SPNS225D June   2013  – November 2016 TMS570LS0914


  1. Device Overview
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. Revision History
  3. Device Comparison
    1. 3.1 Related Products
  4. Terminal Configuration and Functions
    1. 4.1 Pin Diagrams
      1. 4.1.1 PGE QFP Package Pinout (144-Pin)
      2. 4.1.2 PZ QFP Package Pinout (100-Pin)
    2. 4.2 Signal Descriptions
      1. 4.2.1 PGE Package Terminal Functions
        1.  Multibuffered Analog-to-Digital Converters (MibADCs)
        2.  Enhanced High-End Timer (N2HET) Modules
        3.  Enhanced Capture Modules (eCAP)
        4.  Enhanced Quadrature Encoder Pulse Modules (eQEP)
        5.  Enhanced Pulse-Width Modulator Modules (ePWM)
        6.  General-Purpose Input/Output (GIO)
        7.  Controller Area Network Controllers (DCAN)
        8.  Local Interconnect Network Interface Module (LIN)
        9.  Standard Serial Communication Interface (SCI)
        10. Inter-Integrated Circuit Interface Module (I2C)
        11. Standard Serial Peripheral Interface (SPI)
        12. Multibuffered Serial Peripheral Interface Modules (MibSPI)
        13. System Module Interface
        14. Clock Inputs and Outputs
        15. Test and Debug Modules Interface
        16. Flash Supply and Test Pads
        17. Supply for Core Logic: 1.2V nominal
        18. Supply for I/O Cells: 3.3V nominal
        19. Ground Reference for All Supplies Except VCCAD
      2. 4.2.2 PZ Package Terminal Functions
        1.  High-End Timer (N2HET) Modules
        2.  Enhanced Capture Modules (eCAP)
        3.  Enhanced Quadrature Encoder Pulse Modules (eQEP)
        4.  Enhanced Pulse-Width Modulator Modules (ePWM)
        5.  General-Purpose Input/Output (GIO)
        6.  Controller Area Network Interface Modules (DCAN1, DCAN2)
        7.  Standard Serial Peripheral Interfaces (SPI2 and SPI4)
        8.  Multibuffered Serial Peripheral Interface (MibSPI1 and MibSPI3)
        9.  Local Interconnect Network Controller (LIN)
        10. Multibuffered Analog-to-Digital Converter (MibADC)
        11. System Module Interface
        12. Clock Inputs and Outputs
        13. Test and Debug Modules Interface
        14. Flash Supply and Test Pads
        15. Supply for Core Logic: 1.2-V Nominal
        16. Supply for I/O Cells: 3.3-V Nominal
        17. Ground Reference for All Supplies Except VCCAD
    3. 4.3 Pin Multiplexing
      1. 4.3.1 Output Multiplexing
      2. 4.3.2 Multiplexing of Inputs
    4. 4.4 Buffer Type
  5. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Power-On Hours (POH)
    4. 5.4 Recommended Operating Conditions
    5. 5.5 Input/Output Electrical Characteristics Over Recommended Operating Conditions
    6. 5.6 Power Consumption Over Recommended Operating Conditions
    7. 5.7 Thermal Resistance Characteristics
    8. 5.8 Timing and Switching Characteristics
      1. 5.8.1 SYSCLK (Frequencies)
        1. Switching Characteristics over Recommended Operating Conditions for Clock Domains
        2. Wait States Required - PGE and PZ Packages
  6. System Information and Electrical Specifications
    1. 6.1  Device Power Domains
    2. 6.2  Voltage Monitor Characteristics
      1. 6.2.1 Important Considerations
      2. 6.2.2 Voltage Monitor Operation
      3. 6.2.3 Supply Filtering
    3. 6.3  Power Sequencing and Power-On Reset
      1. 6.3.1 Power-Up Sequence
      2. 6.3.2 Power-Down Sequence
      3. 6.3.3 Power-On Reset: nPORRST
        1. nPORRST Electrical and Timing Requirements
    4. 6.4  Warm Reset (nRST)
      1. 6.4.1 Causes of Warm Reset
      2. 6.4.2 nRST Timing Requirements
    5. 6.5  ARM Cortex-R4F CPU Information
      1. 6.5.1 Summary of ARM Cortex-R4F CPU Features
      2. 6.5.2 ARM Cortex-R4F CPU Features Enabled by Software
      3. 6.5.3 Dual Core Implementation
      4. 6.5.4 Duplicate Clock Tree After GCLK
      5. 6.5.5 ARM Cortex-R4F CPU Compare Module (CCM) for Safety
      6. 6.5.6 CPU Self-Test
        1. Application Sequence for CPU Self-Test
        2. CPU Self-Test Clock Configuration
        3. CPU Self-Test Coverage
    6. 6.6  Clocks
      1. 6.6.1 Clock Sources
        1. Main Oscillator
          1. Timing Requirements for Main Oscillator
        2. Low-Power Oscillator
          1. Features
          2. LPO Electrical and Timing Specifications
        3. Phase-Locked Loop (PLL) Clock Module
          1. Block Diagram
          2. PLL Timing Specifications
        4. External Clock Inputs
      2. 6.6.2 Clock Domains
        1. Clock Domain Descriptions
        2. Mapping of Clock Domains to Device Modules
      3. 6.6.3 Clock Test Mode
    7. 6.7  Clock Monitoring
      1. 6.7.1 Clock Monitor Timings
      2. 6.7.2 External Clock (ECLK) Output Functionality
      3. 6.7.3 Dual Clock Comparators
        1. Features
        2. Mapping of DCC Clock Source Inputs
    8. 6.8  Glitch Filters
    9. 6.9  Device Memory Map
      1. 6.9.1 Memory Map Diagram
      2. 6.9.2 Memory Map Table
      3. 6.9.3 Special Consideration for CPU Access Errors Resulting in Imprecise Aborts
      4. 6.9.4 Master/Slave Access Privileges
      5. 6.9.5 Special Notes on Accesses to Certain Slaves
    10. 6.10 Flash Memory
      1. 6.10.1 Flash Memory Configuration
      2. 6.10.2 Main Features of Flash Module
      3. 6.10.3 ECC Protection for Flash Accesses
      4. 6.10.4 Flash Access Speeds
      5. 6.10.5 Program Flash
      6. 6.10.6 Data Flash
    11. 6.11 Tightly Coupled RAM Interface Module
      1. 6.11.1 Features
      2. 6.11.2 TCRAMW ECC Support
    12. 6.12 Parity Protection for Accesses to Peripheral RAMs
    13. 6.13 On-Chip SRAM Initialization and Testing
      1. 6.13.1 On-Chip SRAM Self-Test Using PBIST
        1. Features
        2. PBIST RAM Groups
      2. 6.13.2 On-Chip SRAM Auto Initialization
    14. 6.14 Vectored Interrupt Manager
      1. 6.14.1 VIM Features
      2. 6.14.2 Interrupt Request Assignments
    15. 6.15 DMA Controller
      1. 6.15.1 DMA Features
      2. 6.15.2 Default DMA Request Map
    16. 6.16 Real-Time Interrupt Module
      1. 6.16.1 Features
      2. 6.16.2 Block Diagrams
      3. 6.16.3 Clock Source Options
      4. 6.16.4 Network Time Synchronization Inputs
    17. 6.17 Error Signaling Module
      1. 6.17.1 ESM Features
      2. 6.17.2 ESM Channel Assignments
    18. 6.18 Reset/Abort/Error Sources
    19. 6.19 Digital Windowed Watchdog
    20. 6.20 Debug Subsystem
      1. 6.20.1 Block Diagram
      2. 6.20.2 Debug Components Memory Map
      3. 6.20.3 JTAG Identification Code
      4. 6.20.4 Debug ROM
      5. 6.20.5 JTAG Scan Interface Timings
      6. 6.20.6 Advanced JTAG Security Module
      7. 6.20.7 Boundary Scan Chain
  7. Peripheral Information and Electrical Specifications
    1. 7.1  I/O Timings
      1. 7.1.1 Input Timings
      2. 7.1.2 Output Timings
        1. Low-EMI Output Buffers
    2. 7.2  Enhanced PWM Modules (ePWM)
      1. 7.2.1 ePWM Clocking and Reset
      2. 7.2.2 Synchronization of ePWMx Time-Base Counters
      3. 7.2.3 Synchronizing all ePWM Modules to the N2HET1 Module Time Base
      4. 7.2.4 Phase-Locking the Time-Base Clocks of Multiple ePWM Modules
      5. 7.2.5 ePWM Synchronization with External Devices
      6. 7.2.6 ePWM Trip Zones
        1. Trip Zones TZ1n, TZ2n, TZ3n
        2. Trip Zone TZ4n
        3. Trip Zone TZ5n
        4. Trip Zone TZ6n
      7. 7.2.7 Triggering of ADC Start of Conversion Using ePWMx SOCA and SOCB Outputs
      8. 7.2.8 Enhanced Translator-Pulse Width Modulator (ePWMx) Timings
    3. 7.3  Enhanced Capture Modules (eCAP)
      1. 7.3.1 Clock Enable Control for eCAPx Modules
      2. 7.3.2 PWM Output Capability of eCAPx
      3. 7.3.3 Input Connection to eCAPx Modules
      4. 7.3.4 Enhanced Capture Module (eCAP) Electrical Data/Timing
    4. 7.4  Enhanced Quadrature Encoder (eQEP)
      1. 7.4.1 Clock Enable Control for eQEPx Modules
      2. 7.4.2 Using eQEPx Phase Error to Trip ePWMx Outputs
      3. 7.4.3 Input Connections to eQEPx Modules
      4. 7.4.4 Enhanced Quadrature Encoder Pulse (eQEPx) Timing
    5. 7.5  12-Bit Multibuffered Analog-to-Digital Converter (MibADC)
      1. 7.5.1 Features
      2. 7.5.2 Event Trigger Options
        1. MibADC1 Event Trigger Hookup
        2. MibADC2 Event Trigger Hookup
        3. Controlling ADC1 and ADC2 Event Trigger Options Using SOC Output from ePWM Modules
      3. 7.5.3 ADC Electrical and Timing Specifications
      4. 7.5.4 Performance (Accuracy) Specifications
        1. MibADC Nonlinearity Errors
        2. MibADC Total Error
    6. 7.6  General-Purpose Input/Output
      1. 7.6.1 Features
    7. 7.7  Enhanced High-End Timer (N2HET)
      1. 7.7.1 Features
      2. 7.7.2 N2HET RAM Organization
      3. 7.7.3 Input Timing Specifications
      4. 7.7.4 N2HET1 to N2HET2 Synchronization
      5. 7.7.5 N2HET Checking
        1. Internal Monitoring
        2. Output Monitoring Using Dual Clock Comparator (DCC)
      6. 7.7.6 Disabling N2HET Outputs
      7. 7.7.7 High-End Timer Transfer Unit (HET)
        1. Features
        2. Trigger Connections
    8. 7.8  Controller Area Network (DCAN)
      1. 7.8.1 Features
      2. 7.8.2 Electrical and Timing Specifications
    9. 7.9  Local Interconnect Network Interface (LIN)
      1. 7.9.1 LIN Features
    10. 7.10 Serial Communication Interface (SCI)
      1. 7.10.1 Features
    11. 7.11 Inter-Integrated Circuit (I2C) Module
      1. 7.11.1 Features
      2. 7.11.2 I2C I/O Timing Specifications
    12. 7.12 Multibuffered / Standard Serial Peripheral Interface
      1. 7.12.1 Features
      2. 7.12.2 MibSPI Transmit and Receive RAM Organization
      3. 7.12.3 MibSPI Transmit Trigger Events
        1. MibSPI1 Event Trigger Hookup
        2. MibSPI3 Event Trigger Hookup
        3. MibSPI5 Event Trigger Hookup
      4. 7.12.4 MibSPI/SPI Master Mode I/O Timing Specifications
      5. 7.12.5 SPI Slave Mode I/O Timings
  8. Applications, Implementation, and Layout
    1. 8.1 TI Designs or Reference Designs
  9. Device and Documentation Support
    1. 9.1  Getting Started and Next Steps
    2. 9.2  Device and Development-Support Tool Nomenclature
    3. 9.3  Tools and Software
      1. 9.3.1 Kits and Evaluation Modules for Hercules TMS570 MCUs
      2. 9.3.2 Development Tools
      3. 9.3.3 Software
    4. 9.4  Documentation Support
    5. 9.5  Community Resources
    6. 9.6  Trademarks
    7. 9.7  Electrostatic Discharge Caution
    8. 9.8  Glossary
    9. 9.9  Device Identification
      1. 9.9.1 Device Identification Code Register
      2. 9.9.2 Die Identification Registers
    10. 9.10 Module Certifications
      1. 9.10.1 DCAN Certification
      2. 9.10.2 LIN Certification
        1. LIN Master Mode
        2. LIN Slave Mode - Fixed Baud Rate
        3. LIN Slave Mode - Adaptive Baud Rate
  10. 10Mechanical Packaging and Orderable Information
    1. 10.1 Packaging Information


请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • PGE|144
  • PZ|100
散热焊盘机械数据 (封装 | 引脚)

Device Overview


  • High-Performance Automotive-Grade Microcontroller (MCU) for Safety-Critical Applications
    • Dual CPUs Running in Lockstep
    • ECC on Flash and RAM Interfaces
    • Built-In Self-Test (BIST) for CPU and On-chip RAMs
    • Error Signaling Module With Error Pin
    • Voltage and Clock Monitoring
  • ARM® Cortex®-R4F 32-Bit RISC CPU
    • 1.66 DMIPS/MHz With 8-Stage Pipeline
    • FPU With Single and Double Precision
    • 12-Region Memory Protection Unit (MPU)
    • Open Architecture With Third-Party Support
  • Operating Conditions
    • Up to 160-MHz System Clock
    • Core Supply Voltage (VCC): 1.14 to 1.32 V
    • I/O Supply Voltage (VCCIO): 3.0 to 3.6 V
  • Integrated Memory
    • 1MB of Flash With ECC
    • 128KB of RAM With ECC
    • 64KB of Flash for Emulated EEPROM With ECC
  • Common Platform Architecture
    • Consistent Memory Map Across Family
    • Real-Time Interrupt Timer (RTI) OS Timer
    • 128-Channel Vectored Interrupt Module (VIM)
    • 2-Channel Cyclic Redundancy Checker (CRC)
  • Direct Memory Access (DMA) Controller
    • 16 Channels and 32 Peripheral Requests
    • Parity for Control Packet RAM
    • DMA Accesses Protected by Dedicated MPU
  • Frequency-Modulated Phase-Locked Loop (FMPLL) With Built-In Slip Detector
  • IEEE 1149.1 JTAG, Boundary Scan and ARM CoreSight™ Components
  • Advanced JTAG Security Module (AJSM)
  • Up to 64 General-Purpose I/O (GIO) Pins
    • Up to 16 GIO Pins With Interrupt Generation Capability
  • Enhanced Timing Peripherals
    • 7 Enhanced Pulse Width Modulator (ePWM) Modules
    • 6 Enhanced Capture (eCAP) Modules
    • 2 Enhanced Quadrature Encoder Pulse (eQEP) Modules
  • Two Next Generation High-End Timer (N2HET) Modules
    • N2HET1: 32 Programmable Channels
    • N2HET2: 18 Programmable Channels
    • 160-Word Instruction RAM With Parity Protection Each
    • Each N2HET Includes Hardware Angle Generator
    • Dedicated High-End Timer Transfer Unit (HTU) for Each N2HET
  • Two 12-Bit Multibuffered ADC Modules
    • ADC1: 24 Channels
    • ADC2: 16 Channels
    • 16 Shared Channels
    • 64 Result Buffers With Parity Protection Each
  • Multiple Communication Interfaces
    • Up to Three CAN Controllers (DCANs)
      • 64 Mailboxes With Parity Protection Each
      • Compliant to CAN Protocol Version 2.0A and 2.0B
    • Inter-Integrated Circuit (I2C)
    • 3 Multibuffered Serial Peripheral Interfaces (MibSPIs)
      • 128 Words With Parity Protection Each
      • 8 Transfer Groups
    • One Standard Serial Peripheral Interface (SPI) Module
    • Two UART (SCI) Interfaces, One With Local Interconnect Network (LIN 2.1) Interface Support
  • Packages
    • 144-Pin Quad Flatpack (PGE) [Green]
    • 100-Pin Quad Flatpack (PZ) [Green]


  • Electric Power Steering (EPS)
  • Braking Systems (ABS and ESC)
  • HEV and EV Inverter Systems
  • Battery-Management Systems
  • Active Driver Assistance Systems
  • Aerospace and Avionics
  • Railway Communications
  • Off-road Vehicles


The TMS570LS0914 device is part of the Hercules TMS570 series of high-performance automotive-grade ARM® Cortex®-R-based MCUs. Comprehensive documentation, tools, and software are available to assist in the development of ISO 26262 and IEC 61508 functional safety applications. Start evaluating today with the Hercules TMS570 LaunchPad Development Kit. The TMS570LS0914 device has on-chip diagnostic features including: dual CPUs in lockstep; CPU and memory Built-In Self-Test (BIST) logic; ECC on both the flash and the SRAM; parity on peripheral memories; and loopback capability on most peripheral I/Os.

The TMS570LS0914 device integrates the ARM Cortex-R4F floating-point CPU which offers an efficient 1.66 DMIPS/MHz, and has configurations which can run up to 160 MHz providing up to 265 DMIPS. The TMS570 device supports the word invariant big-endian [BE32] format.

The TMS570LS0914 device has 1MB of integrated flash and 128KB of RAM configurations with single-bit error correction and double-bit error detection. The flash memory on this device is nonvolatile, electrically erasable and programmable, and is implemented with a 64-bit-wide data bus interface. The flash operates on a 3.3-V supply input (same level as the I/O supply) for all read, program, and erase operations. The SRAM supports single-cycle read and write accesses in byte, halfword, word, and doubleword modes throughout the supported frequency range.

The TMS570LS0914 device features peripherals for real-time control-based applications, including two Next-Generation High-End Timer (N2HET) timing coprocessors with up to 44 total I/O terminals, seven Enhanced PWM (ePWM) modules with up to 14 outputs, six Enhanced Capture (eCAP) modules, two Enhanced Quadrature Encoder Pulse (eQEP) modules, and two 12-bit Analog-to-Digital Converters (ADCs) supporting up to 24 inputs.

The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time applications. The timer is software-controlled, using a reduced instruction set, with a specialized timer micromachine and an attached I/O port. The N2HET can be used for pulse-width-modulated outputs, capture or compare inputs, or general-purpose I/O (GIO). The N2HET is especially well suited for applications requiring multiple sensor information and drive actuators with complex and accurate time pulses. A High-End Timer Transfer Unit (HTU) can transfer N2HET data to or from main memory. A Memory Protection Unit (MPU) is built into the HTU.

The ePWM module can generate complex pulse width waveforms with minimal CPU overhead or intervention. The ePWM is easy to use and supports complementary PWMs and deadband generation. With integrated trip zone protection and synchronization with the on-chip MibADC, the ePWM is ideal for digital motor control applications.

The eCAP module is essential in systems where the accurately timed capture of external events is important. The eCAP can also be used to monitor the ePWM outputs or to generate simple PWM when not needed for capture applications.

The eQEP module is used for direct interface with a linear or rotary incremental encoder to get position, direction, and speed information from a rotating machine as used in high-performance motion and position-control systems.

The device has two 12-bit-resolution MibADCs with 24 total inputs and 64 words of parity-protected buffer RAM each. The MibADC channels can be converted individually or can be grouped by software for sequential conversion sequences. Sixteen inputs are shared between the two MibADCs. There are three separate groups. Each group can be converted once when triggered or configured for continuous conversion mode. The MibADC has a 10-bit mode for use when compatibility with older devices or faster conversion time is desired.

The device has multiple communication interfaces: three MibSPIs; two SPIs; two SCIs, one of which can be used as LIN; up to three DCANs; and one I2C module. The SPI provides a convenient method of serial interaction for high-speed communications between similar shift-register type devices. The LIN supports the Local Interconnect standard 2.0 and can be used as a UART in full-duplex mode using the standard Non-Return-to-Zero (NRZ) format. The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps. The DCAN is ideal for applications operating in noisy and harsh environments (for example, automotive and industrial fields) that require reliable serial communication or multiplexed wiring.

The I2C module is a multimaster communication module providing an interface between the microcontroller and an I2C-compatible device through the I2C serial bus. The I2C module supports speeds of 100 and 400 kbps.

A Frequency-Modulated Phase-Locked Loop (FMPLL) clock module is used to multiply the external frequency reference to a higher frequency for internal use. The FMPLL provides one of the six possible clock source inputs to the Global Clock Module (GCM). The GCM manages the mapping between the available clock sources and the device clock domains.

The device also has an external clock prescaler (ECP) circuit that when enabled, outputs a continuous external clock on the ECLK terminal. The ECLK frequency is a user-programmable ratio of the peripheral interface clock (VCLK) frequency. This low-frequency output can be monitored externally as an indicator of the device operating frequency.

The Direct Memory Access (DMA) controller has 16 channels, 32 peripheral requests, and parity protection on its memory. An MPU is built into the DMA to protect memory against erroneous transfers.

The Error Signaling Module (ESM) monitors device errors and determines whether an interrupt or external error signal (nERROR) is asserted when a fault is detected. The nERROR terminal can be monitored externally as an indicator of a fault condition in the microcontroller.

With integrated functional safety features and a wide choice of communication and control peripherals, the TMS570LS0914 device is an ideal solution for high-performance, real-time control applications with safety-critical requirements.

Device Information(1)

TMS570LS0914PGE LQFP (144) 20.0 mm × 20.0 mm
TMS570LS0914PZ LQFP (100) 14.0 mm × 14.0 mm
For more information, see Section 10, Mechanical Packaging and Orderable Information.

Functional Block Diagram

Figure 1-1 shows the functional block diagram of the device.

NOTE: The block diagram reflects the 144PGE package. Some functions are multiplexed or not available in other packages. For details, see the respective terminal functions table in Section 4.2, Terminal Functions.

TMS570LS0914 fbd_f7_spns225.gif Figure 1-1 Functional Block Diagram