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This document contains information for TPS1663 (VQFN and HTSSOP package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
TPS1663 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for VQFN package of TPS1663 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 17 |
Die FIT Rate | 6 |
Package FIT Rate | 11 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
This section provides Functional Safety Failure In Time (FIT) rates for the HTSSOP package of TPS1663 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 18 |
Die FIT Rate | 6 |
Package FIT Rate | 12 |
The failure rate and mission profile information in Table 2-3 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-4 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for TPS1663 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
OUT HIZ or no output | 35% |
OUT not in specification – voltage or timing | 40% |
IMON not in specification – current or timing | 5% |
PLIM not in specification – power or timing | 5% |
PGOOD/FLT fails to trip or false trip | 5% |
OUT stuck on | 5% |
Short circuit any two pins |
5% |
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS1663 (VQFN and HTSSOP package). The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-9 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Figure 4-1 shows the TPS1663 pin diagram for the VQFN package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TPS1663 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1,2 | Device unpowered. Device not functional. | B |
NC | 3, 4, 15, 19, 20, 21, 22, 23, 24 | No effect. Normal operation. | D |
P_IN | 5 | Device unpowered. Device not functional. | B |
UVLO | 6 | UVLO protection is triggered. Device turns off the internal FET. | B |
OVP or PLIM | 7 | Over-voltage protection or power limiting will not function. | B |
GND | 8 | No effect. Normal operation. | D |
dVdT | 9 | Device doesn’t power up. | B |
ILIM | 10 | Device doesn’t power up. | B |
MODE | 11 | Device provides auto-retry behavior for over-current events as per device functional modes in data sheet. | D |
SHDN | 12 | Device is disabled. | B |
IMON | 13 | Current monitor function is not available. | B |
FLT | 14 | Fault function is not available. | B |
PGOOD | 16 | PGOOD function is not available. | B |
OUT | 17, 18 | Device will enter into current limiting operation. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1,2 | Device unpowered. Device is not functional. | B |
NC | 3, 4, 15, 19, 20, 21, 22, 23, 24 | No effect. Normal operation. | D |
P_IN | 5 | Device unpowered. Device is not functional. | B |
UVLO | 6 | Device functionality undetermined. Device may turn off / power down. | B |
OVP or PLIM | 7 | TPS16630: over-voltage protection function is not determined. Device may turn off the internal FET. TPS16632: output power limit is set to power more than 400 W. | B |
GND | 8 | Device unpowered. Device is not functional. | B |
dVdT | 9 | Device provides slew rate 24 V/500 μs on output. | D |
ILIM | 10 | Internal FET is turned off. Output is not powered up. | B |
MODE | 11 | Device provides latch-off behavior for over-current events as per device functional modes in data sheet. | D |
SHDN | 12 | No effect. Normal operation. | D |
IMON | 13 | No effect. Normal operation. | D |
FLT | 14 | No effect. Normal operation. | D |
PGOOD | 16 | No effect. Normal operation. | D |
OUT | 17, 18 | No power or current provided to load. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1,2 | IN to NC: no effect. Normal operation. | D |
NC | 3, 4, 15, 19, 20, 21, 22, 23, 24 | NC to P_IN: no effect. Normal operation. | D |
P_IN | 5 | P_IN to UVLO: under-voltage protection will not function. | B |
UVLO | 6 | UVLO to OVP/PLIM: potential device damage if UVLO voltage is more than 5.5 V. | A |
OVP or PLIM | 7 | OVP/PLIM to GND: over-voltage protection or Power limiting will not function. | B |
GND | 8 | GND to dVdT: device unpowered. Device not functional. | B |
dVdT | 9 | dVdT to ILIM: device can go into current limit operation. | B |
ILIM | 10 | ILIM to MODE: device can go into current limit operation or Latch-off mode. | B |
MODE | 11 | MODE to SHDN: device can go into shutdown. | B |
SHDN | 12 | SHDN to IMON: device can go into shutdown. | B |
IMON | 13 | IMON to FLT: potential Device damage if FLT pin voltage is more than 5.5 V. | A |
FLT | 14 | PGOOD to FLT: oring of PGOOD and FLT signals. | D |
PGOOD | 16 | PGOOD to OUT: potential device damage when PGOOD is low and output is powered up. | A |
OUT | 17, 18 | OUT to N.C: no effect. Normal operation. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1,2 | No effect. Normal operation. | D |
NC | 3, 4, 15, 19, 20, 21, 22, 23, 24 | No effect. Normal operation. | D |
P_IN | 5 | No effect. Normal operation. | D |
UVLO | 6 | Under-voltage protection will not function. | B |
OVP or PLIM | 7 | Potential device damage if supply voltage is more than 5.5 V. | D |
GND | 8 | Short circuit of input supply. | B |
dVdT | 9 | Potential device damage if supply voltage is more than 5.5 V. | A |
ILIM | 10 | Potential device damage if supply voltage is more than 5.5 V. | A |
MODE | 11 | Potential device damage if supply voltage is more than 5.5 V. | A |
SHDN | 12 | Potential device damage if supply voltage is more than 5.5 V. | A |
IMON | 13 | Potential device damage if supply voltage is more than 5.5 V. | A |
FLT | 14 | Potential device damage if FLT pin is low. | A |
PGOOD | 16 | Potential device damage if PGOOD pin is low. | A |
OUT | 17, 18 | Device will not limit power or current into load. | B |
Figure 4-3 shows the TPS1663 pin diagram for the HTSSOP package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TPS1663 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1, 2, 3 | Device unpowered. Device not functional. | B |
NC | 4, 5, 17 | No effect. Normal operation. | D |
P_IN | 6 | Device unpowered. Device not functional. | B |
UVLO | 7 | UVLO protetion is triggered. Device turns off the internal FET. | B |
OVP | 8 | Over-voltage protection will not function. | B |
GND | 9 | No effect. Normal operation. | D |
dVdT | 10 | Device doesn’t power up. | B |
ILIM | 11 | Device doesn’t power up. | B |
MODE | 12 | Device provides auto-retry behavior for over-current events as per device functional modes in data sheet. | D |
SHDN | 13 | Device is disabled. | B |
IMON | 14 | Current monitor function is not available. | B |
FLT | 15 | Fault function not available. | B |
PGOOD | 16 | PGOOD function not available. | B |
OUT | 18, 19, 20 | Device will enter into current limiting operation. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1, 2, 3 | Device unpowered. Device not functional. | B |
NC | 4, 5, 17 | No effect. Normal operation. | D |
P_IN | 6 | Device unpowered. Device not functional. | B |
UVLO | 7 | Device functionality undetermined. Device may turn off / power down. | B |
OVP | 8 | Over-voltage protection function is not determined. Device may turn off the internal FET. | B |
GND | 9 | Device unpowered. Device not functional. | B |
dVdT | 10 | Device provides slew rate 24 V/500 μs on output at power up. | D |
ILIM | 11 | Internal FET is turned off. Output is not powered up. | B |
MODE | 12 | Device provides latch-off behavior for over-current events as per device functional modes in data sheet. | D |
SHDN | 13 | No effect. Normal operation. | D |
IMON | 14 | No effect. Normal operation. | D |
FLT | 15 | No effect. Normal operation. | D |
PGOOD | 16 | No effect. Normal operation. | D |
OUT | 18, 19, 20 | No power or current provided to load. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1, 2, 3 | IN to NC: no effect. Normal operation. | D |
NC | 4, 15, 17 | NC to P_IN: no effect. Normal operation. | D |
P_IN | 6 | P_IN to UVLO: under-voltage protection will not function. | B |
UVLO | 7 | UVLO to OVP: potential device damage if UVLO voltage is more than 5.5 V. | B |
OVP | 8 | OVP to GND: over-voltage protection will not function. | B |
GND | 9 | GND to dVdT: device unpowered. Device not functional. | B |
dVdT | 10 | dVdT to ILIM: device can go into current limit operation. | B |
ILIM | 11 | ILIM to MODE: device can go into current limit operation or Latch-off mode. | B |
MODE | 12 | MODE to SHDN: device can go into shutdown. | B |
SHDN | 13 | SHDN to IMON: device can go into shutdown. | B |
IMON | 14 | IMON to FLT: potential Device damage if FLT pin voltage is more than 5.5 V. | A |
FLT | 15 | PGOOD to FLT: oring of PGOOD and FLT signals. | D |
PGOOD | 16 | PGOOD to OUT: potential device damage when PGOOD is low and output is powered up. | A |
OUT | 18, 19, 20 | OUT to N.C: no effect. Normal operation. | D |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN | 1,2 | No effect. Normal operation. | D |
NC | 3, 4, 17 | No effect. Normal operation. | D |
P_IN | 6 | No effect. Normal operation. | D |
UVLO | 7 | Under-voltage protection will not function. | B |
OVP | 8 | Potential device damage if supply voltage is more than 5.5 V | D |
GND | 9 | Short circuit of input supply. | B |
dVdT | 10 | Potential device damage if supply voltage is more than 5.5 V. | A |
ILIM | 11 | Potential device damage if supply voltage is more than 5.5 V. | A |
MODE | 12 | Potential device damage if supply voltage is more than 5.5 V. | A |
SHDN | 13 | Potential device damage if supply voltage is more than 5.5 V. | A |
IMON | 14 | Potential device damage if supply voltage is more than 5.5 V. | A |
FLT | 15 | Potential device damage if FLT pin is low. | A |
PGOOD | 16 | Potential device damage if PGOOD pin is low. | A |
OUT | 18, 19, 20 | Device will not limit power or current into load. | B |
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