Produktdetails

Sample rate (max) (Msps) 200 Resolution (Bits) 11 Number of input channels 2 Interface type Parallel LVDS Analog input BW (MHz) 700 Features High Performance Rating Catalog Peak-to-peak input voltage range (V) 2 Power consumption (typ) (mW) 1081 Architecture Pipeline SNR (dB) 67 ENOB (Bits) 10.8 SFDR (dB) 85 Operating temperature range (°C) -40 to 85 Input buffer No
Sample rate (max) (Msps) 200 Resolution (Bits) 11 Number of input channels 2 Interface type Parallel LVDS Analog input BW (MHz) 700 Features High Performance Rating Catalog Peak-to-peak input voltage range (V) 2 Power consumption (typ) (mW) 1081 Architecture Pipeline SNR (dB) 67 ENOB (Bits) 10.8 SFDR (dB) 85 Operating temperature range (°C) -40 to 85 Input buffer No
VQFN (RGC) 64 81 mm² 9 x 9
  • Maximum Sample Rate: 200 MSPS
  • 11-bit Resolution with No Missing Codes
  • 90 dBc SFDR at Fin = 10 MHz
  • 79.8 dBFS SNR at 125 MHz IF, 20 MHz BW
    using TI proprietary SNRBoost technology
  • Total Power 1.1 W at 200 MSPS
  • 90 dB Cross-talk
  • Double Data Rate (DDR) LVDS and Parallel
    CMOS Output Options
  • Programmable Gain up to 6dB for SNR/SFDR Trade-off
  • DC Offset Correction
  • Gain Tuning Capability in Fine Steps (0.001 dB)
    Allows Channel-to-channel Gain Matching
  • Supports Input Clock Amplitude Down to
    400 mV p-p Differential
  • Internal and External Reference Support
  • 64-QFN Package (9 mm × 9 mm)

  • Maximum Sample Rate: 200 MSPS
  • 11-bit Resolution with No Missing Codes
  • 90 dBc SFDR at Fin = 10 MHz
  • 79.8 dBFS SNR at 125 MHz IF, 20 MHz BW
    using TI proprietary SNRBoost technology
  • Total Power 1.1 W at 200 MSPS
  • 90 dB Cross-talk
  • Double Data Rate (DDR) LVDS and Parallel
    CMOS Output Options
  • Programmable Gain up to 6dB for SNR/SFDR Trade-off
  • DC Offset Correction
  • Gain Tuning Capability in Fine Steps (0.001 dB)
    Allows Channel-to-channel Gain Matching
  • Supports Input Clock Amplitude Down to
    400 mV p-p Differential
  • Internal and External Reference Support
  • 64-QFN Package (9 mm × 9 mm)

ADS62C17 is a dual channel 11-bit, 200 MSPS A/D converter that combines high dynamic performance and low power consumption in a compact 64 QFN package. This makes it well-suited for multi-carrier, wide band-width communications applications.

ADS62C17 uses TI-proprietary SNRBoost technology that can be used to overcome SNR limitation due to quantization noise for bandwidths less than Nyquist (Fs/2). It includes several useful and commonly used digital functions such as ADC offset correction, gain (0 to 6 dB in steps of 0.5 dB) and gain tuning (in fine steps of 0.001 dB).

The gain option can be used to improve SFDR performance at lower full-scale input ranges. Using the gain tuning capability, each channel’s gain can be set independently to improve channel-to-channel gain matching. The device also includes a dc offset correction loop that can be used to cancel the ADC offset.

Both DDR LVDS (Double Data Rate) and parallel CMOS digital output interfaces are available. It includes internal references while the traditional reference pins and associated decoupling capacitors have been eliminated. Nevertheless, the device can also be driven with an external reference.

The device is specified over the industrial temperature range (–40°C to 85°C).

ADS62C17 is a dual channel 11-bit, 200 MSPS A/D converter that combines high dynamic performance and low power consumption in a compact 64 QFN package. This makes it well-suited for multi-carrier, wide band-width communications applications.

ADS62C17 uses TI-proprietary SNRBoost technology that can be used to overcome SNR limitation due to quantization noise for bandwidths less than Nyquist (Fs/2). It includes several useful and commonly used digital functions such as ADC offset correction, gain (0 to 6 dB in steps of 0.5 dB) and gain tuning (in fine steps of 0.001 dB).

The gain option can be used to improve SFDR performance at lower full-scale input ranges. Using the gain tuning capability, each channel’s gain can be set independently to improve channel-to-channel gain matching. The device also includes a dc offset correction loop that can be used to cancel the ADC offset.

Both DDR LVDS (Double Data Rate) and parallel CMOS digital output interfaces are available. It includes internal references while the traditional reference pins and associated decoupling capacitors have been eliminated. Nevertheless, the device can also be driven with an external reference.

The device is specified over the industrial temperature range (–40°C to 85°C).

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Technische Dokumentation

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Top-Dokumentation Typ Titel Format-Optionen Datum
* Data sheet Dual Channel 11 Bit, 200 MSPS ADC with SNRBoost datasheet (Rev. A) 17 Jul 2009
Application note Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A) 22 Mai 2015
Application note Why Use Oversampling when Undersampling Can Do the Job? (Rev. A) 19 Jul 2013
User guide TSW4200 Demonstration Kit User's Guide (Rev. C) 31 Okt 2012
Application note Understanding Low-Amplitude Behavior of 11-bit ADCs 22 Okt 2011
Application note Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A) 10 Sep 2010
Application note Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio 28 Apr 2009
Application note CDCE62005 as Clock Solution for High-Speed ADCs 04 Sep 2008
Application note CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters 08 Jun 2008
Application note Phase Noise Performance and Jitter Cleaning Ability of CDCE72010 02 Jun 2008
Application note QFN Layout Guidelines 28 Jul 2006

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