) for CPU, High-End Timers, and On-Chip RAMs
    • Error Signaling Module (ESM) With Error Pin
    • Voltage and Clock Monitoring
  • Arm Cortex-R5F 32-Bit RISC CPU
    • 1.66 DMIPS/MHz With 8-Stage Pipeline
    • FPU With Single- and Double-Precision
    • 16-Region Memory Protection Unit (MPU)
    • 32KB of Instruction and 32KB of Data Caches With ECC
    • Open Architecture With Third-Party Support
  • Operating Conditions
    • Up to 300-MHz CPU Clock
    • Core Supply Voltage (VCC): 1.14 to 1.32V
    • I/O Supply Voltage (VCCIO): 3.0 to 3.6V
  • Integrated Memory
    • 4MB of Program Flash With ECC
    • 512KB of RAM With ECC
    • 128KB of Data Flash for Emulated EEPROM With ECC
  • 16-Bit External Memory Interface (EMIF)
  • Hercules™ Common Platform Architecture
    • Consistent Memory Map Across Family
    • Real-Time Interrupt (RTI) Timer (OS Timer)
    • Two 128-Channel Vectored Interrupt Modules (VIMs) With ECC Protection on Vector Table
      • VIM1 and VIM2 in Safety Lockstep Mode
    • Two 2-Channel Cyclic Redundancy Checker (CRC) Modules
  • Direct Memory Access (DMA) Controller
    • 32 Channels and 48 Peripheral Requests
    • ECC Protection for Control Packet RAM
    • DMA Accesses Protected by Dedicated MPU
  • Frequency-Modulated Phase-Locked Loop (FMPLL) With Built-In Slip Detector
  • Separate Nonmodulating PLL
  • IEEE 1149.1 JTAG, Boundary Scan, and Arm CoreSight™ Components
  • Advanced JTAG Security Module (AJSM) 
  • Trace and Calibration Capabilities
    • ETM™, RTP, DMM, POM
  • Multiple Communication Interfaces
    • 10/100Mbps Ethernet MAC (EMAC)
      • IEEE 802.3 Compliant (3.3V I/O Only)
      • Supports MII, RMII, and MDIO
    • FlexRay Controller With 2 Channels
      • 8KB of Message RAM With ECC Protection
      • Dedicated FlexRay Transfer Unit (FTU)
    • Four CAN Controller (DCAN) Modules
      • 64 Mailboxes, Each With ECC Protection
      • Compliant to CAN Protocol Version 2.0B
    • Two Inter-Integrated Circuit (I2C) Modules
    • Five Multibuffered Serial Peripheral Interface (MibSPI) Modules
      • MibSPI1: 256 Words With ECC Protection
      • Other MibSPIs: 128 Words With ECC Protection
    • Four UART (SCI) Interfaces, Two With Local Interconnect Network (LIN 2.1) Interface Support
  • Two Next Generation High-End Timer (N2HET) Modules
    • 32 Programmable Channels Each
    • 256-Word Instruction RAM With Parity
    • Hardware Angle Generator for Each N2HET
    • Dedicated High-End Timer Transfer Unit (HTU) for Each N2HET
  • Two 12-Bit Multibuffered Analog-to-Digital Converter (MibADC) Modules
    • MibADC1: 32 Channels Plus Control for up to 1024 Off-Chip Channels
    • MibADC2: 25 Channels
    • 16 Shared Channels
    • 64 Result Buffers Each With Parity Protection
  • Enhanced Timing Peripherals
    • 7 Enhanced Pulse Width Modulator (ePWM) Modules
    • 6 Enhanced Capture (eCAP) Modules
    • 2 Enhanced Quadrature Encoder Pulse (eQEP) Modules
  • Three On-Die Temperature Sensors
  • Up to 145 Pins Available for General-Purpose I/O (GPIO)
  • 16 Dedicated GPIO Pins With External Interrupt Capability
  • Packages
    • 337-Ball Grid Array (GWT) [Green]
  • VID - V62/18621
  • Radiation Hardened
    • Single Event Latch-up (SEL) Immune to 43MeV-cm2/mg at 125°C
    • Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 30krad (Si)
  • Space Enhanced Plastic
    • Controlled Baseline
    • Gold Au wire
    • One Assembly/Test Site
    • One Fabrication Site
    • Available in Extended (–55°C to 125°C) Temperature Range
    • Extended Product Life Cycle
    • Extended Product-Change Notification
    • Product Traceability
    • Enhanced Mold Compound for Low Outgassing
  • High-Performance Automotive-Grade Microcontroller for Safety-Critical Applications
    • Dual-Core Lockstep CPUs With ECC-Protected Caches
    • ECC on Flash and RAM Interfaces
    • Built-In Self-Test (BIST) for CPU, High-End Timers, and On-Chip RAMs
    • Error Signaling Module (ESM) With Error Pin
    • Voltage and Clock Monitoring
  • Arm Cortex-R5F 32-Bit RISC CPU
    • 1.66 DMIPS/MHz With 8-Stage Pipeline
    • FPU With Single- and Double-Precision
    • 16-Region Memory Protection Unit (MPU)
    • 32KB of Instruction and 32KB of Data Caches With ECC
    • Open Architecture With Third-Party Support
  • Operating Conditions
    • Up to 300-MHz CPU Clock
    • Core Supply Voltage (VCC): 1.14 to 1.32V
    • I/O Supply Voltage (VCCIO): 3.0 to 3.6V
  • Integrated Memory
    • 4MB of Program Flash With ECC
    • 512KB of RAM With ECC
    • 128KB of Data Flash for Emulated EEPROM With ECC
  • 16-Bit External Memory Interface (EMIF)
  • Hercules™ Common Platform Architecture
    • Consistent Memory Map Across Family
    • Real-Time Interrupt (RTI) Timer (OS Timer)
    • Two 128-Channel Vectored Interrupt Modules (VIMs) With ECC Protection on Vector Table
      • VIM1 and VIM2 in Safety Lockstep Mode
    • Two 2-Channel Cyclic Redundancy Checker (CRC) Modules
  • Direct Memory Access (DMA) Controller
    • 32 Channels and 48 Peripheral Requests
    • ECC Protection for Control Packet RAM
    • DMA Accesses Protected by Dedicated MPU
  • Frequency-Modulated Phase-Locked Loop (FMPLL) With Built-In Slip Detector
  • Separate Nonmodulating PLL
  • IEEE 1149.1 JTAG, Boundary Scan, and Arm CoreSight™ Components
  • Advanced JTAG Security Module (AJSM) 
  • Trace and Calibration Capabilities
    • ETM™, RTP, DMM, POM
  • Multiple Communication Interfaces
    • 10/100Mbps Ethernet MAC (EMAC)
      • IEEE 802.3 Compliant (3.3V I/O Only)
      • Supports MII, RMII, and MDIO
    • FlexRay Controller With 2 Channels
      • 8KB of Message RAM With ECC Protection
      • Dedicated FlexRay Transfer Unit (FTU)
    • Four CAN Controller (DCAN) Modules
      • 64 Mailboxes, Each With ECC Protection
      • Compliant to CAN Protocol Version 2.0B
    • Two Inter-Integrated Circuit (I2C) Modules
    • Five Multibuffered Serial Peripheral Interface (MibSPI) Modules
      • MibSPI1: 256 Words With ECC Protection
      • Other MibSPIs: 128 Words With ECC Protection
    • Four UART (SCI) Interfaces, Two With Local Interconnect Network (LIN 2.1) Interface Support
  • Two Next Generation High-End Timer (N2HET) Modules
    • 32 Programmable Channels Each
    • 256-Word Instruction RAM With Parity
    • Hardware Angle Generator for Each N2HET
    • Dedicated High-End Timer Transfer Unit (HTU) for Each N2HET
  • Two 12-Bit Multibuffered Analog-to-Digital Converter (MibADC) Modules
    • MibADC1: 32 Channels Plus Control for up to 1024 Off-Chip Channels
    • MibADC2: 25 Channels
    • 16 Shared Channels
    • 64 Result Buffers Each With Parity Protection
  • Enhanced Timing Peripherals
    • 7 Enhanced Pulse Width Modulator (ePWM) Modules
    • 6 Enhanced Capture (eCAP) Modules
    • 2 Enhanced Quadrature Encoder Pulse (eQEP) Modules
  • Three On-Die Temperature Sensors
  • Up to 145 Pins Available for General-Purpose I/O (GPIO)
  • 16 Dedicated GPIO Pins With External Interrupt Capability
  • Packages
    • 337-Ball Grid Array (GWT) [Green]

The TMS570LC4357-SEP device is part of the Hercules TMS570 series of high-performance automotive-grade Arm® Cortex®-R-based MCUs. Comprehensive documentation, tools, and software are available to assist in the development of ISO 26262 and IEC 61508 functional safety applications. Start evaluating today with the Hercules TMS570LC43x LaunchPad Development Kit. The TMS570LC4357-SEP device has on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os.

The TMS570LC4357-SEP device integrates two ARM Cortex-R5F floating-point CPUs, operating in lockstep, which offer an efficient 1.66DMIPS/MHz, and can run up to 300MHz providing up to 498DMIPS. The device supports the big-endian [BE32] format.

The TMS570LC4357-SEP device has 4MB of integrated flash and 512KB of data RAM with single-bit error correction and double-bit error detection. The flash memory on this device is a nonvolatile, electrically erasable and programmable memory, implemented with a 64-bit-wide data bus interface. The flash operates on a 3.3V supply input (the same level as the I/O supply) for all read, program, and erase operations. The SRAM supports read and write accesses in byte, halfword, and word modes.

The TMS570LC4357-SEP device features peripherals for real-time control-based applications, including two Next Generation High-End Timer (N2HET) timing coprocessors with up to 64 total I/O terminals.

The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications. The timer is software-controlled, with a specialized timer micromachine and an attached I/O port. The N2HET can be used for pulse-width-modulated outputs, capture or compare inputs, or GPIO. The N2HET is designed for applications requiring multiple sensor information or drive actuators with complex and accurate time pulses. The High-End Timer Transfer Unit (HTU) can perform DMA-type transactions to transfer N2HET data to or from main memory. A Memory Protection Unit (MPU) is built into the HTU.

The Enhanced Pulse Width Modulator (ePWM) module can generate complex pulse width waveforms with minimal CPU overhead or intervention. The ePWM is easy to use and supports both high-side and low-side PWM and deadband generation. With integrated trip zone protection and synchronization with the on-chip MibADC, the ePWM is an excellent choice for digital motor control applications.

The Enhanced Capture (eCAP) module is essential in systems where the accurately timed capture of external events is important. The eCAP can also be used to monitor the ePWM outputs or for simple PWM generation when not needed for capture applications.

The Enhanced Quadrature Encoder Pulse (eQEP) module directly interfaces with a linear or rotary incremental encoder to get position, direction, and speed information from a rotating machine as used in high-performance motion and position-control systems.

The device has two 12-bit-resolution MibADCs with 41 total channels and 64 words of parity-protected buffer RAM. The MibADC channels can be converted individually or by group for special conversion sequences. Sixteen channels are shared between the two MibADCs. Each MibADC supports three separate groupings. Each sequence can be converted once when triggered or configured for continuous conversion mode. The MibADC has a 10-bit mode for use when compatibility with older devices or faster conversion time is desired. One of the channels in MibADC1 and two of the channels in MibADC2 can be used to convert temperature measurements from the three on-chip temperature sensors.

The device has multiple communication interfaces: Five MibSPIs; four UART (SCI) interfaces, two with LIN support; four CANs; two I2C modules; one Ethernet Controller; and one FlexRay controller. The SPI provides a convenient method of serial interaction for high-speed communications between similar shift-register type devices. The LIN supports the Local Interconnect standard (LIN 2.1) and can be used as a UART in full-duplex mode using the standard Non-Return-to-Zero (NRZ) format. The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps. The DCAN is ideal for applications operating in noisy and harsh environments (for example, automotive and industrial fields) that require reliable serial communication or multiplexed wiring. The FlexRay controller uses a dual-channel serial, fixed time base multimaster communication protocol with communication rates of 10 Mbps per channel. A FlexRay Transfer Unit (FTU) enables autonomous transfers of FlexRay data to and from main CPU memory. HTU transfers are protected by a dedicated, built-in MPU. The Ethernet module supports MII, RMII, and Management Data I/O (MDIO) interfaces. The I2C module is a multimaster communication module providing an interface between the microcontroller and an I2C-compatible device through the I2C serial bus. The I2C module supports speeds of 100 and 400 kbps.

The Frequency-Modulated Phase-Locked Loop (FMPLL) clock module multiplies the external frequency reference to a higher frequency for internal use. The Global Clock Module (GCM) manages the mapping between the available clock sources and the internal device clock domains.

The device also has two External Clock Prescaler (ECP) modules. When enabled, the ECPs output a continuous external clock on the ECLK1 and ECLK2 balls. The ECLK frequency is a user-programmable ratio of the peripheral interface clock (VCLK) frequency. This low-frequency output can be monitored externally as an indicator of the device operating frequency.

The Direct Memory Access (DMA) controller has 32 channels, 48 peripheral requests, and ECC protection on the controller’s memory. An MPU is built into the DMA to protect memory against erroneous transfers.

The Error Signaling Module (ESM) monitors on-chip device errors and determines whether an interrupt or external Error pin/ball (nERROR) is triggered when a fault is detected. The nERROR signal can be monitored externally as an indicator of a fault condition in the microcontroller.

The External Memory Interface (EMIF) provides a memory extension to asynchronous and synchronous memories or other slave devices.

A Parameter Overlay Module (POM) is included to enhance the debugging capabilities of application code. The POM can reroute flash accesses to internal RAM or to the EMIF, thus avoiding the reprogramming steps necessary for parameter updates in flash. This capability is particularly helpful during real-time system calibration cycles.

Several interfaces are implemented to enhance the debugging capabilities of application code. In addition to the built-in Arm® Cortex®-R5F CoreSight debug features, the Embedded Cross Trigger (ECT) supports the interaction and synchronization of multiple triggering events within the SoC. An External Trace Macrocell (ETM) provides instruction and data trace of program execution. For instrumentation purposes, a RAM Trace Port (RTP) module is implemented to support high-speed tracing of RAM and peripheral accesses by the CPU or any other master. A Data Modification Module (DMM) gives the ability to write external data into the device memory. Both the RTP and DMM have no or minimal impact on the program execution time of the application code.

With integrated safety features and a wide choice of communication and control peripherals, the TMS570LC4357-SEP device is designed for high-performance real-time control applications with safety-critical requirements.

The TMS570LC4357-SEP device is part of the Hercules TMS570 series of high-performance automotive-grade Arm® Cortex®-R-based MCUs. Comprehensive documentation, tools, and software are available to assist in the development of ISO 26262 and IEC 61508 functional safety applications. Start evaluating today with the Hercules TMS570LC43x LaunchPad Development Kit. The TMS570LC4357-SEP device has on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os.

The TMS570LC4357-SEP device integrates two ARM Cortex-R5F floating-point CPUs, operating in lockstep, which offer an efficient 1.66DMIPS/MHz, and can run up to 300MHz providing up to 498DMIPS. The device supports the big-endian [BE32] format.

The TMS570LC4357-SEP device has 4MB of integrated flash and 512KB of data RAM with single-bit error correction and double-bit error detection. The flash memory on this device is a nonvolatile, electrically erasable and programmable memory, implemented with a 64-bit-wide data bus interface. The flash operates on a 3.3V supply input (the same level as the I/O supply) for all read, program, and erase operations. The SRAM supports read and write accesses in byte, halfword, and word modes.

The TMS570LC4357-SEP device features peripherals for real-time control-based applications, including two Next Generation High-End Timer (N2HET) timing coprocessors with up to 64 total I/O terminals.

The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications. The timer is software-controlled, with a specialized timer micromachine and an attached I/O port. The N2HET can be used for pulse-width-modulated outputs, capture or compare inputs, or GPIO. The N2HET is designed for applications requiring multiple sensor information or drive actuators with complex and accurate time pulses. The High-End Timer Transfer Unit (HTU) can perform DMA-type transactions to transfer N2HET data to or from main memory. A Memory Protection Unit (MPU) is built into the HTU.

The Enhanced Pulse Width Modulator (ePWM) module can generate complex pulse width waveforms with minimal CPU overhead or intervention. The ePWM is easy to use and supports both high-side and low-side PWM and deadband generation. With integrated trip zone protection and synchronization with the on-chip MibADC, the ePWM is an excellent choice for digital motor control applications.

The Enhanced Capture (eCAP) module is essential in systems where the accurately timed capture of external events is important. The eCAP can also be used to monitor the ePWM outputs or for simple PWM generation when not needed for capture applications.

The Enhanced Quadrature Encoder Pulse (eQEP) module directly interfaces with a linear or rotary incremental encoder to get position, direction, and speed information from a rotating machine as used in high-performance motion and position-control systems.

The device has two 12-bit-resolution MibADCs with 41 total channels and 64 words of parity-protected buffer RAM. The MibADC channels can be converted individually or by group for special conversion sequences. Sixteen channels are shared between the two MibADCs. Each MibADC supports three separate groupings. Each sequence can be converted once when triggered or configured for continuous conversion mode. The MibADC has a 10-bit mode for use when compatibility with older devices or faster conversion time is desired. One of the channels in MibADC1 and two of the channels in MibADC2 can be used to convert temperature measurements from the three on-chip temperature sensors.

The device has multiple communication interfaces: Five MibSPIs; four UART (SCI) interfaces, two with LIN support; four CANs; two I2C modules; one Ethernet Controller; and one FlexRay controller. The SPI provides a convenient method of serial interaction for high-speed communications between similar shift-register type devices. The LIN supports the Local Interconnect standard (LIN 2.1) and can be used as a UART in full-duplex mode using the standard Non-Return-to-Zero (NRZ) format. The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps. The DCAN is ideal for applications operating in noisy and harsh environments (for example, automotive and industrial fields) that require reliable serial communication or multiplexed wiring. The FlexRay controller uses a dual-channel serial, fixed time base multimaster communication protocol with communication rates of 10 Mbps per channel. A FlexRay Transfer Unit (FTU) enables autonomous transfers of FlexRay data to and from main CPU memory. HTU transfers are protected by a dedicated, built-in MPU. The Ethernet module supports MII, RMII, and Management Data I/O (MDIO) interfaces. The I2C module is a multimaster communication module providing an interface between the microcontroller and an I2C-compatible device through the I2C serial bus. The I2C module supports speeds of 100 and 400 kbps.

The Frequency-Modulated Phase-Locked Loop (FMPLL) clock module multiplies the external frequency reference to a higher frequency for internal use. The Global Clock Module (GCM) manages the mapping between the available clock sources and the internal device clock domains.

The device also has two External Clock Prescaler (ECP) modules. When enabled, the ECPs output a continuous external clock on the ECLK1 and ECLK2 balls. The ECLK frequency is a user-programmable ratio of the peripheral interface clock (VCLK) frequency. This low-frequency output can be monitored externally as an indicator of the device operating frequency.

The Direct Memory Access (DMA) controller has 32 channels, 48 peripheral requests, and ECC protection on the controller’s memory. An MPU is built into the DMA to protect memory against erroneous transfers.

The Error Signaling Module (ESM) monitors on-chip device errors and determines whether an interrupt or external Error pin/ball (nERROR) is triggered when a fault is detected. The nERROR signal can be monitored externally as an indicator of a fault condition in the microcontroller.

The External Memory Interface (EMIF) provides a memory extension to asynchronous and synchronous memories or other slave devices.

A Parameter Overlay Module (POM) is included to enhance the debugging capabilities of application code. The POM can reroute flash accesses to internal RAM or to the EMIF, thus avoiding the reprogramming steps necessary for parameter updates in flash. This capability is particularly helpful during real-time system calibration cycles.

Several interfaces are implemented to enhance the debugging capabilities of application code. In addition to the built-in Arm® Cortex®-R5F CoreSight debug features, the Embedded Cross Trigger (ECT) supports the interaction and synchronization of multiple triggering events within the SoC. An External Trace Macrocell (ETM) provides instruction and data trace of program execution. For instrumentation purposes, a RAM Trace Port (RTP) module is implemented to support high-speed tracing of RAM and peripheral accesses by the CPU or any other master. A Data Modification Module (DMM) gives the ability to write external data into the device memory. Both the RTP and DMM have no or minimal impact on the program execution time of the application code.

With integrated safety features and a wide choice of communication and control peripherals, the TMS570LC4357-SEP device is designed for high-performance real-time control applications with safety-critical requirements.

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* Datenblatt TMS570LC4357-SEP Hercules™ Microcontroller Based on the Arm® Cortex®-R Core in Space Enhanced Plastics datasheet (Rev. A) PDF | HTML 07.03.2024
* Errata TMS570LC4357 Microcontroller Silicon Errata (Silicon Revision A) (Rev. D) 31.05.2016
* Strahlungs- und Zuverlässigkeitsbericht TMS570LC4357-SEP TID Radiation Report PDF | HTML 06.03.2024
* Strahlungs- und Zuverlässigkeitsbericht TMS5704357-SEP Production Flow and Reliability Report PDF | HTML 25.01.2024
Whitepaper Designing Space Systems With Integrated FDIR: A Guide to TI's Space-Grade Components PDF | HTML 12.07.2025
Whitepaper Benefits of Using Functional Safety in Commercial Space Applications PDF | HTML 12.07.2025
Informationen zur funktionalen Sicherheit Certification for Functional Safety Hardware Process (Rev. C) 06.06.2025
Zertifikat TUEV SUED Certification for TMS570LC43x (Rev. A) 21.06.2024
Anwendungshinweis TMS570LC-SEP Single Event Latch-Up (SEL) Radiation Report PDF | HTML 07.06.2023
Weitere Dokumente Hercules™ Diagnostic Library Test Automation Unit User Guide (Rev. B) PDF | HTML 09.01.2020
Informationen zur funktionalen Sicherheit HALCoGen-CSP Installation Guide (Rev. B) PDF | HTML 08.01.2020
Informationen zur funktionalen Sicherheit HALCoGen-CSP User's Guide (Rev. C) PDF | HTML 08.01.2020
Informationen zur funktionalen Sicherheit Hercules Diagnostic Library -TAU Installation Guide (Rev. B) PDF | HTML 08.01.2020
Weitere Dokumente HALCoGen-CSP 04.07.01 (Rev. C) PDF | HTML 08.01.2020
Benutzerhandbuch Hercules Diagnostic Library CSP Without LDRA 29.10.2019
Weitere Dokumente Diagnostic Library CSP Release Notes 17.10.2019
Anwendungshinweis HALCoGen Ethernet Driver With lwIP Integration Demo and Active Webserver Demo PDF | HTML 13.09.2019
Anwendungshinweis Hercules PLL Advisory SSWF021#45 Workaround (Rev. B) PDF | HTML 09.09.2019
Anwendungshinweis CAN Bus Bootloader for Hercules Microcontrollers PDF | HTML 21.08.2019
Benutzerhandbuch HALCoGen-CSP Without LDRA Installation Guide PDF | HTML 19.08.2019
Benutzerhandbuch HALCoGen-CSP Without LDRA User's Guide PDF | HTML 19.08.2019
Benutzerhandbuch Hercules™ Diag Lib Test Automation Unit Without LDRA User's Guide PDF | HTML 19.08.2019
Benutzerhandbuch Hercules Diagnostic Library - Without LDRA Installation Guide PDF | HTML 19.08.2019
Anwendungshinweis HALCoGen CSP Without LDRA Release_Notes 19.08.2019
Anwendungshinweis Interfacing the Embedded 12-Bit ADC in a TMS570LS31x/21x and RM4x Series MCUs (Rev. A) 20.04.2018
Anwendungshinweis FreeRTOS on Hercules Devices_new 19.04.2018
Anwendungshinweis MPU and Cache Settings in TMS570LC43x/RM57x Devices 19.04.2018
Benutzerhandbuch TMS570LC43x 16/32 RISC Flash Microcontroller Technical Reference Manual (Rev. A) 01.03.2018
Anwendungshinweis Sharing FEE Blocks Between the Bootloader and the Application 07.11.2017
Anwendungshinweis Sharing Exception Vectors on Hercules™ Based Microcontrollers 27.03.2017
Informationen zur funktionalen Sicherheit Safety Manual for TMS570LC4x Hercules ARM Safety Critical Microcontrollers (Rev. A) 19.10.2016
Anwendungshinweis Hercules AJSM Unlock (Rev. A) PDF | HTML 19.10.2016
Anwendungshinweis How to Create a HALCoGen Based Project For CCS (Rev. B) 09.08.2016
Anwendungshinweis Using the CRC Module on Hercules™-Based Microcontrollers 04.08.2016
Anwendungshinweis Using the SPI as an Extra UART Transmitter 26.07.2016
Whitepaper Hercules MCUs for Use in Electrical Vehicle Battery Management system 12.05.2016
Informationen zur funktionalen Sicherheit Functional Safety Audit: SafeTI Functional Safety Hardware Development (Rev. A) 25.04.2016
Anwendungshinweis High Speed Serial Bus Using the MibSPIP Module on Hercules-Based MCUs 22.04.2016
Anwendungshinweis TMS570LC4357 and RM57L843 On-Chip Temperature Sensor Measurements 18.01.2016
Informationen zur funktionalen Sicherheit Enabling Functional Safety Using SafeTI Diagnostic Library 18.12.2015
Anwendungshinweis Triggering ADC Using Internal Timer Events on Hercules MCUs 19.10.2015
Whitepaper Extending TI’s Hercules MCUs with the integrated flexible HET 29.09.2015
Anwendungshinweis PWM Generation and Input Capture Using HALCoGen N2HET Module 30.06.2015
Anwendungshinweis Sine Wave Generation Using PWM With Hercules N2HET and HTU 12.05.2015
Informationen zur funktionalen Sicherheit Foundational Software for Functional Safety 12.05.2015
Anwendungshinweis Triangle/Trapezoid Wave Generation Using PWM With Hercules N2HET 01.05.2015
Anwendungshinweis Nested Interrupts on Hercules ARM Cortex-R4/5-Based Microncontrollers 23.04.2015
Whitepaper Latch-Up White Paper PDF | HTML 22.04.2015
Anwendungshinweis Interrupt and Exception Handling on Hercules ARM Cortex-R4/5-Based MCUs 20.04.2015
Anwendungshinweis Monitoring PWM Using N2HET 02.04.2015
Anwendungshinweis Hercules SCI With DMA 22.03.2015
Zertifikat TÜV NORD Certificate for Functional Safety Software Development Process 03.02.2015
Informationen zur funktionalen Sicherheit Calculating Equivalent Power-on-Hours for Hercules Safety MCUs 26.01.2015
Informationen zur funktionalen Sicherheit TUV SUD ISO-13849 Safety Architecture Concept Study 02.07.2014
Weitere Dokumente HaLCoGen Release Notes 25.06.2014
Informationen zur funktionalen Sicherheit Hercules TMS570LC/RM57Lx Safety MCUs Development Insights Using Debug and Trace 21.05.2014
Benutzerhandbuch Trace Analyzer User's Guide (Rev. B) 18.11.2013
Informationen zur funktionalen Sicherheit IEC 60730 and UL 1998 Safety Standard Compliance Made Easier with TI Hercules 03.10.2013
Anwendungshinweis Hercules Family Frequency Slewing to Reduce Voltage and Current Transients 05.07.2012
Anwendungshinweis Basic PBIST Configuration and Influence on Current Consumption (Rev. C) 12.04.2012
Anwendungshinweis Verification of Data Integrity Using CRC 17.02.2012
Anwendungshinweis FlexRay Transfer Unit (FTU) Setup 26.01.2012
Informationen zur funktionalen Sicherheit Important ARM Ltd Application Notes for TI Hercules ARM Safety MCUs 17.11.2011
Benutzerhandbuch HET Integrated Development Environment User's Guide (Rev. A) 17.11.2011
Informationen zur funktionalen Sicherheit Execution Time Measurement for Hercules ARM Safety MCUs (Rev. A) 04.11.2011
Anwendungshinweis Use of All 1'’s and All 0's Valid in Flash EEPROM Emulation 27.09.2011
Informationen zur funktionalen Sicherheit ADC Source Impedance for Hercules ARM Safety MCUs (Rev. B) 06.09.2011
Informationen zur funktionalen Sicherheit Leveraging the High-End Timer Transfer Unit on Hercules ARM Safety MCUs (Rev. A) 06.09.2011
Informationen zur funktionalen Sicherheit Configuring a CAN Node on Hercules ARM Safety MCUs 06.09.2011
Informationen zur funktionalen Sicherheit Configuring the Hercules ARM Safety MCU SCI/LIN Module for UART Communication (Rev. A) 06.09.2011
Informationen zur funktionalen Sicherheit Hercules™ Microcontrollers: Real-time MCUs for safety-critical products 02.09.2011
Anwendungshinweis ECC Handling in TMSx70-Based Microcontrollers 23.02.2011
Benutzerhandbuch TI ICEPick Module Type C Reference Guide Public Version 17.02.2011
Anwendungshinweis NHET Getting Started (Rev. B) 30.08.2010
Informationen zur funktionalen Sicherheit Generating Operating System Tick Using RTI on a Hercules ARM Safety MCU 13.07.2010
Informationen zur funktionalen Sicherheit Usage of MPU Subregions on TI Hercules ARM Safety MCUs 10.03.2010
Benutzerhandbuch TI Assembly Language Tools Enhanced High-End Timer (NHET) Assembler User's Guide 04.03.2010
Whitepaper Discriminating between Soft Errors and Hard Errors in RAM White Paper 04.06.2008

Design und Entwicklung

Weitere Bedingungen oder erforderliche Ressourcen enthält gegebenenfalls die Detailseite, die Sie durch Klicken auf einen der unten stehenden Titel erreichen.

Evaluierungsplatine

ALGO-3P-UISP1-TI — Algocraft μISP1 Programmierer für Texas Instruments-Bausteine

μISP kann entweder an einen Host-PC angeschlossen (RS-232-, USB-, LAN-Verbindungen sind integriert) oder im Standalone-Modus arbeiten.

Die Programmierungszyklusausführung im Standalone-Modus kann durch einfaches Drücken der START-Taste oder über einige TTL-Steuerleitungen erfolgen.

Seine kompakte (...)

Von: Algocraft
Unterstützte Produkte und Hardware
Entwicklungskit

LAUNCHXL2-570LC43 — Hercules TMS570LC43x LaunchPad-Entwicklungskit

Das Hercules™ TMS570LC43x LaunchPad™ Entwicklungskit ist eine kostengünstige Evaluierungsplattform, die auf der leistungsstärksten Hercules TMS570LC4357 basiert – eine Lockstep Cached 300 MHz ARM Cortex-R5F basierte MCU der TMS570 Serie, die für die Entwicklung von ISO 26262 und IEC 61508 (...)

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Entwicklungskit

TMDX570LC43HDK — Hercules TMS570LC43x-Entwicklungskit

The TMS570LC43x Hercules Development Kit is ideal for getting started on development with the Hercules TMS570LC4357 high-performance safety microcontrollers. The kit is comprised of a development board, a mini-B USB cable, and an Ethernet cable.

Hercules Safety MCU Demos, HALCoGen, the diagnostics (...)

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Debug-Tastkopf

TMDSEMU200-U — XDS200-USB-Debug-Tastkopf

Der XDS200 ist ein Debug-Tastkopf (Emulator) zum Debugging von Embedded-Bausteinen von TI. Für die meisten Bausteine wird die Verwendung der neueren, kostengünstigeren XDS110 (www.ti.com/tool/TMDSEMU110-U) empfohlen. Der XDS200 unterstützt eine große Zahl von Standards (IEEE1149.1, IEEE1149.7, SWD) (...)

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Debug-Tastkopf

TMDSEMU560V2STM-U — XDS560™-Software v2 – System-Trace-USB-Debug-Sonde

XDS560v2 ist die Debug-Sonde mit der höchsten Leistung der XDS560™-Produktfamilie und unterstützt sowohl den herkömmlichen JTAG-Standard (IEEE1149.1) als auch cJTAG (IEEE1149.7).  Beachten Sie, dass das Serial Wire Debugging (SWD) nicht unterstützt wird.

Alle XDS-Debug-Sonden unterstützen Core- und (...)

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Debug-Tastkopf

TMDSEMU560V2STM-UE — XDS560v2 System-Trace-USB-und Ethernet-Debug-Tastkopf

The XDS560v2 is the highest performance of the XDS family of debug probes and supports both the traditional JTAG standard (IEEE1149.1) and cJTAG (IEEE1149.7). Note that it does not support serial wire debug (SWD).

All XDS debug probes support Core and System Trace in all ARM and DSP processors that (...)

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Debug-Tastkopf

LB-3P-TRACE32-ARM — Debug- und Trace-System Lauterbach TRACE32® für Arm®-basierte Mikrocontroller und Prozessoren

Die TRACE32®-Tools von Lauterbach sind eine Suite hochmoderner Hardware- und Softwarekomponenten, mit denen Entwickler alle Arten von Arm®-basierten Mikrocontrollern und Prozessoren analysieren, optimieren und zertifizieren können. Die weltweit anerkannten Debugging- und Trace-Lösungen für (...)

Unterstützte Produkte und Hardware
Hardware-Programmiertool

ALGO-3P-WRITENOW — Algocraft WriteNow! Programmierer

WriteNow! Die Reihe der systeminternen Programmierer ist ein Durchbruch in der Programmierbranche. Die Programmierer unterstützen eine große Anzahl von Bausteinen (Mikrocontroller, Speicher, CPLDs und andere programmierbare Bausteine) verschiedener Hersteller und verfügen über eine kompakte Größe (...)

Von: Algocraft
Unterstützte Produkte und Hardware
IDE, Konfiguration, Compiler oder Debugger

CCSTUDIO — Code Composer Studio integrated development environment (IDE)

CCStudio™ IDE is part of TI's extensive CCStudio™ development ecosystem and is an integrated development environment for TI's microcontrollers, processors, wireless connectivity devices, and radar sensors. CCStudio IDE is available as desktop or cloud-based applications. The cloud version (...)

Unterstützte Produkte und Hardware
Gehäuse Pins CAD-Symbole, Footprints und 3D-Modelle
NFBGA (GWT) 337 Ultra Librarian

Bestellen & Qualität

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