UCC23511-Q1 是一款适用于 IGBT、MOSFET 和 SiC MOSFET 的光兼容单通道隔离式栅极驱动器,具有 1.5A 峰值拉电流和 2A 峰值灌电流以及 5.7kVRMS 增强型隔离额定值。33V 的高电源电压范围允许使用双极电源来有效驱动 IGBT 和 SiC 功率 FET。UCC23511-Q1 可以驱动低侧和高侧功率 FET。与基于光耦合器的标准栅极驱动器相比,此器件的主要特性和特征可显著提高性能和可靠性,同时在原理图和布局设计中保持引脚对引脚兼容性。性能亮点包括高共模瞬态抗扰度 (CMTI)、低传播延迟和小脉宽失真。严格的过程控制可实现较小的器件对器件偏移。输入级是仿真二极管 (ediode),这意味着与光耦合器栅极驱动器中传统的 LED 相比,可靠性和老化特性更为出色。该器件采用扩展型 SO6 封装,爬电距离和间隙大于 8.5mm,塑封材料(材料组 I)的相对漏电起痕指数 (CTI) 大于 600V。UCC23511-Q1 具有高性能和高可靠性,因此非常适合用于汽车电机驱动器,例如牵引逆变器、车载充电器、直流充电站以及汽车暖通空调和加热系统。更高的工作温度为传统光耦合器以前无法支持的应用开辟了机会。
器件型号 | 封装 | 封装尺寸(标称值) |
---|---|---|
UCC23511-Q1 | 扩展型 SO-6 | 7.5mm x 4.68mm |
Changes from Revision * (August 2020) to Revision A (March 2021)
PIN | TYPE(1) | DESCRIPTION | |
---|---|---|---|
NAME | NO. | ||
UCC23511-Q1 | |||
ANODE | 1 | I | Anode |
CATHODE | 3 | I | Cathode |
NC | 2 | - | No Connection |
VCC | 6 | P | Positive output supply rail |
VEE | 4 | P | Negative output supply rail |
VOUT | 5 | O | Gate-drive output |
MIN | MAX | UNIT | ||
---|---|---|---|---|
Average Input Current | IF(AVG) | - | 25 | mA |
Peak Transient Input Current | IF(TRAN) <1us pulse, 300pps | 1 | A | |
Reverse Input Voltage | VR(MAX) | 14 | V | |
Output supply voltage | VCC – VEE | -0.3 | 35 | V |
Output signal voltage | VOUT – VCC | 0.3 | V | |
Output signal voltage | VOUT – VEE | -0.3 | V | |
Junction temperature | TJ(2) | -40 | 150 | °C |
Storage temperature | Tstg | -65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per AEC Q100-002(1) | ±4000 | V |
Charged-device model (CDM), per AEC Q100-011 | ±1500 |
MIN | NOM | MAX | UNIT | ||
---|---|---|---|---|---|
VCC | Output Supply Voltage(VCC – VEE) | 14 | 33 | V | |
IF (ON) | Input Diode Forward Current (Diode "ON") | 7 | 16 | mA | |
VF (OFF) | Anode voltage - Cathode voltage (Diode "OFF") | -13 | 0.9 | V | |
TJ | Junction temperature | -40 | 150 | °C | |
TA | Ambient temperature | -40 | 125 | °C |
THERMAL METRIC(1) | UCC23511-Q1 | UNIT | |
---|---|---|---|
SO6 | |||
6 Pins | |||
RθJA | Junction-to-ambient thermal resistance | 126 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 66.1 | °C/W |
RθJB | Junction-to-board thermal resistance | 62.8 | °C/W |
ΨJT | Junction-to-top characterization parameter | 29.6 | °C/W |
ΨJB | Junction-to-board characterization parameter | 60.8 | °C/W |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
PD | Maximum power dissipation on input and output(1) | VCC = 20 V, IF= 10mA 10-kHz, 50% duty cycle, square wave,180-nF load, TA=25oC | 750 | mW | ||
PD1 | Maximum input power dissipation(2) | 10 | mW | |||
PD2 | Maximum output power dissipation | 740 | mW |
PARAMETER | TEST CONDITIONS | SPECIFICATION | UNIT | |
---|---|---|---|---|
CLR | External clearance(1) | Shortest terminal-to-terminal distance through air | >8.5 | mm |
CPG | External Creepage(1) | Shortest terminal-to-terminal distance across the package surface | >8.5 | mm |
DTI | Distance through the insulation | Minimum internal gap (internal clearance) | >17 | µm |
CTI | Comparative tracking index | DIN EN 60112 (VDE 0303-11); IEC 60112 | >600 | V |
Material Group | According to IEC 60664-1 | I | ||
Overvoltage category per IEC 60664-1 | Rated mains voltage ≤ 600 VRMS | I-IV | ||
Rated mains voltage ≤ 1000 VRMS | I-III | |||
DIN V VDE 0884-11 (VDE V 0884-11)(2) | ||||
VIORM | Maximum repetitive peak isolation voltage | AC voltage (bipolar) | 2121 | VPK |
VIOWM | Maximum isolation working voltage | AC voltage (sine wave); time-dependent dielectric breakdown (TDDB) test; see Figure 1 | 1500 | VRMS |
DC voltage | 2121 | VDC | ||
VIOTM | Maximum transient isolation voltage | VTEST = VIOTM, t = 60 sec (qualification) VTEST = 1.2 × VIOTM, t = 1 s (100% production) | 8000 | VPK |
VIOSM | Maximum surge isolation voltage(3) | Test method per IEC 62368, 1.2/50 ms waveform, VTEST = 1.6 x VIOSM = 12800 VPK (qualification) | 8000 | VPK |
qpd | Apparent charge(4) | Method a: After I/O safety test subgroup 2/3,Vini = VIOTM, tini = 60 s; Vpd(m) = 1.2 x VIORM = 1800 VPK, tm = 10 s | ≤5 | pC |
Method a: After environmental tests subgroup 1, Vini = VIOTM, tini = 60 s; Vpd(m) = 1.6 x VIORM = 2400 VPK, tm = 10 s | ≤5 | |||
Method b1: At routine test (100% production) and preconditioning (type test), Vini = VIOTM, tini = 1 s; Vpd(m) = 1.875 x VIORM = 2813 VPK, tm = 1 s | ≤5 | |||
CIO | Barrier capacitance, input to output(5) | VIO = 0.4 x sin (2πft), f = 1 MHz | 0.5 | pF |
RIO | Insulation resistance, input to output(5) | VIO = 500 V, TA = 25°C | >1012 | Ω |
VIO = 500 V, 100°C ≤ TA ≤ 125°C | >1011 | |||
VIO = 500 V at TS = 150°C | >109 | |||
Pollution degree | 2 | |||
Climatic category | 40/125/21 | |||
UL 1577 | ||||
VISO | Withstand isolation voltage | VTEST = VISO = 5700 VRMS, t = 60 s (qualification), VTEST = 1.2 x VISO = 6840 VRMS, t = 1 s (100% production) | 5700 | VRMS |
VDE | UL |
---|---|
Plan to certify according to DIN V VDE V 0884-11: 2017-01 | Plan to certify according to UL 1577 Component Recognition Program |
Reinforced insulation Maximum transient isolation voltage, 8000
VPK; Maximum repetitive peak isolation voltage, 2121 VPK; Maximum surge isolation voltage, 8000 VPK |
Single protection, 5700 VRMS |
Certificate in progress | File number: E181974 |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
IS | Safety input, output, or supply current | RqJA = 126°C/W, VI = 15 V, TJ = 150°C, TA = 25°C | 50 | mA | ||
RqJA = 126°C/W, VI = 30 V, TJ = 150°C, TA = 25°C | 25 | |||||
PS | Safety input, output, or total power | RqJA = 126°C/W, TJ = 150°C, TA = 25°C | 750 | mW | ||
TS | Maximum safety temperature(1) | 150 | °C |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
INPUT | ||||||
IFLH | Input Forward Threshold Current Low to High | VOUT > 5 V, Cg = 1 nF | 1.5 | 2.8 | 4 | mA |
VF | Input Forward Voltage | IF =10 mA | 1.8 | 2.1 | 2.4 | V |
VF_HL | Threshold Input Voltage High to Low | V < 5 V, Cg = 1 nF | 0.9 | V | ||
ΔVF/ΔT | Temp Coefficient of Input Forward Voltage | IF =10 mA | 1 | 1.35 | mV/°C | |
VR | Input Reverse Breakdown Voltage | IR= 10 uA | 15 | V | ||
CIN | Input Capacitance | F = 0.5 MHz | 15 | pF | ||
OUTPUT | ||||||
IOH | High Level Peak Output Current | IF = 10 mA, VCC =15V, CLOAD=0.18uF, RG_total=6Ω(1) , CVDD=10uF, Pulse width <10us | 1 | 1.5 | A | |
IOL | Low Level Peak Output Current | VF= 0 V, VCC =15V, CLOAD=0.18uF, RG_total=6Ω(1), CVDD=10uF, Pulse width <10us | 1 | 2.0 | A | |
VOH | High Level Output Voltage | IF = 10 mA, IO= -20mA (with respect to VCC) | 0.07 | 0.18 | 0.36 | V |
IF = 10 mA, IO= 0 mA | VCC | V | ||||
VOL | Low Level Output Voltage | VF = 0 V, IO= 20 mA | 25 | mV | ||
ICC_H | Output Supply Current (Diode On) | IF = 10 mA, IO= 0 mA | 2.2 | mA | ||
ICC_L | Output Supply Current (Diode Off) | VF = 0 V, IO= 0 mA | 2 | mA | ||
UNDER VOLTAGE LOCKOUT | ||||||
UVLOR | Under Voltage Lockout VCC rising | VCC_Rising, IF=10 mA | 11 | 12.5 | 13.5 | V |
UVLOF | Under Voltage Lockout VCC falling | VCC_Falling, IF=10 mA | 10 | 11.5 | 12.5 | V |
UVLOHYS | UVLO Hysteresis | 1.0 | V |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tr | Output-signal Rise Time | Cg = 1nF FSW = 20 kHz, (50% Duty Cycle) VCC=15V | 28 | ns | ||
tf | Output-signal Fall Time | 25 | ns | |||
tPLH | Propagation Delay, Low to High | 70 | 105 | ns | ||
tPHL | Propagation Delay, High to Low | 70 | 105 | ns | ||
tPWD | Pulse Width Distortion |tPHL – tPLH| | 35 | ns | |||
tsk(pp) | Part-to-Part Skew in Propagation Delay Between any Two Parts(1) | Cg = 1nF FSW = 20 kHz, (50% Duty Cycle) VCC=15V, IF=10mA | 25 | ns | ||
tUVLO_rec | UVLO Recovery Delay | VCC Rising from 0V to 15V | 20 | 30 | µs | |
CMTIH | Common-mode Transient Immunity (Output High) | IF = 10 mA, VCM = 1500 V, VCC= 30 V, TA= 25°C | 150 | kV/µs | ||
CMTIL | Common-mode Transient Immunity (Output Low) | VF = 0 V, VCM = 1500 V, VCC= 30 V, TA= 25°C | 150 | kV/µs |